• 제목/요약/키워드: Secondary gamma emission

검색결과 63건 처리시간 0.034초

Measurement of secondary electron emission coefficient(${\gamma}$) with oblique low energy ion and work function ${\phi}_{\omega}$ of theMgO thin film in AC-PDPs

  • Park, W.B.;Lim, J.Y.;Oh, J.S.;Jeong, H.S.;Jung, K.B.;Jeon, W.;Cho, G.S.
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2004년도 Asia Display / IMID 04
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    • pp.507-510
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    • 2004
  • Oblique ion-induced secondary electron emission coefficient(${\gamma}$) with low energy ..and work function ${\phi}_{\omega}$(${\theta}$ = 0 and ${\theta}$ = 20) of the MgO thin film in AC-PDPs has been measured by ${\gamma}$-FIB system. The MgO thin film has been deposited from sintered material under electron beam evaporation method. The energy of $He^+$ ions used has been ranged from 50eV to 150eV. Oblique ion beam has been chosen to be 10 degree, 20 degree and 30 degree. It is found that the higher secondary electron emission coefficient(${\gamma}$) has been achieved by the higher oblique ion beam up to inclination angle of 30 degree than the perpendicular incident ion beam.

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Influence of gas mixture ratio on the secondary electron emission coefficient ($\gamma$) fo MgO single crystals and MgO protective layer in AC PDP

  • Lim, Jae-Yong;Jung, J.M.;Choi, M.C.;Ahn, J.C.;Cho, T.S.;Kim, T.Y.;Kim, S.S.;Jung, M.W.;Choi, S.H.;Kim, S.B.;Ko, J.J.;Kim, D.I.;Lee, C.W.;Seo, Y.;Cho, G.S.;Kang, S.O.
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2000년도 춘계학술대회 논문집 디스플레이 광소자 분야
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    • pp.145-147
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    • 2000
  • The secondary electron emission coefficient y of MgO single crystal according to the gas mix-ture ratio of Xe, $N_2$ to Ne have been investigated by $\gamma$-focused ion beam system. It is found that the MgO single crystals of (111) crystallinity has the highest $\gamma$ for operating Ne(Xe) ions ranging from 50eV to 200eV throughout this experiment. And it is found that the $\gamma$ for gas mixtures are much smaller than pure Ne ions.

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Secondary Electron Emission Characteristics of Functional Layer in AC-PDP

  • Son, Chang-Gil;Han, Young-Gyu;Kim, Yong-Hee;Cho, Byeong-Seong;Hong, Young-Jun;Song, Ki-Baek;Bae, Young-Joo;Kim, In-Tae;Choi, Eun-Ha
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2009년도 9th International Meeting on Information Display
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    • pp.736-739
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    • 2009
  • We have studied that the secondary electron emission characteristics of functional layers which have different kinds of MgO sub-micrometer size powder in AC-PDP. We used cathodoluminescence(CL) and gamma focused ion beam (${\gamma}$-FIB) system for measurement of secondary electron emission characteristics. Also we made 6 inch test panel which applied functional layers for evaluation of discharge characteristics.

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Analysis for the secondary gamma-ray emission for glasses irradiated with various doses of fast neutron: Case study borate and silicate glasses

  • O.L. Tashlykov;V. Yu. Litovchenko;N.M. Aristov;K.A. Mahmoud
    • Nuclear Engineering and Technology
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    • 제55권7호
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    • pp.2366-2372
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    • 2023
  • Are borate and silicate glasses suitable for working as shieling materials against fast neutrons? To correctly answer the above question, some silicate, and borate-based glasses were fabricated and irradiated with various doses of fast neutrons varied between 1.73 and 12.10 MGy. The color and hardness of the fabricated glasses were affected by the fast neutron fluence where the transparent glasses turned colored as well as the hardness of the fabricated glasses was decreased. The gamma-ray spectrometric analysis shows a high activity concentration produced in the barium borate glasses due to the formation of radioisotopes Ba-131 and Ba-133 reaches to 5.92E+05 Bq and 4.25E+03 Bq, respectively for sample Cd-5 Batch 3. Additionally, the gamma-ray spectrometric analysis for the sodium silicate glasses shows low activity concentrations emitted from isotopes formed due to the activation of Y2O3-associated impurities. These activities are low compared to that emitted by barium borate-based glasses.

Influence of sintering temperature of MgO pellet on the electro-optical characteristics of alternating current plasma display panel (AC-PDP)

  • Hong, Sung-Hee;Son, Chang-Gil;Jung, Seok;Kim, Jung-Seok;Paik, Jong-Hoo;Choi, Eun-Ha
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2008년도 International Meeting on Information Display
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    • pp.400-403
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    • 2008
  • We have investigated the electro-optical characteristics of AC-PDP with different MgO protective layers, which have been deposited by electron beam evaporation from various sintered pellets with different temperatures. We have measured the secondary electron emission coefficient ($\gamma$) by using the Gamma Focused Ion Beam ($\gamma$-FIB) system, the static margin, and the address delay time. Also, we have investigated photoluminescence (PL) characteristics for understanding the energy levels of MgO pellets and protective layers.

