• Journal of the korean academy of Pediatric Dentistry
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• v.24 no.1
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• pp.148-172
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• 1997

Sixty human premolar teeth were used for this in vitro study. After each tooth was sectioned mesiodistally, one half was used for the experimental group and the other half for the control. Three groups were made for each fluoride applying method and twenthy teeth were assigned to each group. Ten teeth were used for evaluating total fluoride amount and the other ten were used for firmly-bound fluoride. Fluorshield was used for fluoride-releasing sealant and 1.23% APF, 0.05% NaF were used for topical application fluorides. Each tooth was cleaned with a tooth brush using nonfluoride containing pumice before the experiment. In the sealant group, fluoroshield was applied to the enamel surface without etching procedure and stored in $37^{\circ}C$ saline for 30 days. After 30 days, sealant was removed with explorer without scratching the enamel surface and washed with distilled water and dried. In the APF group, each tooth was immersed in 1.23% APF for 30 min then washed and dried in the same manner. In the NaF group, each tooth was immersed in 0.05% NaF for 24 hours then washed and dried as described above. After each fluoride regimen was applied, ten teeth were randomly selected from each group and immersed in 1M KOH solution for 24 hours to remove loosely-bound fluoride possibly deposited by the three different fluorides applied. In each group, total fluoride amount deposited and the amount of enamel removed by acid biopsy were calculated. After loosely-bound fluoride was removed, firmly-bound fluoride deposited and the amount of enamel removed by acid biopsy were also calculated. Total fluoride amount deposition was significantly increased in the APF and NaF groups, but not in the sealant group. Amount of enamel removed by acid-biopsy was also significantly diminished in the APF and NaF groups, but not in the sealant groups. After loosely-bound fluoride was removed from each groups, no statistical difference was found in the amount of firmly-bound fluoride in any groups. Also no effect of firmly-bound fluoride on enamel dissolution was shown in any groups after loosely-bound fluoride was removed from each group. In conclusion, topical application method of APF or NaF is more effective than fluoride-releasing sealant application to make $CaF_2$ coating on enamel surface and $CaF_2$ coating is the main source for anticariogenic effect of fluoride. However, longterm anticariogenic effect of fluoride-releasing sealant should be further evaluated.

• Clean Technology
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• v.27 no.3
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• pp.240-246
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• 2021

The waste etching solution for chip on film (COF) contained about 3.5% copper, and it was recovered through cementation using iron samples. The effect of cementation with plate, chip, and powder iron samples was investigated. The molar ratio (m/r) of iron to copper was used as a variable in order to increase the recovery rate of copper. As the molar ratio increased, the copper content in the solution rapidly decreased at the beginning of the cementation reaction. Before and after the reaction, the copper content of the solution was determined by Inductively Coupled Plasma (ICP) using copper concentration according to time. After cementation at room temperature for 1 hour, the recovery rate of copper had increased the most in the iron powder sample, having the largest specific surface area of the samples, followed by the chip and plate samples. The recovered copper powder was characterized for its crystalline phase, morphology, and elemental composition by X-ray diffraction (XRD), scanning electron microscopy (SEM), and Energy-dispersive X-ray spectroscopy (EDS), respectively. Copper and unreacted iron were present together in the iron powder samples. The optimum condition for recovering copper was obtained using iron chips with a molar ratio of iron to copper of 4 giving a recovery rate of about 98.4%.

• Journal of the Korean institute of surface engineering
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• v.42 no.6
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• pp.267-271
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• 2009

