• Title/Summary/Keyword: Scrubbing scheme

Search Result 6, Processing Time 0.02 seconds

An Optimal Scrubbing Scheme for Auto Error Detection & Correction Logic (자가 복구 오류 검출 및 정정 회로 적용을 고려한 최적 스크러빙 방안)

  • Ryu, Sang-Moon
    • Journal of Institute of Control, Robotics and Systems
    • /
    • v.17 no.11
    • /
    • pp.1101-1105
    • /
    • 2011
  • Radiation particles can introduce temporary errors in memory systems. To protect against these errors, so-called soft errors, error detection and correcting codes are used. In addition, scrubbing is applied which is a fundamental technique to avoid the accumulation of soft errors. This paper introduces an optimal scrubbing scheme, which is suitable for a system with auto error detection and correction logic. An auto error detection and correction logic can correct soft errors without CPU's writing operation. The proposed scrubbing scheme leads to maximum reliability by considering both allowable scrubbing load and the periodic accesses to memory by the tasks running in the system.

An Optimal Scrubbing Scheme for Protection of Memory Devices against Soft Errors (메모리 소자의 소프트 에러 극복을 위한 최적 스크러빙 방안)

  • Ryu, Sang-Moon
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
    • /
    • 2011.10a
    • /
    • pp.677-680
    • /
    • 2011
  • Error detection and correcting codes are typically used to protect against soft errors. In addition, scrubbing is applied which is a fundamental technique to avoid the accumulation of soft errors. This paper introduces an optimal scrubbing scheme, which is suitable for a system with auto error detection and correction logic. An auto error detection and correction logic can correct soft errors without CPU's writing operation. The proposed scrubbing scheme leads to maximum reliability by considering both allowable scrubbing load and the periodic accesses to memory by the tasks running in the system.

  • PDF

Memory Scrubbing for On-Board Computer of STSA T-2 (과학기술위성 2호 탑재컴퓨터의 메모리 세정 방안)

  • Ryu, Sang-Moon
    • Journal of Institute of Control, Robotics and Systems
    • /
    • v.13 no.6
    • /
    • pp.519-524
    • /
    • 2007
  • The OBC(on-board computer) of a satellite which plays a role of the controller for the satellite should be equipped with preventive measures against transient errors caused by SEU(single event upset). Since memory devices are pretty much susceptible to these transient errors, it is essential to protect memory devices against SFU. A common method exploits an error detection and correction code and additional memory devices, combined with periodic memory scrubbing. This paper proposes an effective memory scrubbing scheme for the OBC of STSAT-2. The memory system of the OBC is briefly mentioned and the reliability of the information stored in the memory system is analyzed. The result of the reliability analysis shows that there exist optimal scrubbing periods achieving the maximum reliability for allowed overall scrubbing overhead and they are dependent on the significance of the information stored. These optimal scrubbing periods from a reliability point of view are derived analytically.

하드웨어 메모리 스크러버 설계

  • Kim, Dae-Young;Cho, Chang-Burm;Kang, Seok-Ju;Chae, Tae-Byung
    • Aerospace Engineering and Technology
    • /
    • v.2 no.1
    • /
    • pp.73-79
    • /
    • 2003
  • Usual satellite design adopts hardware Error Detection and Correction (EDAC) circuitary for memory elements to endure proper operation in space radiation environment and periodic read-back(scrubbing) scheme to remove errors occurred and to prevent further accumulation of errors, in parallel, But lack of detail radiation test data upset rates of KOMPSAT-2 mass storage was estimated very worse compared to that of KOMPSAT-1, which was evaluated from very precise radiation test. Although upset rates were evaluated enough low to accommodate by KOMPSAT-2 Flight Software, hardware scrubbing scheme is studied to shorten scrubbing time as well. This paper describes hardware scrubbing architecture having minimum 1.88 minutes scrubbing interval over 1 Gbits memory.

  • PDF

Analysis of the Single Event Effect of the Science Technology Satellite-3 On-Board Computer under Proton Irradiation (과학기술위성 3호 온보드 컴퓨터의 양성자 빔에 의한 Single Event Effect 분석)

  • Kang, Dong-Soo;Oh, Dae-Soo;Ko, Dae-Ho;Baik, Jong-Chul;Kim, Hyung-Shin;Jhang, Kyoung-Son
    • Journal of the Korean Society for Aeronautical & Space Sciences
    • /
    • v.39 no.12
    • /
    • pp.1174-1180
    • /
    • 2011
  • Field Programmable Gate Array(FPGA)s are replacing traditional integrated circuits for space applications due to their lower development cost as well as reconfigurability. However, they are very sensitive to single event upset (SEU) caused by space radiation environment. In order to mitigate the SEU, on-board computer of STSAT-3 employed a triple modular redundancy(TMR) and scrubbing scheme. Experimental results showed that upset threshold energy was improved from 10.6 MeV to 20.3 MeV when the TMR and the scrubbing were applied to the on-board computer. Combining the experimental results with the orbit simulation results, calculated bit-flip rate of on-board computer is 1.23 bit-flips/day assuming in the worst case of STSAT-3 orbit.

Scrubbing Scheme for Advanced Computer Memories for Multibit Soft Errors (다중 비트 소프트 에러 대응 메모리 소자를 위한 스크러빙 방안)

  • Ryu, Sang-Moon
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
    • /
    • 2011.10a
    • /
    • pp.701-704
    • /
    • 2011
  • The reliability of a computer system largely depends on that of its memory systems, which are vulnerable to soft errors. Soft errors can be coped with a combination of an Error Detection & Correction circuit and scrubbing operation. Smaller geometries and lower voltage of advanced memories makes them more prone to suffer multibit soft errors. A memory structure against multibit soft errors and a suitable scrubbing scheme for it were proposed. This paper introduces a key issue for the scrubbing of the memories with protection against multibit soft errors and the result of the performance analysis from a reliability point of view.

  • PDF