• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2009년도 하계학술대회 논문집
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• pp.137-137
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• 2009

Thin-film transistors (TFTs) that can be prepared at low temperatures have attracted much attention due to the great potential for flexible electronics. One of the mainstreams in this field is the use of organic semiconductors such as pentacene. But device performance of the organic TFTs is still limited by low field effect mobility or rapidly degraded after exposing to air in many cases. Another approach is amorphous oxide semiconductors. Amorphous oxide semiconductors (AOSs) have exactly attracted considerable attention because AOSs were fabricated at room temperature and used lots of application such as flexible display, electronic paper, large solar cells. Among the various AOSs, a-IGZO was considerable material because it has high mobility and uniform surface and good transparent. The high mobility is attributed to the result of the overlap of spherical s-orbital of the heavy pest-transition metal cations. This study is demonstrated the effect of thickness channel layer from 30nm to 200nm. when the thickness was increased, turn on voltage and subthreshold swing were decreased. a-IGZO TFTs have used a shadow mask to deposit channel and source/drain(S/D). a-IGZO were deposited on SiO2 wafer by rf magnetron sputtering. using power is 150W, working pressure is 3m Torr, and an O2/Ar(2/28 SCCM) atmosphere at room temperature. The electrodes were formed with Electron-beam evaporated Ti(30nm) and Au(70nm) structure. Finally, Al(150nm) as a gate metal was evaporated. TFT devices were heat treated in a furnace at $250^{\circ}C$ in nitrogen atmosphere for an hour. The electrical properties of the TFTs were measured using a probe-station to measure I-V characteristic. TFT whose thickness was 150nm exhibits a good subthreshold swing(S) of 0.72 V/decade and high on-off ratio of 1E+08. Field effect mobility, saturation effect mobility, and threshold voltage were evaluated 7.2, 5.8, 8V respectively.

• 한국진공학회지
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• 제17권1호
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• pp.67-72
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• 2008

본 연구에서는 염료감응 태양전지의 상대전극으로써 다중벽 탄소나노튜브를 사용하여 전기화학적 특성에 미치는 열처리 효과에 대해 연구하였다. 다중벽 탄소나노튜브는 실리콘 기판위에 철 촉매를 사용하여 열화학 기상증착법으로 합성하였다. 직경이 다른 다중벽 탄소나노튜브를 각각 성장하여 두 개의 샘플을 준비하였고 질소 분위기의 RTA(rapid thermal annealing) system에서 $900^{\circ}C$ 온도로 1분간 열처리 하였다. 다중벽 탄소나노튜브의 구조적, 전기적, 전기화학적 특성은 FE-SEM, Raman spectroscopy, 2-point probe station, electrochemical impedance spectroscopy (EIS)을 이용하여 측정하였다. 라만 스펙트럼 분석에서 열처리 한 다중벽 탄소나노튜브의 I(D)/I(G) ratio는 상당히 감소한 것을 확인하였으며, 다중벽 탄소나 노튜브 표면과 전해질과의 산화 환원 반응 특성에서는 열처리 전보다 열처리 후의 전해질과의 산화 환원 반응 특성이 향상된 것을 알 수 있었다. 표면에서의 반응 저항 또한 열처리 후의 다중벽 탄소나노튜브가 더 낮은 값을 나타내었다. 그 결과, 열처리 후의 다중벽 탄소나노튜브를 상대전극으로 사용하였을 때의 전기화학적 특성이 더 좋은 것을 확인하였다.

• 한국전기전자재료학회논문지
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• 제33권3호
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• pp.214-218
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• 2020

In this study, Mg_xZn_1-xO thin films, which can be applied not only to active layers of light-emitting devices (LEDs), such as UV-LEDs, but also to solar cells, high mobility field-effect transistors, and power semiconductor devices, are fabricated using the sol-gel method. ZnO and Mg_0.3Zn_0.7O solution synthesized by the sol-gel method and the thin film were grown by spin coating on a Si (100) substrate and sapphire substrate. The solutions are synthesized by dissolving precursor materials in 2-methoxyethanol (2-ME) solvent, and then monoethanolamine (MEA) was added to the mixed solution as a sol stabilizer. Zinc acetate dihydrate is used as a ZnO precursor, while Mg nitrate hexahydrate and Mg acetate tetrahydrate are used as an MgO precursor. Then, the optical and structural characteristics of the fabricated thin films are compared. The molar concentration of the Zn precursor in the solvent is fixed at 0.3 M, and the amount of the Mg precursor is 30% of Mg²⁺/Zn²⁺. The optical characteristics are measured using an UV-vis spectrophotometer, and the transmittance of each wavelength is measured. Structural characteristics are measured using X-ray diffraction (XRD) and transmission electron microscopy (TEM). Composition analyses are performed using energy dispersive X-ray spectroscopy (EDS). The Mg_0.3Zn_0.7O thin film was well formed at the ratio of the Mg precursor added regardless of the type of Mg precursor, and the c-axis of the thin film was decreased, while the band gap was increased to 3.56 eV.