• ETRI Journal
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• v.43 no.5
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• pp.900-908
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• 2021

This paper proposes thermometer-code latches having five and six transistors for unidirectional and bidirectional thermometer-code shift-registers, respectively. The proposed latches omit the set and reset transistors by changing from two supply voltage nodes to the set and reset signals in the cross-coupled inverter. They set or reset the data by changing the supply voltage to ground in either of two inverters. They reduce the number of transistors to five and six compared with the conventional thermometer-code latches having six and eight transistors, respectively. The proposed thermometer-code latches were simulated using a 65 nm complementary metal-oxide-semiconductor (CMOS) process. For comparison, the proposed and conventional latches are adapted to the 64 bit thermometer-code shift-registers. The proposed unidirectional and bidirectional shift-registers occupy 140 ㎛² and 197 ㎛², respectively. Their consumption powers are 4.6 ㎼ and 5.3 ㎼ at a 100 MHz clock frequency with the supply voltage of 1.2 V. They decrease the areas by 16% and 13% compared with the conventional thermometer-code shift-register.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.58 no.3
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• pp.627-631
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• 2009

This paper presents a novel current steering cell matrix DAC(digital-to-analog converter) architecture to reduce decoder area. The current cell matrix of a existing architecture is selected by columns and lows thermometer code decoder of input bits. But The current cell matrix of a proposal architecture is divided 2n by the thermometer code decoder of upper input bits and are selected by the thermometer code decoder of middle and lower input bits. Because of this configuration, decoder numbers have increased. But the gate number that composed of decoder has decreased. In case of the designed 8 bit current steering cell matrix DAC, the gate number of decoder has decreased by about 55% in comparison with a existing architecture.

• Journal of IKEEE
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• v.27 no.4
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• pp.573-578
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• 2023

This paper introduces a new locking technique applicable to high-performance digital Phase-Locked Loops (DPLL). The study employs additional thermometer codes to reduce quantization errors in LC-based Digital Controlled Oscillators (DCO). Despite not implementing the entire DCO codes in thermometer mode, this method effectively reduces quantization errors through enhanced linearity. In the initial locking phase, binary codes are used, and upon completion of locking, the system transitions to thermometer codes, achieving high frequency linearity and reduced jitter characteristics. This approach significantly reduces the number of switches required and minimizes the oscillator's area, especially in applications requiring low DCO gain (Kdco), compared to the traditional method that uses only thermometer codes. Furthermore, the jitter performance is maintained at a level equivalent to that of the thermometer-only approach. The efficacy of this technique has been validated through modeling and design at the RTL level using SystemVerilog and Verilog HDL.

• 전자공학회논문지 IE
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• v.44 no.2
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• pp.14-20
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• 2007

This paper presents quaternary D flip-flop with advanced performance. Quaternary D flip-flop is composed of the components such as thermometer code output circuit, EX-OR gate, bias inverter, transmission gate and binary D flip-flop circuit. The designed circuit is simulated by HSPICE in $0.35{\mu}m$ one-poly six-metal CMOS process parameters with a single +3.3V supply voltage. In the simulations, sampling frequencies is measured around 100MHz. The PDP parameters and FOM we estimated to be 59.3fJ, 33.7 respectively.

• Proceedings of the IEEK Conference
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• 2002.07c
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• pp.1571-1574
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• 2002

This paper describes a circuit and its operations of a programmable digital on-chip terminator designed with CMOS circuits which are used in high speed I/O interface. The on-chip terminator matches external reference resistor with the accuracy of ${\pm}$ 4.1％ over process, voltage and temperature variation. The digital impedance codes are generated in programmable impedance controller (PIC), and the codes are sent to terminator transistor arrays at input pads serially to reduce the number of signal lines. The transistor array is thermometer-coded to reduce impedance glitches during code update and it is segmented to two different blocks of thermometer-coded transistor arrays to reduce the number of transistors. The terminator impedance is periodically updated during hold time to minimize inter-symbol interferences.

• Journal of ILASS-Korea
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• v.21 no.4
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• pp.184-194
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• 2016

Many industrial processes require reliable temperature measurements in harsh environments with high temperature, dust, humidity, and pressure. However, commercially-available conventional temperature measurement devices are not suitable for use in such conditions. This study thus proposes a reliable, durable two-color radiation thermometer (RT) for harsh environments that was developed by selecting the appropriate components, designing a suitable mechanical structure, and compensating environmental factors such as absorption by particles and gases. The two-color RT has a simple, compactly-designed probe with a well-structured data acquisition system combined with efficient LabVIEW-based code. As a result, the RT can measure the temperature in real time, ranging from 300 to $900^{\circ}C$ in extremely harsh environments, such as that above the burden zone of a blast furnace. The error in the temperature measurements taken with the proposed two-color RT compared to that obtained using K-type thermocouple readouts was within 6.1 to $1.4^{\circ}C$ at a temperature range from 200 to $700^{\circ}C$. The effects of absorption by gases including $CO_2$, CO and $H_2O$ and the scattering by fine particles were calculated to find the transmittance of the two wavelength bands of operation through the path between the measured burden surface and the two-color probe. This method is applied to determine the transmittance of the short and long wavelength bands to be 0.31 and 0.51, respectively. Accordingly, the signals that were measured were corrected, and the true burden surface temperature was calculated. The proposed two-color RT and the correction method can be applied to measure temperatures in harsh environments where light-absorbing gases and scattering particles exist and optical components can be contaminated.

