• Journal of the Institute of Electronics Engineers of Korea SC
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• v.45 no.2
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• pp.1-7
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• 2008

In this paper, we have designed a millimeter-wave passive imaging sensor that is able to use remote sensing and security applications. The brightness temperature distribution of a scene is measured with a antenna at an angular resolution of $3^{\circ}$. The sensor is controlled by a PC, achieving a fast performance by using a pan/tilter. The pan/tilter should be able to scan a 2-D image of the scene, with a linear raster scan pattern. The mechanical scans in azimuth and elevation whereby an image of $20{\times}20$ pixels is acquired within less than 400s. Raw images are immediately displayed and stored for postprocessing.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2005.06a
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• pp.1531-1534
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• 2005

Nano pattern is being utilized to produce micro optical components, sensors, and information storage devices. In this study, a study on nano pattern fabrication using raster-scan type Focused Ion Beam (FIB) milling is introduced. Because the intensity of ion beam has Gaussian distribution, the overlapping of the Gaussian beam results in a 3D pattern, and the shape of the pattern can be adjusted by variation of FIB milling parameters, such as overlap, ion dose, and dwell time. The Gaussian shape of single beam intensity has been investigated by experiment, and 3D nano patterns with pitch of 200nm generated by FIB is demonstrated.

• Journal of Biomedical Engineering Research
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• v.14 no.1
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• pp.9-16
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• 1993

For efficient storage and transmission of medical images, the requirement of image com pression is increasing. Because differences between reconstructed images and original images are related with errors In the diagnosis, lossless compression is generally preferred in mod- ical images. in Run Length Coding which is one of the lossless compression method, we have applied modified scanning direction based on the Hilbert curve, which is a kind of space fill ins curve. We have substituted the traditional raster scanning by Hilbert curve direction scanning. Using this method, we have studied enhancement of compression efficiency for medical images.

• Proceedings of the IEEK Conference
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• 2008.06a
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• pp.405-406
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• 2008

This paper presents a high performance 2D PE architecture for H.264 Motion Estimation(ME). While existing 2D PE architectures reuse the overlapped data of adjacent search windows scanned in 1 or 3-way, the new architecture scan adjacent windows and multiple paths instead of single raster and zigzag scanning of adjacent windows in 4 way(up,down,left,right). By reducing the redundant access factor by 1.4, the new 4-way search window improve the memory bandwidth by 70-58% compared with 1/3-way search window. With Altera Stratix-III implementation, the high performance 2D PE architecture deals with SD ($720{\times}480$) video of 2 reference frame, $48{\times}48$ search area and $16{\times}16$ macroblock by 30fps at 97.1MHz.

• Journal of Biomedical Engineering Research
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• v.17 no.2
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• pp.209-214
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• 1996

The display of biological signals in raster scan monitors often involves a multirate sampling operation which consists of decimation .and interpolation. All electroencephalouaphic (EEG) samples of 10 to 30 seconds (2, 500 to 7, 500 samples at 250[Hz] sampling frequency) must be displayed in the computer screen to keep the aspect ratio of the paper polygraph output. Since the current afrorclable display technology Plots at most 2, 000 Pixels Per row, sDme signal samples need to be discarde4 This Paper studies methods to perform this operation characterizing them from the signal processing viewpoint and compares the display quality among several decimation techniques. Experimental results show that a nonlinear operation such as the peak detection method could be preferable to the canonical linear filtering to reduce aliasing.

• Journal of the Korean Society of Surveying, Geodesy, Photogrammetry and Cartography
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• v.29 no.4
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• pp.359-365
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• 2011

This study aims at filtering ALS points into ground and non-ground effectively through labeling and window based algorithm by utilizing 2D adjacency based on scan line. Firstly, points adjacency is constructed through minimal search based on scan line. Connected component labeling algorithm is applied to classify raw ALS points into ground and non-ground by utilizing the adjacency structure. Then, some small objects are removed by morphology filtering, and isolated ground points are restored by IDW estimation. The experimental results shows that the method provides good filtering performance( about 97% accuracy) for diverse sites, and the overall processing takes less time than converting raw data into TIN or raster grid.

