• Title/Summary/Keyword: Surface enhanced Raman spectroscopy

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Fabrication of Optically Active Nanostructures for Nanoimprinting

  • Jang, Suk-Jin;Cho, Eun-Byurl;Park, Ji-Yun;Yeo, Jong-Souk
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2012년도 제43회 하계 정기 학술대회 초록집
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    • pp.393-393
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    • 2012
  • Optically active nanostructures such as subwavelength moth-eye antireflective structures or surface enhanced Raman spectroscopy (SERS) active structures have been demonstrated to provide the effective suppression of unwanted reflections as in subwavelength structure (SWS) or effective enhancement of selective signals as in SERS. While various nanopatterning techniques such as photolithography, electron-beam lithography, wafer level nanoimprinting lithography, and interference lithography can be employed to fabricate these nanostructures, roll-to-roll (R2R) nanoimprinting is gaining interests due to its low cost, continuous, and scalable process. R2R nanoimprinting requires a master to produce a stamp that can be wrapped around a quartz roller for repeated nanoimprinting process. Among many possibilities, two different types of mask can be employed to fabricate optically active nanostructures. One is self-assembled Au nanoparticles on Si substrate by depositing Au film with sputtering followed by annealing process. The other is monolayer silica particles dissolved in ethanol spread on the wafer by spin-coating method. The process is optimized by considering the density of Au and silica nano particles, depth and shape of the patterns. The depth of the pattern can be controlled with dry etch process using reactive ion etching (RIE) with the mixture of SF6 and CHF3. The resultant nanostructures are characterized for their reflectance using UV-Vis-NIR spectrophotometer (Agilent technology, Cary 5000) and for surface morphology using scanning electron microscope (SEM, JEOL JSM-7100F). Once optimized, these optically active nanostructures can be used to replicate with roll-to-roll process or soft lithography for various applications including displays, solar cells, and biosensors.

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PECVD에 의해 작성된 탄소계 박막의 전계전자방출특성에 대한 증착온도 의존성에 관한 연구 (Effect of deposition temperature on field emission property of carbon thin film grown by PECVD)

  • 류정탁;백양규;;이형주
    • 한국진공학회지
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    • 제12권1호
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    • pp.35-39
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    • 2003
  • 본 논문에서는 혼합가스 없이 메탄가스만을 사용하여 RF PECVD 방법으로 성장시킨 a-C 박막의 전계전자방출특성을 조사하였다. 또한 본 논문은 박막의 표면형태와 결정들의 결합구조가 어떻게 전계전자방출에 영향을 미치는가에 관하여 보고된다, a-C 박막의 전계전자방출특성은 증착온도에 크게 의존함이 확인되었다. 실온에서 성장된 카본박막의 문턱전압은 20 V/$\mu\textrm{m}$이었다. 그러나 증착온도가 $500^{\circ}C$로부터 $600^{\circ}C$로 증가함에 따라 문턱전압은 17 V/$\mu\textrm{m}$에서 10 V/$\mu\textrm{m}$으로 감소하였으며 $800^{\circ}C$에서는 문턱전압이 B V/$\mu\textrm{m}$로 크게 개선되었다. 박막의 표면형태, 구조적인 특징과 전계전자방출특성의 관계를 조사하기 위해서 라만 스펙트럼과 주사형전자현미경 (scanning electron microscopy : SEM)을 사용하였다. 박막의 물리적, 화학적, 특성은 증착온도에 매우 의존하며 이들 특성들은 전계전자방출특성에 큰 영향을 미친다는 사실을 발견했다.