• Title/Summary/Keyword: Thickness dependence

Search Result 499, Processing Time 0.028 seconds

Thickness Dependence of the Electrical Properties in NiCr Thin Film Resistors Annealed in a Vacuum Ambient for π - type Attenuator Applications

  • Phuong Nguyen Mai;Lee Won-Jae;Yoon Soon-Gil
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.19 no.8
    • /
    • pp.712-716
    • /
    • 2006
  • NiCr thin films prepared on $SiO_2/Si$ substrates at room temperature by magnetron co-sputtering technique and then annealed in a vacuum ambient $(3{\times}10^{-6}\;Torr)\;at\;400^{\circ}C$. The grain size and crystallinity of the films increased with film thickness. The resistivity of the films slightly decreases as the film thickness increases, Temperature coefficient resistance (TCR) exhibits positive values irrespective of film thickness and TCR in the range of 50 to 400 nm thickness shows suitable values for the application of 10 dB in ${\pi}-type$ attenuators.

Dielectric Characteristics of Magnetic Tunnel Junction

  • Kim, Hong-Seog
    • The Journal of Engineering Research
    • /
    • v.6 no.2
    • /
    • pp.33-38
    • /
    • 2004
  • To investigate the reliability of the MTJs on the roughness of insulating tunnel barrier, we prepared two MTJs with the different uniformity of barrier thickness. Namely, the one has uniform insulating barrier thickness; the other has non-uniform insulating barrier thickness as compared to different thing. As to depositing amorphous layer CoZrNb under the pinning layer IrMn, we achieved MTJ with uniform barrier thickness. Toinvestigate the reliability of the MTJs dependent on the bottom electrode, time-dependent dielectric breakdown (TDDB) measurements were carried out under constant voltage stress. The Weibull fit of out data shows clearly that $t_{BD}$ scales with the thickness uniformity of MTJs tunnel barrier. Assuming a linear dependence of log($t_{BD}$) on stress voltages, we obtained the lifetime of $10^4$years at a operating voltage of 0.4 V at MTJs comprising CoNbZr layers. This study shows that the reliabilityof new MTJs structure was improved due to the ultra smooth barrier, because the surface roughness of the bottom electrode influenced the uniformity of tunnel barrier.

  • PDF

A Study on the Wall Mobility of Magnetic Domain for the Singel Crystal $YFeO_3$ ($YFeO_3$ 박판 단결정의 자벽이동에 관한 연구)

  • 김종오;한관희
    • Journal of the Korean Ceramic Society
    • /
    • v.23 no.4
    • /
    • pp.47-54
    • /
    • 1986
  • Since the wall mobility of bubble magnetic materials havin g the large q (q=Kac/2$\pi$$M_s^2$) like a $YFeO_3$ has been found to be proportional to the wall energy theoretically crystallographical direction dependence of wall energy calculated by the basis on the spin configuration of the bubble wall which lies in the ac plane was compared with the crystallographical direction dependence of wall mobility which was measured by the experiment. The sample was a single crystal of $YFeO_3$ which was cut into plate normal to the C axis and polished t a thickness of about 60${\mu}{\textrm}{m}$ The measurement of the wall mobility was carried out by optical system using the magneto-optic Faraday effect. From the good agreement of the crystallographical direction dependence of wall mobility and will energy it was found that the spin configuration of the bubble wall suggested is fair.

  • PDF

Theoretical study of the optical properties of low voltage stacked cholesteric liquid-crystal displays

  • Valyukh, Iryna;Valyukh, Sergiy;Skarp, Kent
    • 한국정보디스플레이학회:학술대회논문집
    • /
    • 2004.08a
    • /
    • pp.202-204
    • /
    • 2004
  • We study theoretically optical properties of thin layered stacked monochrome cholesteric liquid-crystal displays. Thin thickness of the layers (${\sim}1{\mu}m$) allows us appreciably to reduce driving voltage and use such displays in smart cards. Good selective reflection is achieved due to stacked structure. Dependence of the reflectivity of this type of displays on the quantity of the layers, their thickness, and liquid crystal birefringence is investigated.

