• Korean Journal of Remote Sensing
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• v.34 no.1
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• pp.127-139
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• 2018

The GOCI atmospheric correction overland surfaces is essential for the time-series analysis of terrestrial environments with the very high temporal resolution. We develop an operational GOCI atmospheric correction method over land surfaces, which is rather different from the one developed for ocean surface. The GOCI atmospheric correction method basically reduces gases absorption and Rayleigh and aerosol scatterings and to derive surface reflectance from at-sensor radiance. We use the 6S radiative transfer model that requires several input parameters to calculate surface reflectance. In the sensitivity analysis, aerosol optical thickness was the most influential element among other input parameters including atmospheric model, terrain elevation, and aerosol type. To account for the highly variable nature of aerosol within the GOCI target area in northeast Asia, we generate the spatio-temporal aerosol maps using AERONET data for the aerosol correction. For a fast processing, the GOCI atmospheric correction method uses the pre-calculated look up table that directly converts at-sensor radiance to surface reflectance. The atmospheric correction method was validated by comparing with in-situ spectral measurements and MODIS reflectance products. The GOCI surface reflectance showed very similar magnitude and temporal patterns with the in-situ measurements and the MODIS reflectance. The GOCI surface reflectance was slightly higher than the in-situ measurement and MODIS reflectance by 0.01 to 0.06, which might be due to the different viewing angles. Anisotropic effect in the GOCI hourly reflectance needs to be further normalized during the following cloud-free compositing.

• Korean Journal of Materials Research
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• v.19 no.8
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• pp.407-411
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• 2009

Reflection properties, such as specular reflection and diffuse reflection, are very important optical properties for the reflector, which has high reflectance in the display and architecture industry. Calcite is lowcost, nontoxic, and stable over a wide temperature range. Therefore, it is one of the most widely using fillers in many industries and has some advantages over titania as a filler to improve reflectance. However, optical properties, especially those of ceramic-filled composites, have not been analyzed. We studied the reflectance of calcite composites with their surface roughness. The reflectance of the composites was determined using a UV-visible spectrometer. The surface morphology and the micro-structure of the composites were investigated by atomic force microscope. The reflectance of the composites was improved by increasing the content of calcite in the calcite-frit composite. The reflectance is related with the surface roughness in the composites. However, the reflectance depends on the calcite contents in materials with similar surface roughness.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.28 no.2
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• pp.104-108
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• 2015

Al thin films were deposited on TiN/Si(100) via metal-organic chemical vapor deposition using N-methylpyrrolidine alane as a precursor. Characterization of the deposited films were investigated with SEM, XRD, ${\alpha}$-step, AFM, 4-point probe. The early stage of Al thin film deposition was analyzed by in-situ surface reflectance measurement with laser and photometer apparatus. The surface reflectance were changed greatly during the initial 30~40 seconds. There were two increases and two decreases in the surface reflectance, thus the sequence of Al films were deposited at 8 significant points of the surface reflectance change. Surface topograph and cross-sectional view of each film were analyzed with SEM. Al films were grown in the complex mechanism of Volmer-Weber and Stranski-Krastanov process.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.21 no.2
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• pp.99-103
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• 2008

To improve efficiency of solar cells, it is important to make a light trapping structure to reduce surface reflectance for increasing absorption of sun light within the solar cells. One of the promising methods that can reduce surface reflectance is isotropic texturing with acid solution based on hydrofluoric acid(HF), nitric acid($HNO_3$), and organic additives. Anisotropic texturing with alkali solution is not suitable for multicrystalline silicon wafers because of its different grain orientation. Isotropic texturing with acid solution can uniformly etch multicrystalline silicon wafers unrelated with grain orientation, so we can get low surface reflectance. In this paper, the acid texturing solution is made up of only HF and $HNO_3$ for easy controlling the concentration and low cost compared to acid solution with organic additives. $HNO_3$ concentration and dipping time were varied to find the condition of minimum surface reflectance. Textured surfaces were observed Scanning Electron Microscope(SEM) and surface reflectance were measured. The best result of arithmetic mean(wavelength from 400 nm to 1000 nm) reflectance with acid texturing is 4.64 % less than alkali texturing.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2007.06a
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• pp.16-17
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• 2007

To improve efficiency of solar cells, it is important to make a light trapping structure to reduce surface reflectance for increasing absorption of sun light within the solar cells. One of the promising methods that can reduce surface reflectance is isotropic texturing with acid solution based on hydrofluoric acid(HF), nitric acid($HNO_3$), and organic additives. Anisotropic texturing with alkali solution is not suitable for multicrystalline silicon wafers because of its different grain orientation. Isotropic texturing with acid solution can uniformly etch multicrystalline silicon wafers unrelated with grain orientation, so we can get low surface reflectance. In this paper, the acid texturing solution is made up of only HF and $HNO_3$ for easy controling the concentration and low cost compared to acid solution with organic additives. $HNO_3$ concentration and dipping time were varied to find the condition of minimum surface reflectance. Textured surfaces were observed Scanning Electron Microscope(SEM) and surface reflectance were measured. The best result of arithmetic mean(wavelength from 400nm to 1000nm) reflectance with acid texturing is 4.64% less than alkali texturing.