Multicomponent transparent conducting oxide films were deposited on glass substrates at 150 by dual magnetron sputtering of AZO and ITO targets. In the case of mixing a limited amount of ITO (10W), resistivity of TCO films was significantly increased compared to the AZO film; from $3.5{\times}10^{-3}$ to $9.7{\times}10^{-3}{\Omega}{\cdot}cm$. Deterioration of the electrical conductivity is attributed to the decreases in carrier concentration and Hall mobility. Improvement of the conductivity could be obtained for the films prepared with ITO powers larger than 40 W. The lowest resistivity ($\rho$) of $7.3{\times}10^{-4}{\Omega}{\cdot}cm$ was achieved when ITO power was 100 W. Effects of $H_2$ incorporation on the electrical and optical properties of AZO-ITO films were investigated in this work. Addition of small amount of hydrogen resulted in the increase of carrier concentration and the improvement of electrical conductivity. It is apparent that the roughness of AZO-ITO films decreases dramatically after the transition of microstructure from polycrystalline to amorphous phase, which gives practical advantages such as an excellent uniformity of surface and a high etching rate. AZO-ITO films grown at sputtering ambient with hydrogen gas are expected to be applicable to optoelectronic devices such as organic light emitting diodes and flexible displays due to their sufficient electrical and structural properties.

• Journal of the Korean Vacuum Society
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• v.21 no.3
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• pp.151-157
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• 2012

The two dimensional electron gas system based on GaAs/$Al_xGa_{1-x}As$ heterostructure is widely used for fabricating quantum structures such as quantum dot, quantum point contact, electron interferometer and so on. However the conductance of the device is usually unstable due to the presence of random telegraph noise in the device. To overcome such problem, we have studied the effect of surface state on the stability of the device by altering the surface state of the device with oxygen plasma. The dramatic improvement of the device stability has been observed after cleaning the device surface with oxygen plasma (by 50 W~120 W plasma power) for 30 sec followed by etching in HCl : $H_2O$ (1 : 3) solution.

• JSTS:Journal of Semiconductor Technology and Science
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• v.5 no.2
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• pp.131-135
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• 2005

The effect of different surface passivation films on blue or green (465-505 nm) InGaN/GaN multi-quantum well light-emitting diodes (LEDs) die were examined. $SiO_2$ or $SiN_x$ deposited by plasma enhanced chemical vapor deposition, or $Sc_2O_3$ or MgO deposited by rf plasma enhanced molecular beam epitaxy all show excellent passivation qualities. The forward current-voltage (I-V) characteristics were all independent of the passivation film used, even though the MBE-deposited films have lower interface state densities ($3-5{\times}10^{12}\;eV^{-1}\;cm^{-2}$) compared to the PECVD films (${\sim}10^{12}\;eV^{-1}\;cm^{-2}$), The reverse I-V characteristics showed more variation, hut there was no systematic difference for any of the passivation films, The results suggest that simple PECVD processes are effective for providing robust surface protection for InGaN/GaN LEDs.

• Journal of the Microelectronics and Packaging Society
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• v.10 no.2
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• pp.39-47
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• 2003

Cr thin films were deposited on photosensitive polyimide substrates by RF bias sputtering and DC sputtering and the interfaces between Cr thin film and polyimide were observed using TEM. When the polyimide surface was in-situ RF plasma cleaned at the RF power density of 0.13-2.12 $W/cm^2$, increasing of RF power density changed the morphology of polyimide surfaces from round dig to sharp shape, and surface roughness increased by anisotropic etching. The intermixed layer-like interfaces between Cr and polyimide were observed in the RF bias sputtered specimens. This interface seems to be formed due to the RF cleaning effect; the polyimide surface was RF plasma cleaned while RF power was increased to the setting point before Cr deposition.

• Journal of Technologic Dentistry
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• v.30 no.2
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• pp.79-86
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• 2008

The purpose of this study was to investigate the effect retention element formed by metal surface treatment method on the bond strength of indirect composite resin and metal. The metal specimens were cast from Ni-Cr alloy($Rexillium^{(R)}$ III). They were divided into 5 groups by applied retention element: $50{\mu}m$ aluminium oxide sandblasting group, $250{\mu}m$ aluminium oxide sandblasting group, 0.2mm retention crystal group, 10% $H_{2}SO_{4}$ solution etching group, $110{\mu}m$ $Rocatec^{TM}$ Plus system group. Total 50 metal specimens were veneered with Sinfony indirect composite resin system. Specimens were tested for shear bond strength on an Instron universal testing machine and fracture mode of fractured specimens were analyzed by SEM and EDS. 1. 0.2 mm retention crystals were most effective in improving the resin-metal shear bond strength (p<0.05). 2. Sandblasting by $250{\mu}m$ aluminium oxide were more effective than sandblasting by $50{\mu}m$ aluminium oxide in improving the resin-metal shear bond strength(p<0.05). 3. Fracture mode of resin-metal fractured surface were cohesive failure mode in 0.2mm retention crystal, mixed failure mode in sandblasted specimens, etched specimens and the specimens sandblasted with $110{\mu}m$ $Rocatec^{TM}$ Plus system.

