• Journal of Korea Multimedia Society
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• v.13 no.8
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• pp.1115-1127
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• 2010

In order to increase the productivity in manufacturing TFT-LCD(thin film transistor-liquid crystal display), it is essential to classify defects that occur during the production and make an appropriate decision on whether the product with defects is scrapped or not. The decision mainly depends on classifying the defects accurately. In this paper, we present an effective classification method for film defects acquired in the panel production line by analyzing the intensity distribution and shape feature of the defects. We first generate a binary image for each defect by separating defect regions from background (non-defect) regions. Then, we extract various features from the defect regions such as the linearity of the defect, the intensity distribution, and the shape characteristics considering intensity, and construct a referential image database that stores those feature values. Finally, we determine the type of a defect by matching a defect image with a referential image in the database through the matching cost function between the two images. To verify the effectiveness of our method, we conducted a classification experiment using defect images acquired from real TFT-LCD production lines. Experimental results show that our method has achieved highly effective classification enough to be used in the production line.

• Proceedings of the IEEK Conference
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• 2003.11a
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• pp.343-346
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• 2003

In this paper, we try to make a systematic analysis for the vertical crosstalk on LCD driving. The vertical Crosstalk is one of the inevitable phenomena in the high-resolution TFT-LCDs. At first, the vortical Crosstalk is defined. Considering the structure of the pixels and data lines, a LCD (a pixel) is modeled electrically by its' equivalent circuit. The circuit is verified by experiment and used to find the cause of the vertical Crosstalk.

• Information Display
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• v.10 no.2
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• pp.14-20
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• 2009

• Information Display
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• v.16 no.3
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• pp.19-27
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• 2015

• Information Display
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• v.2 no.5
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• pp.27-38
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• 2001

• Information Display
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• v.3 no.1
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• pp.20-25
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• 2002

• Information Display
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• v.3 no.1
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• pp.31-36
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• 2002

• Journal of the Korea Academia-Industrial cooperation Society
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• v.13 no.8
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• pp.3618-3622
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• 2012

In this study, the yield of the modules in LCD production lines, improving current TFT-LCD production process is essential for high-pressure silicone injection equipment, and precision control system was developed. This full-scale production of the future through the development of next-generation display production line is being prepared, being transferred to China in LCD production facilities can make the most of efficient equipment. Therefore, minimize the cost of new investment and help create the maximum effect to control the detailed behavior of the sequence H/W and S/W system was installed on the production line. In addition, Fast-evacuating the structure proposed for the Vacuum pump, Pump control circuit design and experimental results has been completed.

• Journal of the Korean Society for Precision Engineering
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• v.29 no.11
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• pp.1164-1169
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• 2012

This paper presents a study of an integrated infrared (IR) photo sensor for display application. We fabricated hydrogenated amorphous silicon thin film transistor (a-Si:H TFT) and hydrogenated amorphous silicon germanium thin film transistor (a-SiGe:H TFT) which were bottom gate structure. We investigated the dependence of a-SiGe:H TFT characteristics on incident wavelengths. We proposed photo sensor which responded to wavelengths of IR region. Proposed pixel circuit of photo sensor was consists of switch TFT and photo TFT, and one capacitor. We developed integrated photo sensor circuit and investigated the performance of the proposed sensor circuit according to the input wavelengths. The developed photo sensor circuit with a-SiGe:H TFT was suitable for IR.

• 한국정보디스플레이학회:학술대회논문집
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• 2007.08a
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• pp.286-289
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• 2007

We have developed an automated circuit defect inspection and repair method that can be used to improve the yield ratio of TFT-LCD. The method focuses on correcting resist patterns after the development process to ensure shape regularity. We built a prototype system and confirmed that the method is valid.