• Transactions on Semiconductor Engineering
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• v.2 no.4
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• pp.1-7
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• 2024

This paper presents a methodology for the design and verification of a high-precision comparator using an analytical approach. The primary objective is to meet the performance of comparator by performing an initial design based on parameters derived from theoretical equations, and then analytically verifying performance metrics such as offset through transient Monte Carlo simulations. The transistor size can be then optimized by considering the trade-offs between parameters to design a comparator that ultimately meets the performance requirements. In this methodology, the correlation between device size, threshold voltage mismatch, and input offset voltage is validated through transient Monte Carlo simulations, confirming analytical results. This analysis also verifies the reliability of comparator performance, demonstrating the validity of the design. This study presents an analytical design technique for comparator design and is expected to contribute to the evaluation of performance and reliability.