• Korean Journal of Remote Sensing
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• v.32 no.1
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• pp.61-65
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• 2016

Importance of remote sensing for surface is increased than past. So many countries try to many ways to retrieve surface reflectance. In this study, we study a Bidirectional Reflectance Distribution Function (BRDF) to retrieve surface reflectance. We apply BRDF using observed surface reflectance of SPOT/VEGETATION (VGT-S1) and angular data to get Bidirectional Reflectance Distribution (BRD) coefficients for calculating scattering. And then we apply BRDF in the opposite direction with BRD coefficients and angular data to retrieve Background Surface Reflectance (BSR). The range of BSR is not over $0.4{\mu}m$ (blue), $0.45{\mu}m$ (red), $0.55{\mu}m$ (NIR). And for validation we compare BSR with VGT-S1, there are bias is from 0.0116 to 0.0158 and RMSE is from 0.0459 to 0.0545. As a result, we confirm that BSR is similar to VGT-S1.

• Journal of the Korean Graphic Arts Communication Society
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• v.16 no.3
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• pp.121-131
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• 1998

The object color does not look same under the different light source. It depends on the surface spectral reflectance and the spectral distribution of light source. Therefore we should find the surface spectral reflectance of object color and the spectral distribution of light source for color reproduction. Using Wiener estimation, we can estimate the spectral reflectance from low dimensional images obtained with multi-band image acquisition system. The kind and the number of imaging filters have the effect on the estimation of the spectral reflectance. Therefore it is important that optimal filters are selected to minimize the error of the result. In this paper, we describe methods to select optimal filters with minimum error between measured and estimated surface spectral reflectance and to estimate surface spectral reflectance of Munsell color chart from six multi-band images by using Wiener estimation.

• Proceedings of the Korean Printing Society Conference
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• 1998.10a
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• pp.1-6
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• 1998

The object color does not look same under the different light source. It depends on the surface spectral reflectance and the spectral distribution of light source. Therefore we should find the surface spectral reflectance of object color and the spectral distribution of light source for color reproduction. Using Winer estimation, we can reconstruct the spectral reflectance from low dimensional images obtained with a few filters. The kind and the number of filters have the effect on the estimation of the spectral reflectance. Therefore it is important that optimal filters are selected to minimize the error of the result. In this paper, we describe methods to select optimal filters with minimum error between measured and estimated surface spectral reflectance and to estimate surface spectral reflectance of Munsell color from six band images by using Wiener estimation.

• Journal of the Korean Institute of Telematics and Electronics S
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• v.34S no.6
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• pp.21-29
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• 1997

In this paper, we propose a new approach for recovering 3-D shape and extracting the reflectance properties of surface from intensity images. Photometric stereo method(PSM) is genrally based on the direct illumination. In this paper, the reflectance function is derived by interoduceing the indirect diffuse illumination in PSM and then applied to hybrid reflectance model which consists of two components; the lambertian and the specular reflectance. Under the hybrid reflectance model and the indirect diffuse illumination circumstance, the reflectance properties of sample surface can be extracting by normal sampler and then 3-D shape of an object can be recovered based on extracting reflectance properties. This method is rapid because of using the reference table and simplifies the restriction condition about the reflectance function existing in prior studies. Th erecovery efficiency in our method is better than that in prior studies. Also, this method is applied to various types of surfaces by defining general reflectance function.

• Korean Journal of Remote Sensing
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• v.32 no.1
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• pp.67-71
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• 2016

The surface reflectance is essential to retrieval various indicators related land properties such as vegetation index, albedo and etc. In this study, we estimated surface reflectance using Himawari-8 / Advanced Himawari Imager (AHI) channel data. In order to estimate surface reflectance from Top of Atmosphere (TOA) reflectance, the atmospheric correction is necessary because all of the TOA reflectance from optical sensor is affected by gas molecules and aerosol in the atmosphere. We used Second Simulation of a Satellite Signal in the Solar Spectrum Vector (6SV) Radiative Transfer Model (RTM) to correct atmospheric effect, and Look-Up Table (LUT) to shorten the calculation time. We verified through comparison Himawri-8 / AHI surface reflectance and Proba-V S1 products. As a result, bias and Root Mean Square Error (RMSE) are calculated about -0.02 and 0.05.