  • PDF

External Magnetic Field Influence on Exchange Coupling Oscillations in Ultrathin Fe/Au/Tb Film Structures

  • Pogoryelov, Ye.
    • Journal of Magnetics
    • /
    • v.9 no.4
    • /
    • pp.97-100
    • /
    • 2004
  • In the present work exchange coupling between ultrathin Fe ($8{\AA}$) and Tb ($12{\AA}$) layers separated by Au spacer of varied thickness ($3-20{\AA}$) was studied. Anomalous Hall effect measurements showed weakly damped oscillating dependence of the Hall conductivity as a function of Au spacer thickness. Disagreement of the observed damping with the RKKY model of interlayer exchange coupling was explained by the influence of external magnetic field on the behaviour of exchange coupling oscillations. It was confirmed by Hall-like effect measurements at zero applied magnetic field and also illustrated by corresponding estimations.

The energy absorption characteristics of thin-walled members for the use of light-weight vehicles (경량화용 차체구조 박육부재의 에너지 흡수특성)

  • 김정호;윤규종;양인영
    • Journal of the Korean Society of Safety
    • /
    • v.11 no.3
    • /
    • pp.33-43
    • /
    • 1996
  • In this paper, collapse test of thin-walled structures, which are widely used in the vehicle members is carried out to observe the dependence of cross-sectional forms and materials on the absorbed energy in the viewpoint of crashworthiness. Also, specimens consist of two kinds (Al, CFRP) with various thickness. Comparisons of circular specimens are made to find characteristics of the different specimens on the absorption ability according to specimen thickness and materials.

  • PDF

Microscopic Domain Structures in NiO Exchange-coupled Films

  • Hwang, D.G.;Kim, J.K.;Kim, S.W.;Lee, S.S.;Dreyer, M.;Gomez, R.D.
    • Journal of Magnetics
    • /
    • v.7 no.3
    • /
    • pp.94-97
    • /
    • 2002
  • The dependence on nickel oxide thickness and a ferromagnetic layer thickness in unidirectional and isotropic exchange-coupled NiO/NiFe(Fe) bilayer films was investigated by magnetic force microscopy to better understand the relation between magnetic domain structure and exchange biasing at microscopic length scales. As the NiO thickness increased, the domain structure of unidirectional biased films formed smaller and more complex in-plane domains. By contrast, for the isotropically coupled films, large domains generally formed with increasing NiO thickness including a cross type domain with out-of plane magnetization orientation. The density of the cross domain is proportional to exchange biasing field, and the fact that the domain mainly originated from the strongest exchange coupled region was confirmed by imaging in an applied external field during a magnetization cycle.

Thickness and Orientation Effect on the YBCO Thin Films For Microwave Device Applications (마이크로파 소자응용을 위한 YBCO 박막의 두께 및 증착온도에 관한 특성연구)

  • 이상렬;전희석;허창회;한경보;전창훈
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.15 no.6
    • /
    • pp.539-542
    • /
    • 2002
  • The effect of the superconducting film thickness on the surface resistance has been investigated. Superconducting YBCO thin films have been grown on MgO substrates by pulsed laser deposition. The dependence of the orientation of YBCO film on thickness has been investigated by X-ray diffraction technique. X-ray diffraction indicated that the film orientation was changed by increasing the film thickness and by changing the substrate temperature. The microwave properties of the films with mixed orientations of a-axis and c-axis will be reported for the applications of microwave devices.

Thickness Effect on the Structural and Electrical Properties of YBCO Thin Films Grown by Pulsed Laser Deposition (PLD로 증착된 YBCO 박막의 두께에 따른 배향성과 전기적 특성 변화)

  • 허창회;한경보;이상렬
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2001.07a
    • /
    • pp.617-619
    • /
    • 2001
  • The effect of the superconducting film thickness on the substrate temperature has been investigated. Superconducting YBCO thin films have been grown on MgO substrates by pulsed laser deposition. The dependence of the orientation of YBCO film on thickness has been investigated by X-ray diffraction technique. X-ray diffraction indicated that the film orientation was changed by increasing the film thickness and by changing the substrate temperature.

  • PDF