• Title/Summary/Keyword: Sub-Pivel

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System Design and Camera Calibration of Slit Beam Projection for Maximum Measuring Accuracy (슬릿광 3차원 형상측정에서 측정분해능 최적화를 위한 시스템설계 및 카메라보정)

  • 박현구;김명철;김승우
    • Transactions of the Korean Society of Mechanical Engineers
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    • v.18 no.5
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    • pp.1182-1191
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    • 1994
  • This paper presents an enhanced method of slit beam projection intended for the rapid measurement of 3-dimensional surface profiles of dies and molds. Special emphasis is given to optimizing the design of optical system so that the measuring accuracy can be maximized by adopting two-plane camera calibration together with sub-pixel image processing techniques. Finally, several measurement examples are discussed to demonstrate that an actual measuring accuracy of $\pm$ 0.2 mm can be achieved over the measuring range of 500 mm{\times}300mm{\times}200mm$.