• Title/Summary/Keyword: Small angle X-ray scattering

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Studies on Nanostructured Amorphous Carbon by X-ray Diffraction and Small Angle X-ray Scattering

  • Dasgupta, K.;Krishna, P.S.R.;Chitra, R.;Sathiyamoorth, D.
    • Carbon letters
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    • v.4 no.1
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    • pp.10-13
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    • 2003
  • The structural studies of amorphous isotropic carbon prepared from pyrolysis of phenol formaldehyde resin have been carried out using X-ray diffraction. X-ray diffraction from as prepared sample at $1000^{\circ}C$ and a sample treated at $1900^{\circ}C$ revealed that both are amorphous even though there are small differences in short range order. It is found that both are graphite like carbon (GLC) with predominantly $sp^2$ hybridization. Small angle X-ray scattering results show that as prepared sample mainly consists of thin two dimensional platelets of graphitic carbon whereas they grow in thickness to become three dimensional materials of nano dimensions.

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The Morphology, Structure and Melting Behaviour of Cold Crystallized Isotactic Polystyrene

  • Marega, Carla;Causin, Valerio;Marigo, Antonio
    • Macromolecular Research
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    • v.14 no.6
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    • pp.588-595
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    • 2006
  • The morphology, structure and melting behaviour of cold-crystallized isotactic polystyrene (iPS) were studied by differential scanning calorimetry (DSC), wide angle X-ray diffraction (WAXD) and small angle X-ray scattering (SAXS). The polymer was found to crystallize according to the dual-lamellar stack model. The two populations of lamellae, along with a melting-recrystallization phenomenon, determined the appearance of multiple melting peaks in DSC traces. The annealing peak was attributed to the relaxation of a rigid amorphous phase, rather than to the melting of crystalline material.

중성자 산란을 이용한 나노기공 측정

  • 최성민;이지환;조성민
    • Proceedings of the Korea Crystallographic Association Conference
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    • 2002.11a
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    • pp.51-51
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    • 2002
  • 나노기공물질은 특정 기반물질(matrix) 내부에 대략 나노미터크기의 기공을 함유하고 있는 물질이며 나노기공물질의 특성은 기반물질의 특성과 더불어 기공의 형태, 크기, 분포에 의해서 결정된다. 나노기공물질의 기공에 대한 정보를 측정하는 방법으로는 TEM, 흡착법, FE-SEM과 더불어 중성자 또는 X-ray 빔의 산란을 이용하는 소각중성자산란 (Small-Angle Neutron Scatering, SANS), 소각 X-ray 산란 (Small-Angle X-ray Scattering, SAXS), 중성자반사율측정 (Neutron Relfectimetry, NR), X-ray 반사율측정 (X-Ray Reflectometry, XRR) 등이 사용되고 있다. 본 발표는 대략 1 nm - 100 nm 영역의 bulk 구조와 층상구조를 측정할 수 있는 소각 중성자 산란과 중성자 반사율 측정기법을 이용한 나노기공 측정기술을 다룬다.

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Structure Analysis of Liquid Crystal Emulsions Using X-ray Scattering Analysis (X선 산란분석법을 이용한 액정에멀젼 구조분석)

  • Park, So Hyun;Kim, Su Ji;Noh, Min Joo;Lee, Jun Bae;Park, Soo Nam
    • Journal of the Society of Cosmetic Scientists of Korea
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    • v.42 no.3
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    • pp.297-302
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    • 2016
  • In this study, we prepared liquid crystal emulsions composed of $C_{12-20}$ alkyl glucoside, $C_{14-22}$ alcohol, and behenyl alcohol and performed structure analysis using various analytical equipment. First, as an important characteristic of liquid crystal emulsions, maltese cross patterns and multi-layer structure were observed by a polarized microscope and cryo-SEM. Also, formation of liquid crystal phase was confirmed by DSC and multi-layer lamellar structure having an interlayer spacing approximately $305{\AA}$ was confirmed by small angle x-ray scattering (SAXS). The alkyl chain arrangement formed orthorhombic structure of a lamellar structure of the liquid crystal emulsion was confirmed by wide angle x-ray scattering (WAXS). These results suggest that information on the various physical properties obtained through the research of liquid crystal emulsion structure is expected to be widely used in cosmetics development in the future.

