• IEIE Transactions on Smart Processing and Computing
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• 제6권3호
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• pp.220-227
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• 2017

Technology development is leading to the invention of more sophisticated electronics appliances that require long battery life. Therefore, saving power is a major concern in current-day scenarios. A notable source of power dissipation in sequential structures of integrated circuits is due to the continuous switching of high-frequency clock signals, which do not carry any information, and hence, their switching is eliminated by a method called clock gating. In this paper, we have incorporated a recent clock-gating style named Leakage Control Transistor (LECTOR)-based clock gating to drive a multi-stage sequential architectures, and we focus on its performance under three different process corners (fast-fast, slow-slow, typical-typical) through Monte Carlo simulation at 18 GHz clock with 90 nm technology. This gating is found to be one of the best gated approaches for multi-stage architectures in terms of total power consumption.