• Proceedings of the Materials Research Society of Korea Conference
• /
• 2010.05a
• /
• pp.23.1-23.1
• /
• 2010

Alkanethiol (CH3(CH2)nSH) 자기 조립 박막은 금, 은, 팔라듐 그리고 구리와 같은 금속 물질과 결합하여 산화 방지 보호막, 생화학적 멤브레인 그리고 케미컬 센서로 널리 이용되었다. 전도성을 가진 많은 금속 분말 중에서, 구리는 뛰어난 열, 전기 전도성과 풍부한 양으로 다른 귀금속에 비교하여 경제성까지 갖춘 물질이다. 그러나 이러한 구리 나노 분말은 대기에 노출된 구리 분말이 쉽게 산화된다는 결정적인 단점 때문에 그동안 널리 이용되지 못하였다. 이러한 구리의 단점을 극복하고 뛰어난 전도성의 특징을 이용하고자, Langmuir-Blodgett (LB), layer by layer (LbL), electrophoretic deposition (EPD), self-assembled monolayer (SAM)과 같은 구리 나노 분말 위에 유기 박막을 형성하고자 하는 많은 방법이 시도되어왔다. 이러한 방법들 대부분은 습식 방법으로 진행되었으며, 약 2-nm 두께의 SAM 구조를 형성할 수 있음이 많은 연구를 통하여 확인되었다. 그러나 습식 기반의 SAM 구조는 단지 수일 동안만 유효하며, 이는 코팅을 수행하면서 점차 떨어지는 source solvent의 순도와 적합하지 않은 코팅 조건, 그리고 이러한 원인으로 형성된 부실한 막질 구조 때문으로 추측된다. 게다가 이러한 습식 기반 공정은 코팅 막의 두께 조절과 코팅 시 solvent의 순도를 일정하게 유지하는 것이 매우 복잡하고 어려운 작업으로 알려져 왔다. 본 실험에서는 고 진공 챔버 (< $4.0{\times}10-6$ torr) 시스템을 이용하여 습식 기반 공정의 문제점을 극복하고 구리 나노 분말의 산화를 막기 위한 실험을 진행하였다. 1-octanethiol (CH3(CH2)7SH)은 중간 길이의 hydrocarbon (n=7) 구조를 가진 특징 때문에 코팅 물질로 사용되었다. 게다가, alkanethiol 족 특유의 물질인 황(sulfur)은 구리와 결합하여 산화방지 보호막의 역할을 수행할 수 있다. 저 진공 조건에서는 10-nm의 multilayer가 일괄적으로 코팅됨을 확인할 수 있었다. 본 실험에서는 약 10-nm 두께의 자기 조립 박막(self assembled monolayers: SAMs)이 고 진공 조건에서 구리 나노 분말 표면 위에 코팅 조건의 변경을 통해서 5-nm에서 10-nm 두께의 1-octanethiol SAMs 구조를 얻어낼 수 있었다. 이는 고 진공 조건에서 1-octanethiol SAMs의 코팅 두께를 조절함으로 다양한 크기의 분말에 코팅 물질로 쓰일 수 있음을 알 수 있다.

• Korean Journal of Materials Research
• /
• v.9 no.5
• /
• pp.528-532
• /
• 1999

Y$_2$O$_3$films were grown on SiO$_2$-covered Si(111), and hydrogen-terminated Si(111), and hydrogen-terminated Si(111) substrates at 50$0^{\circ}C$ by ultrahigh vacuum ionized cluster beam deposition (UHV-ICB). The microstructures and growth behavior of these films have been investigated by transmission electron diffraction (TED) and high-resolution transmission electron microscopy(HREM). The TED results show that the $Y_2$O$_3$grown on the SiO$_2$-Si has the epitaxial relationship of (11-1)Y$_2$O$_3$∥(111)Si and [-110]Y$_2$O$_3$∥[-110]Si. The film on the H-Si substrate contains YS\ulcorner and amorphous YSi\ulcornerO\ulcorner layers at the interface, having the orientation relationship each other. For the YSi\ulcorner and the Si substrate, the relationship is (0001)YSi\ulcorner∥(111)Si and [1-210]YSi\ulcorner∥∥[-110]Si. For the $Y_2$O$_3$and the YSi\ulcorner ; the relationship is as follows: (11-1)Y$_2$O$_3$∥(0001)YSi\ulcorner and [-110]Y$_2$O$_3$∥[1-210]YSi\ulcorner(111)Y$_2$O$_3$∥(0001)YSi\ulcorner and [-110]Y$_2$O$_3$∥[1-210]YSi\ulcorner. Explanation is given to describe the formation mechanisms of the interfacial phases of SiO\ulcorner, YSi\ulcornerO\ulcorner and YSi\ulcorner. It is shown that the crystallinity of the $Y_2$O$_3$film on the SiO$_2$-Si(111) is better than that of $Y_2$O$_3$on H-Si(111).