Small-Angle X-ray Scattering Station 4C2 BL of Pohang Accelerator Laboratory for Advance in Korean Polymer Science

  • Yoon, Jin-Hwan;Kim, Kwang-Woo;Kim, Je-Han;Heo, Kyu-Young;Jin, Kyeong-Sik;Jin, Sang-Woo;Shin, Tae-Joo;Lee, Byeong-Du;Rho, Ye-Cheol;Ahn, Byung-Cheol;Ree, Moon-Hor
    • Macromolecular Research
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    • v.16 no.7
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    • pp.575-585
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    • 2008
  • There are two beamlines (BLs), 4C1 and 4C2, at the Pohang Accelerator Laboratory that are dedicated to small angle X-ray scattering (SAXS). The 4C1 BL was constructed in early 2000 and is open to public users, including both domestic and foreign researchers. In 2003, construction of the second SAXS BL, 4C2, was complete and commissioning and user support were started. The 4C2 BL uses the same bending magnet as its light source as the 4C1 BL. The 4C1 BL uses a synthetic double multilayer monochromator, whereas the 4C2 BL uses a Si(111) double crystal monochromator for both small angle and wide angle X-ray scattering. In the 4C2 BL, the collimating mirror is positioned behind the monochromator in order to enhance the beam flux and energy resolution. A toroidal focusing mirror is positioned in front of the monochromator to increase the beam flux and eliminate higher harmonics. The 4C2 BL also contains a digital cooled charge coupled detector, which has a wide dynamic range and good sensitivity to weak scattering, thereby making it suitable for a range of SAXS and wide angle X-ray scattering experiments. The general performance of the 4C2 BL was initially tested using standard samples and further confirmed by the experience of users during three years of operation. In addition, several grazing incidence X-ray scattering measurements were carried out at the 4C2 BL.

Small Angle X-ray Scattering Studies on Deformation Behavior of Rubber Toughened Polycarbonate (소각 X-선 산란을 이용한 고무입자로 강인화된 폴리카보네이트의 변형에 관한 연구)

  • Cho, Kilwon;Choi, Jaeseung;Yang, Jaeho;Kang, Byoung Il
    • Journal of Adhesion and Interface
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    • v.3 no.4
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    • pp.19-26
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    • 2002
  • In order to study the toughening mechanism of rubber modified polycarbonate, the sequence of development of micro-voids was investigated by real-time small angle X-ray scattering with Synchrotron radiation (SR-SAXS). The used test method was wedge test. The scattering intensity increases with increasing penetration depth of wedge, i.e. applied strain. The increase is due to the micro-void formation during deformation. This micro-void was uniformly developed in matrix and was different from large-void due to internal cavitation of rubber particle and/or debonding between rubber particle and polycarbonate matrix. The micro-void was developed at the critical strain and the radius of micro-void is around $600{\AA}$. Above the critical strain the size of micro-void remains almost constant with increasing applied strain. However, the population of micro-void increased with applied strain.

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Morphology Development in a Range of Nanometer to Micrometer in Sulfonated Poly(ethylene terephthalate) Ionomer

  • Lee, Chang-Hyung;Inoue, Takashi;Nah, Jae-Woon
    • Bulletin of the Korean Chemical Society
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    • v.23 no.4
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    • pp.580-586
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    • 2002
  • We investigated the effect of ionic component on crystalline morphology development during isothermal annealing in a sodium neutralized sulfonated poly(ethylene terephthalate) ionomer (Ion-PET) by time-resolved small-angle x-ray scattering (TR-SAX S) using synchrotron radiation. At early stage in Ion-PET, SAXS intensity at a low annealing temperature (Ta = 120 $^{\circ}C)$ decreased monotonously with scattering angle for a while. Then SAXS profile showed a peak and the peak position progressively moved to wider angles with isothermal annealing time. Finally, the peak intensity decreased, shifting the peak angle to wider angle. It is revealed that ionic aggregates (multiplets structure) of several nm, calculated by Debye-Bueche plot, are formed at early stage. They seem to accelerate the crystallization rate and make fine crystallites without spherulite formation (supported by optical microscopy observation). From decrease of peak intensity in SAXS,it is suggested that new lamellae are inserted between the preformed lamellae so that the concentration of ionic multiplets in amorphous region decreases to lower the electron density difference between lamellar crystal and amorphous region. In addition, analysis on the annealing at a high temperature (Ta = 210 $^{\circ}C)$ by optical microscopy, light scattering and transmission electron microscopy shows a formation of spherulite, no ionic aggregates, the retarded crystallization rate and a high level of lamellar orientation.