• The Bulletin of The Korean Astronomical Society
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• v.43 no.2
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• pp.46.1-46.1
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• 2018

The Fast Imaging Solar Spectrograph (FISS) on the Goode Solar Telescope (GST) at Big Bear Solar Observatory is the imaging Echelle spectrograph developed by the Solar Astronomy Group of Seoul National University and the Solar and Space Weather Group of Korea Astronomy and Space Science Institute. The instrument takes spectral data from a region on the Sun in two spectral bands simultaneously. The imaging is done by the organization of intensity data obtained from the fast raster scan of the slit over the field of view. Since the scan repeats many times, the whole set of data can be used to construct the movies of monochromatic intensity at arbitrary wavelengths within the spectral bands, and those of line-of-sight velocity inferred from different spectral lines. So far there are two standard observing configurations: one recording the $H{\alpha}$ line and the Ca II 8542 line simultaneously, and the other recording the Na I D2 line and Fe I 5435 line simultaneously. We have developed the procedures to produce the standard data for each observing configuration. The procedures include the spatial alignment, the correction of spectral shift of instrumental origin, and the lambdameter measurement of the line wavelength. The standard data include the movie of continuum intensity, the movies of intensity and velocity inferred from a chromospheric spectral line, the movies of intensity and velocity inferred from a photospheric line. The processed standard data will be freely available online (fiss.snu.ac.kr) to be used for research and public outreach. Moreover, the IDL procedures will be provided on request as well so that each researcher can adapt the programs for their own research.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.43 no.8 s.350
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• pp.1-5
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• 2006

At-wavelength inspection system of extreme Ultra-violet lithography was developed and the inspection results were compared with the optical mask inspection system by cross correlation experiments. In at-wavelength EUV mask inspection system, a raster scan of focused euv light is used to illuminate euv light to mask blank and specularly and non-specularly reflected euv light are detected by photo diode and microchannel plate. The cross correlation results between at-wavelength inspection tool and optical inspection tool shows strong correlation. Far-field scattering fringe pattern from programmed phase and opqque defect, which were detected by phosphor plate and CCD camera shows that distinct diffraction fringes were observed with fringe spacing dependent on the defect size.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2008.11a
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• pp.298-299
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• 2008

Images of deposited layers of organic light-emitting diodes were observed by scanning-electron microscope (SEM). We were able to see a clear cross-sectional view of deposited layers. The SEM is a type of electron microscope that images the sample surface by scanning it with a high-energy beam of electrons in a raster scan pattern. A thickness of deposited layer measured by thickness monitor is close to a real value measured by a-step surface profiler within 5%. We were able to see a formation of domains of size about 50-100nm from a surface morphology of Al, and pin holes of size about 50nm.

• JSTS:Journal of Semiconductor Technology and Science
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• v.13 no.2
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• pp.157-169
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• 2013

Scale Invariant Feature Transform (SIFT) generates image features widely used to match objects in different images. Previous work on hardware-based SIFT implementation requires excessive internal memory and hardware logic [1]. In this paper, a new hardware organization is proposed to implement SIFT with less memory and hardware cost than the previous work. To this end, a parallel Gaussian filter bank is adopted to eliminate the buffers that store intermediate results because parallel operations allow all intermediate results available at the same time. Furthermore, the processing order is changed from the raster-scan order to the block-by-block order so that the line buffer size storing the source image is also reduced. These techniques trade the reduction of memory size with a slight increase of the execution time and external memory bandwidth. As a result, the memory size is reduced by 94.4%. The proposed hardware for SIFT implementation includes the Descriptor generation block, which is omitted in the previous work [1]. The addition of the hardwired descriptor generation improves the computation speed by about 30 times when compared with the previous work.