• Nuclear Engineering and Technology
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• v.54 no.1
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• pp.30-35
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• 2022

In a nuclear reactor, gamma radiation is the dominant energy deposition in non-fuel regions. Heat is generated upon gamma deposition and consequently affects the mechanical and thermal structure of the material. Therefore, the safety of samples should be carefully considered so that their integrity and quality can be retained. To evaluate relevant parameters, an in-core gamma thermometer (GT) was used to measure gamma heating (GH) throughout the operation of the McMaster nuclear reactor (MNR) at four irradiation sites. Additionally, a Monte Carlo reactor physics code (Serpent-2) was utilized to model the MNR with the GT located in the same irradiation sites used in the measurement to verify its predictions against measured GH. This research aids in the development of modeling, calculation, and prediction of the GH utilizing Serpent-2 as well as implementing a new GH measurement at the MNR core. After all uncertainties were quantified for both approaches, comparable GH profiles were observed between the measurements and calculations. In addition, the GH values found in the four sites represent a strong level of radiation based on the distance of the sample from the core. In this study, the maximum and minimum GH values were found at 0.32 ± 0.05 W/g and 0.15 ± 0.02 W/g, respectively, corresponding to 320 Sv/s and 150 Sv/s. These values are crucial to be considered whenever sample is planned to be irradiated inside the MNR core.

• Proceedings of the IEEK Conference
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• 2005.11a
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• pp.777-780
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• 2005

모바일 오디오 적용을 위한 저전력 ${\Sigma}{\Delta}$ Modulator 에 대한 설계와 layout 을 보였다. 전체 구조는 3 차 단일 피드백 루프이며, 해상도는 16bit 을 갖는다. 샘플링 주파수에 따른 Over-sampling Ratio 는 128(46kHz) 또는 64(96kHz) 가 되도록 하였다. 차동 구조를 사용한 3 차 ${\Sigma}{\Delta}$ modulator 내의 적분기에 사용된 Op-Amp 는 DC-Gain 을 높이기 위해서 Gain-boosting 기법이 적용되었다. ${\Sigma}{\Delta}$ modulator 의 기준 전압은 전류 모드 Band-Gap Reference 회로에서 공급이 되며, PVT(Process, Voltage, Temperature) 변화에 따른 기준 전압의 편차를 보정하기 위하여, binary 3bit 으로 선택하도록 하였다. DAC 에서 사용되는 단위 커패시터의 mismatch 에 의한 성능 감소를 막기 위해, DAC 신호의 경로를 임의적으로 바꿔주는 scrambler 회로를 이용하였다. 4bit Quantizer 내부의 비교기 회로는 고해상도를 갖도록 설계하였고, 16bit thermometer code 에서 4bit binary code 변환시 발생하는 에러를 줄이기 위해 thermometer-to-gray, gray-to-binary 인코딩 방법을 적용하였다. 0.18um CMOS standard logic 공정 내 thick oxide transistor(3.3V supply) 공정을 이용하였다. 입력 전압 범위는 2.2Vp-p,diff. 이며, Typical process, 3.3V supply, 50' C 시뮬레이션 조건에서 2Vpp,diff. 20kHz sine wave 를 입력으로 할 때 SNR 110dB, THD 는 -95dB 이상의 성능을 보였고, 전류 소모는 6.67mA 이다. 또한 전체 layout 크기는 가로 1100um, 세로 840um 이다.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.39 no.7
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• pp.57-65
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• 2002

In this paper, a 2.5V 10-bit 300MSPS CMOS D/A Converter is described. The architecture of the D/A Converter is based on a current steering 8+2 segmented type, which reduces non-linearity error and other secondary effects. In order to achieve a high performance D/A Converter, a novel current cell with a low spurious deglitchnig circuit and a novel inverse thermomeer decoder are proposed. To verify the performance, it is integrated with $0.25{\mu}m$ CMOS 1-poly 5-metal technology. The effective chip area is $1.56mm^2$ and power consumption is about 84mW at 2.5V power supply. The simulation and experimental results show that the glitch energy is 0.9pVsec at fs=100MHz, 15pVsec at fs=300MHz in worst case, respectively. Further, both of INL and DNL are within ${\pm}$1.5LSB, and the SFDR is about 45dB when sampling, frequency, is 300MHz and output frequency is 1MHz.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.33 no.5C
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• pp.378-385
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• 2008

This paper has been designed with CMOS Analog-to-Digital Converter(ADC) to use a high speed embedded system. It used flash ADC with a voltage estimator and comparator for background developed autozeroing. The speed of this architecture is almost similar to conventional flash ADC but the die size are lower due to reduced numbers of comparators and associated circuity. This ADC is implemented in a $0.25{\mu}m$ pure digital CMOS technology.