• The Journal of Korean Academy of Prosthodontics
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• v.35 no.2
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• pp.385-399
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• 1997

The purpose of this experiment was to determine the effects of etching with a Nd : YAG Laser on dentin, or porcelain surface on the bond strength with composite resin. The dentin specimens were devided into the following 4 groups. D1 : No treatment D2 : Etched with 10% phosphoric acid D3 : Laser etchded with 1W, 20PPs D4 : Laser etched with 2W, 20PPS The procelain specimens were devided into the following 4 groups. P1 : diamond roughened P2 : etched with HF acid P3 : Laser etched with 2W, 20PPS P4 : Laser etched with 3W, 20PPS All specimens were veneered with resin. One half of the specimens were stored in $37^{\circ}C$ water for one day and the other half were thermocycled 1000 times at temperature of $5^{\circ}C\;to\;55^{\circ}C$ at 20 seconds intervals. After that, the bonding strength of composite resin to the dentin and porcelain was measured. The surface treated state and fractured state were observed with SEM. The following results were obtained. 1. In the dentin specimens, the bond strength of group D2 was highter than that of groups D1 and D3 in the case of the specimens stored in $37^{\circ}C$ water for one day, there was a statistically significant difference between group D2 and D1, D3 (P<0.05). The bonding strength of the specimens that were thermocycled decreased in the following order : group D2,D4,D3 and then D1. 2. In the porcelain specimens, the bonding strength of groups P1,P2 were higher than that of group P3 in the case of the specimens stored in $37^{\circ}C$ water for one day (P<0.05). The bonding strength of the specimens of being thermocycled decreased in the following order : group P2,P1,P4 and then P3. 3. The groups of high bond strength had a rougher surface and a high level of microporosity with SEM findings.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.10 no.11
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• pp.3280-3286
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• 2009

In this paper, we designed and manufactured HD Switch Panel parts with micro-etched pattern. By using CAE analysis, we could predict weld-line positions and the amount of shrinkage during injection molding process. We measured the temperature distribution of the mold surface so that we could optimize the processing conditions such as mold temperature. In order to increase the transcription of micro-etched pattern, we applied the E-Mold technology and evaluated the effect of mold temperature on the surface quality. We concluded that the etched pattern was improved(more than 2.5$\to$1.5~1.7) through the measurement of surface gloss and the observation of both SEM and SPM images.

• Journal of Adhesion and Interface
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• v.12 no.1
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• pp.26-33
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• 2011

Phosphoric acid treatments were conducted to improve the adhesion property of polyketone film to rubber. The effects of phosphoric acid treatments were characterized by using a contact angle analyzer and a XPS (X-ray photoelectron spectroscopy). Morphological changes were observed by using a scanning electron microscope (SEM) and an atomic force microscope (AFM) as the acid treatment condition varied in concentration and time. The contact angle was found to significantly decrease with the acid treatment. According to the XPS, increased wettability was attributed to the inclusion of oxygen containing groups such as hydroxyl, carbonyl and carboxyl by acid treatments. Cracks and pores were produced on the polyketone film surface and thus, roughness increased with the acid treatment. Interfacial adhesion strength between polyketone and natural rubber was largely improved by acid treatment due to the increased wettability and roughness of the polyketone surface. However, the higher level of acid treatment caused the degradation of the polyketone surface, and thus, its interfacial adhesion consequently decreased.