• Journal of Korean Society for Quality Management
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• v.33 no.1
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• pp.83-87
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• 2005

For the count response we normally consider Poisson regression model. However, the conventional fitting algorithm for Poisson regression model is not reliable at all when the response variable is measured with sizable contamination. In this study, we propose an alternative fitting algorithm that is resistant to outlying values in response and report a case study in semiconductor industry.