• Journal of the Korean Vacuum Society
• /
• v.6 no.1
• /
• pp.1-8
• /
• 1997

The contamination structure and process on SUS 316 under various exposure conditions were investigated using x-ray photoelectron spectroscopy. The metal-oxide, metal-H-oxides, CO, COH, and $C_xH_y$ are the main components of contaminants on the SUS surface. The compositional profiles of the contaminants are shown to be $C_xH_y$/CO(COH)/metal-oxide on SUS. The contamination proceeds in two steps. The oxidation of the metallic constituents followed by adsorption of hydrocarbons. Under UHV conditions the contamination is mainly due to the oxidation, and, as the exposure time increases, the oxidation continues. In HV or higher pressure, most of the oxides are formed almost immediately after exposure and as the exposure time increases the contamination of hydrocarbons continues to grow. For the SUS sample exposed to atmosphere, the metal oxide is distributed deep inside the surface with an exponentially decreasing concentration, and its thickness is nearly in the order of photoelectron mean free path. It is also seen that the Fe oxide is segregated over Cr oxide in the highly oxidized samples.

• Journal of the Korean Vacuum Society
• /
• v.2 no.2
• /
• pp.139-144
• /
• 1993

The dynamic calibration system which can calibrate the ultrahigh vacuum pressure down to $10^{-10}$torr has been fabricated. The production and control of minute flow of $10^{-6}~10^{-9}$torr L/s range is done by a porous plug connected to the high vacuum standards system. The base pressure of the UHV standards system down to $10^{-11}$torr range was obtained by refrigerator type cryopump, whose pumping speed is known to be constant. By using the UHV standards system, 2 extractor gauges and 1 nude ion gauge were calibrated and their linearities and scatterings were studied.

• Journal of the Korean Magnetics Society
• /
• v.11 no.5
• /
• pp.202-210
• /
• 2001

Spin dependent tunneling (SDT) junction devices of Ta/NiFe/Ta/NiFe/FeMn/NiFe/AlOx/CoFe/NiFe/Al with in-situ naturally oxidized Al barrier were fabricated using ion beam deposition and dc sputtering in UHV chamber of 10$^{-9}$ Torr. The maximum tunneling magnetoresistance (TMR) and the product resistance by junction (R$_{j}$ A) are 16-17% and 50-60 $\Omega$${\mu}{\textrm}{m}$$^2$, respectively. The values of TMR and (R$_{j}$ A) with field annealing were slightly increased. The TMR and (R$_{j}$ A) dependence versus the junction area size was observed. These results were explained by using sheet resistance effect of bottom electrode and spin channel effects.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2005.07a
• /
• pp.207-210
• /
• 2005

In order to investigate the influence of the homo buffer layer on the microstructure of the ZnO thin film, undoped ZnO buffer layer were deposited on sapphire (0001) substrates by ultra high vaccum pulsed laser deposition (UHV-PLD) and molecular beam eiptaxy (MBE). After high temperature annealing at $600^{\circ}C$ for 30min, undoped ZnO buffer layer was deposited with various oxygen pressure (35~350mtorr). On the grown layer of undoped ZnO, Arsenic-doped(l, 3wt%) ZnO layers were deposited by UHV-PLD. The optical property of the ZnO was analyzed by the photoluminescence (PL) measurement. From $\Theta-2\Theta$ XRD analysis, all the films showed strong (0002) diffraction peak, and this indicates that the grains grew uniformly with the c-axis perpendicular to the substrate surface. Field emission scanning electron microscope (FE-SEM) revealed that microstructures of the ZnO were varied with oxygen pressure, arsenic doping level, and the deposition method of undoped ZnO buffer layers. The films became denser and smoother in the cases of introducing MBE-buffer layer and lower oxygen pressure during As-doped ZnO deposition. Higher As-doping concentration enhanced the columnar-character of the films.

