• The Journal of Korean Institute of Communications and Information Sciences
• /
• v.41 no.9
• /
• pp.1108-1119
• /
• 2016

This paper presents the spectral analysis and radiation pattern of low-frequency electromagnetic(EM) leakage signals according to the fundamental operations of smartphones. The EM leakage signals generated by the activation of four I/O sensor modules such as a touch-screen, a camera, a microphone and a speaker are captured by the commercial near-field magnetic probe with 1cm spatial resolution. The analysis results show that the leakage of the EM wave occurs strongly around the activated I/O sensor modules, AP(Application Processor) and memory modules. Also, the distinguishable frequency characteristic is shown in each spectrum of EM leakage signals.