• The KIPS Transactions:PartD
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• v.10D no.5
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• pp.837-844
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• 2003

The software reliability have to be improved as one major method to enhance the quality of developed software, and its defect is detected and modified through testing as a direct way to meet the purpose before releasing. Once its reliability grows up to the target and it is released to public. there nay be operational reliability problem. The operational software reliability trend nay be different depending on the condition whether it is universal or dedicated. And its reliability estimation is changed based on the condition if it follows uniform testing efforts or Weibull testing efforts. I study the operational reliability trend of dedicated software, applying two case testing efforts for the released item.

• Proceedings of the Korea Contents Association Conference
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• 2005.11a
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• pp.423-427
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• 2005

It might be difficult to reduce failure rate for most of the cases are not available for debugging during operational phase, hence, there are some literatures to study that the failure rate is uniform throughout the operational time. The failure rate reduces and the reliability grows with time regardless of debugging. As a result, the products reliability varies with the time duration of these products in point of customer view. It accumulates the products experience, studies the efact operational method, and then finds and takes action against the fault circumstances. I propose the simple model to represent this status in this paper.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.12 no.4
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• pp.737-743
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• 2008

I compare my parameter estimation methodoloay with existing method, considering both of testing effort and fault detecting rate simultaneously in software reliability modeling. Generally speaking, fault detection/removal mechanism depends on how apply previous fault detection/removal and testing effort of S/W. The fault removal efficiency makes large influence to the reliability growth, testing and removal cost in developing stage S/W. This is very useful measure during all the developing stages and much helpful for the developer to estimate debugging efficiency, and furthermore, to anticipate additional working amount.

• The KIPS Transactions:PartD
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• v.8D no.6
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• pp.835-842
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• 2001

We propose a software-reliability growth model incoporating the amount of testing effort expended during the software testing phase. The time-dependent behavior of testing effort expenditures is described by a Weibull curve. Assuming that the error detection rate to the amount of testing effort spent during the testing phase is proportional to the current error content, a software-reliability growth model is formulated by a nonhomogeneous Poisson process. Using this model the method of data analysis for software reliability measurement is developed. After defining a software reliability, we discuss the relations between testing time and reliability and between duration following failure fixing and reliability are studied in this paper. The release time making the testing cost to be minimum is determined through studying the cost for each condition. Also, the release time is determined depending on the conditions of the specified reliability. The optimum release time is determined by simultaneously studying optimum release time issue that determines both the cost related time and the specified reliability related time.

• Journal of Information Technology Application
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• v.3 no.3
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• pp.91-106
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• 2001

We propose a software-reliability growth model incoporating the amount of uniform and Weibull testing efforts during the software testing phase in this paper. The time-dependent behavior of testing effort is described by uniform and Weibull curves. Assuming that the error detection rate to the amount of testing effort spent during the testing phase is proportional to the current error content, the model is formulated by a nonhomogeneous Poisson process. Using this model the method the data analysis for software reliability measurement is developed. The optimum release time is determined by considering how the initial reliability R($\chi$ 0) would be. The conditions are ($R\chi$ 0)＞$R_{o}$ , $P_{o}$ ＞R($\chi$ 0)＞ $R_{o}$ $^{d}$ and R($\chi$ 0)＜$R_{o}$ $^{d}$ for uniform testing efforts. deal case is $P_{o}$ ＞($R\chi$ 0)＞ $R_{o}$ $^{d}$ Likewise, it is ($R\chi$ 0)$\geq$$R_{o}$ , $R_{o}$ ＞($R\chi$ 0)＞R(eqation omitted) and ($R\chi$ 0)＜R(eqation omitted)for Weibull testing efforts. Ideal case is $R_{o}$ ＞ R($\chi$ 0)＞ R(eqation omitted).