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Measurement of Defect Energy Level in MgO Layer

  • Son, Chang-Gil;Song, K.B.;Jeoung, S.J.;Park, E.Y.;Kim, J.S.;Choi, E.H.;J, S.
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2007년도 7th International Meeting on Information Display 제7권2호
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    • pp.1380-1383
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    • 2007
  • The secondary electron emission coefficient (${\gamma}$) of the cathode is an important factor for improving the discharge characteristics of AC-PDP, because of its close relationship to discharge voltage. In this experiment, we have investigated the electronic structure of the energy band in the MgO layer responsible for the high ${\gamma}$. We used three kinds of MgO pellet that have another component, and each MgO layers have been deposited by electron beam evaporation method. The work-functions of MgO layer have been investigated from their ion-induced secondary electron emission coefficient (${\gamma}$), respectively, using various ions with different ionization energies in a ${\gamma}-FIB$ (Focused Ion Beam) system. We have compared work-function with ${\gamma}-FIB$ system current signal for measurement defect energy level in MgO layer. MgO-A in the three types has lowest work-function value (4.12eV) and there are two defect energy levels.

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Effect of Secondary Electron Emission of Phosphor on the Plasma Display Panel Discharge

  • Song, Su-Bin;Park, Pil-Yong;Lee, Han-Yong;Sea, Jeong-Hyun;Kang, Kyung-Doo
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2002년도 International Meeting on Information Display
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    • pp.594-597
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    • 2002
  • We studied the effect of secondary electron emission from the back plate of AC-PDP, on the ramp waveform driving of the system, using two-dimensional PDP cell discharge simulator. It is found that the secondary electron emission from back plate plays a significant role in getting a stable weak discharge during the ramping up of X-Y electrode voltage. This is because grounded address electrode acts as a cathode during the setup of surface charge, and the secondary electron emission from phosphor in the back plate must be large enough to accumulate surface charges on the dielectric layers without strong plasma discharge. We have concluded that the secondary electron emission coefficient(${\gamma}$) of phosphor, besides MgO, must be known to understand the characteristics of the PDP system. A few suggestions for improvement of the system is also made and tested.

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Influence of surface geometrical structures on the secondary electron emission coefficient $({\gamma})$ of MgO protective layer

  • Park, W.B.;Lim, J.Y.;Oh, J.S.;Jeong, H.S.;Jeong, J.C.;Kim, S.B.;Cho, I.R.;Cho, J.W.;Kang, S.O.;Choi, E.H.
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2003년도 International Meeting on Information Display
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    • pp.806-809
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    • 2003
  • Ion-induced secondary electron emission coefficient $({\gamma})$. of the patterned MgO thin film with geometrical structures has been measured by ${\gamma}$ - FIB(focused ion beam) system. The patterned MgO thin film with geometrical structures has been formed by the mask (mesh of ${\sim}$ $10{\mu}m^{2})$ under electron beam evaporation method. It is found that the higher ${\gamma}$. has been achieved by the patterned MgO thin film than the normal ones without patterning.

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Control of secondary electron emission coefficient with microstructural change of polycrystalline MgO films

  • Yu, Hak-Ki;Lee, Jong-Lam;Park, Eung-Chul;Kim, Jae-Sung;Ryu, Jae-Hwa
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2008년도 International Meeting on Information Display
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    • pp.1445-1447
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    • 2008
  • Micro crystal structure of polycrystalline MgO film is controlled by adjusting the energy of particles arrived at the substrate during deposition. The change of crystal structure affects on the total area of (200) surface where the oxygen vacancies are formed easily, resulting in the change of secondary electron emission (SEE) coefficient($\gamma$).

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Influence of vacuum annealing on the secondary electron emission coefficient(${\gamma}$) from a MgO protective layer

  • Jeoung, J.M.;Leem, J.Y.;Cho, T.S.;Choi, M.C.;Ahn, J.C.;Kim, J.G.;Kim, Y.G.;Cho, D.S.;Kim, S.S.;Kim, T.Y.;Choi, S.H.;Chong, M.W.;Ko, J.J.;Kim, D.I.;Lee, C.W.;Kang, S.O.;Cho, G.S.;Choi, E.H.
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2000년도 제1회 학술대회 논문집
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    • pp.113-114
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    • 2000
  • The secondary electron emission coefficient(${\gamma}$) of vacuum annealed MgO films has been investigated by ${\gamma}-focused$ ion beam(${\gamma}-FIB$) system. The vacuum annealed MgO films have been found to have higher ${\gamma}$ values from 0.053 up to 0.121 than those for as-deposited MgO films from 0.026 up to 0.062 for $Ne^+$ ion energies ranged from 50eV to 200eV. Also it is found that ${\gamma}$ for air hold of vacuum annealed MgO layers for 24-hours is similar to that for vacuum annealed MgO films without any air-hold.

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