• Proceedings of the Korean Vacuum Society Conference
• /
• 2010.02a
• /
• pp.400-400
• /
• 2010

우리는 기본 진공 $10^{-11}\;Torr$의 UHV surface magneto-optical Kerr effect (SMOKE) 시스템을 quarter-wave plate를 사용하였던 기존의 방식에서 PEM (photo elastic modulator)를 사용하는 방식으로 장비의 기능을 향상시켰다. 기존 quarter-wave plate를 사용하는 방식의 경우 Kerr signal을 구하기 위해 편광자와 검광자를 수직으로 두어 광량을 0으로 만들어야 한다. 그러나 금속의 경우 대부분 가시광선 영역에서 큰 반사율 때문에 측정되는 광량이 편광자와 검광자를 거치면서 넓은 각도 범위에서 최소값을 갖기 때문에 정확한 영점을 잡는 데 한계가 있다. 이러한 단점을 해결하기 위하여 우리는 PEM을 이용한 위상변조방식을 사용하였다. 위상변조 방식은 Kerr signal과 관계된 양을 PEM을 이용하여 50 kH ($1{\omega}$)와 100 kH ($2{\omega}$)의 진동 주파수에 공조시키고 이를 Lock-in-amplifier를 사용하여 탐지하기 때문에 좋은 sensitivity를 얻을 수 있을 뿐 아니라 Kerr ellipticity와 Kerr rotation을 동시에 측정할 수 있다. 자화에 필요한 전자석은 순철로 된 코어를 제작하여 챔버에 부착하였고 10 A에서 최대 7 kOe의 고자장을 얻을 수 있어 포화자화가 큰 물질에 대해서도 필요한 자성영역까지 측정이 가능하게 하였다. 또 저온 측정을 위해 SMOKE 샘플 홀더를 개조하여 액체 질소를 이용하여 100 K 근방의 영역에서 온도를 제어할 수 있도록 저온 장치를 구성하였다. 여기에서 샘플 근처에 위차한 e-beam heater가 장착된 고온 부분과 액체 질소 냉각, 온도감지를 위한 센서, cartridge heater가 장착된 저온 부분을 sapphire plate로 분리하여 저온용 cartridge heater의 파손을 최소화하였다. 이러한 SMOKE 시스템을 구성한 후에 우리는 Fe/Cr(001)시스템의 자성특성에 대해 연구하였다. Fe/Cr 시스템은 Fe/Cr/Fe의 exchange coupling이나 bulk Cr의 복잡한 자성 특성 때문에 주목을 받아왔다. 이 연구에서 우리는 저온 및 상온에서 Cr(001) 단결정 위에 증착된 Fe 박막의 자성 특성을 보고한다.

• Proceedings of the KIEE Conference
• /
• 2004.07c
• /
• pp.1854-1856
• /
• 2004

In this paper, there have been brief review about the important consideration in laboratory planning and designing 4.2MV impulse voltage generator(IVG), which enable to test and evaluate the UHV dielectric performance of power electric apparatus up to 765kV-class. To improve and reinforce the test ability of the IVG and itself against test object being tested by KERI hereafter, wide investigation and an analysis for a solution, especially overshoot compensation method. With the special consideration about those matters in settling down the 4.2MV IVG have been described with the experimental approaching.

• Proceedings of the KIEE Conference
• /
• 2004.07c
• /
• pp.1851-1853
• /
• 2004

The important consideration in laboratory designing and construction of the artificial pollution testing facilities including 300kV, 1800kVA AC test system, which enable to test and evaluate the UHV dielectric performance of power insulators up to transmission class, has been dealt in this paper. To evaluate the performance characteristics against contamination for various power installation, especially for the insulators and kinds of bushings, brief investigation and an analysis of test objects and related international codes and standards have been conducted. With the special consideration concerning other matters in designing of these testing facilities have been described with the fixed ratings and references.

• Proceedings of the Korean Vacuum Society Conference
• /
• 2016.02a
• /
• pp.142.1-142.1
• /
• 2016

We present bulk diffusion rates of hydroxide ions in amorphous solid water (ASW) at 135 ~ 160 K. Previous researches showed that the diffusion mechanism of hydroxide is different from one of hydronium ions, and this implies that they have different diffusion rates. In ultra-high vacuum (UHV) chamber, low-energy scattering (LES) was used to measure ion population and temperature-programmed desorption (TPD) was conducted for measuring ASW thicknesses. To determine the diffusion rates, a simple model for $H_2O/NaOH/H_2O$ sandwich films was developed using Fick's second law. The measured surface population of hydroxide ions as a function of time was well fitted to the model, and the rates were well agreed to an Arrhenius equation.