• 한국결정성장학회지
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• 제18권5호
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• pp.195-199
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• 2008

반도체용 규소 원료는 11 N급의 고순도이나 가격이 고가이고 또한 생산이 제한되어서 폭발적인 태양전지의 수요를 따르지 못하고 있어 저급(5$\sim$6 N)의 UMG(Upgraded Metallurgical Grade)를 사용하자 하는 노력이 진행 중이다. 이 5$\sim$6 N급에서는 dopant 원소인 붕소(B)외 인(P)의 농도가 1 ppm 이상 존재한다. 이들 원료를 사용하여서 결정 성장을 하였을 경우에 존재하는 여러 불순물들의 편석계수(segregation coefficient)를 활용하여 화학적, 전기적 성질을 예상 하여본 결과 결정성장 초기에는 붕소(B)의 농도가 인(P) 보다 높아 p영역이 발생하고 후반부에는 인의 농도가 붕소 보다 높아 n 형 기판이 생성됨을 보았다. 또한 응고속도를 조절하여 여러 불순물을 제거하고자 히는 노력은 편식계수가 적은 금속 일소들의 제거에는 효과적이나 편석계수가 큰 붕소와 인의 제거에는 효과가 크지 않음을 예상 할 수 있다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2009년도 하계학술대회 논문집
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• pp.438-438
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• 2009

We have investigated the effect of forming gas annealing for Upgraded Metallurgical Grade (UMG)-silicon solar cell in order to obtain low-cost high-efficiency cell using post deposition anneal at a relatively low temperature. We have observed that high concentration hydrogenation effectively passivated the defects and improved the minority carrier lifetime, series resistance and conversion efficiency. It can be attributed to significantly improved hydrogen-passivation in high concentration hydrogen process. This improvement can be explained by the enhanced passivation of silicon solar cell with antireflection layer due to hydrogen re-incorporation. The results of this experiment represent a promising guideline for improving the high-efficiency solar cells by introducing an easy and low cost process of post hydrogenation in optimized condition.

• 한국세라믹학회지
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• 제49권6호
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• pp.637-641
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• 2012

Due to its high production cost and relatively high energy consumption during the Siemens process, poly-silicon makers have been continuously and eagerly sought another silicon route for decades. One candidate that consumes less energy and has a simpler acidic and metallurgical purification procedure is upgraded metallurgical-grade (UMG) silicon. Owing to its low purity, UMG silicon often requires special steps to minimize the impurity effects and to remove or segregate the metal atoms in the bulk and to remove interfacial defects such as precipitates and grain boundaries. A process often called the 'gettering process' is used with phosphorus diffusion in this experiment in an effort to improve the performance of silicon solar cells using UMG silicon. The phosphorous gettering processes were optimized and compared to the standard POCl process so as to increase the minority carrier lifetime(MCLT) with the duration time and temperature as variables. In order to analyze the metal impurity concentration and distribution, secondary ion mass spectroscopy (SIMS) was utilized before and after the phosphorous gettering process.