• Polymer(Korea)
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• v.37 no.6
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• pp.744-752
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• 2013

The miscibility between poly(L-lactide) (PLLA) and poly(methyl methacrylate) (PMMA) was investigated using thermal analyses for the purpose of developing birefringence-free material at oriented state. The effect of methyl acrylate (MA) units as comonomer of PMMA on the miscibility was also studied. All the blends prepared in this study show composition-dependent single $T_g$'s between those of blend components and high transparency over the visible region, indicating the miscibility at molecular level and no discernible effect of MA units on it. No phase separation was observed at elevated temperature of $280^{\circ}C$, higher than the degradation of PLLA and PMMA. The interaction energy density in PLLA/PMMA blends with 17 mol% of MA was measured to be $-0.74J/cm^3$ from the equilibrium melting temperature depression based on the Hoffman-Weeks method. The blends show zero-${\Delta}$n behavior at a specific mixing ratio and the drawing ratio of 3 due to compensation of intrinsic orientation birefringence. Birefringence dispersion of PLLA/PMMA5 blends was also measured to examine the possibility for quarter-wave plates or polarizer protective films.

• Korean Journal of Optics and Photonics
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• v.14 no.3
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• pp.331-337
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• 2003

This paper represents 50 ㎓ narrow band pass filters for fiber optical communication fabricated by dual ion beam sputtering method. We have analyzed the characteristics of the TA$_2$ $O_{5}$ and $SiO_2$ single layers in order to optimize the process conditions for the 50 ㎓ narrow band pass filters, and controlled the film thickness uniformity to less than 0.1 nm deviation by dual peak spike filter pre-deposition. We designed and fabricated 50 ㎓ narrow band pass filters that consist of 216 layers including 4 cavities based on quarter wave optical thickness. Class substrates with high thermal expansion coefficients were used to reduce the film stress. Anti-reflection coating at the rear side of the substrate was also needed to reduce the optical thickness errors of the Optical Monitoring System caused by multiple beam interference between the front side and the rear side of substrate. The optical characteristics of this 50 ㎓ narrow band pass filters are insertion loss of 0.40 ㏈, pass band ripple of 0.20 ㏈, and pass bandwidth at -0.5 ㏈ of 0.20 nm. and isolation bandwidth at -25 ㏈ of 0.6 nm, which satisfy specifications of dense WDM system in fiber optical communications.tions.

• Korean Journal of Optics and Photonics
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• v.33 no.5
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• pp.201-209
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• 2022

The previously developed microspot spectroscopic ellipsometer (SE) is upgraded to a microspot SE compatible with the atomic force microscope (AFM). The focusing optical system of the previous microspot SE is optimized to incorporate an AFM head. In addition, the rotating compensator ellipsometer in polarizer-sample-compensator-analyzer configuration is adopted in order to minimize the negative effects caused by beam wobble. This research leads to the derivation of the expressions needed to get spectro-ellipsometric constants despite the fact that the employed rotating compensator is far from the ideal achromatic quarter-wave plate. The spot size of the developed microspot SE is less than 20 ㎛ while the AFM head is mounted. It operates in the wavelength range of 190-850 nm and has a measurement accuracy of δΔ ≤ 0.05° and δΨ ≤ 0.02°, respectively. Fast measurement of ≤3 s/sp is realized by precisely synchronizing the azimuthal angle of a rotating compensator with the spectrograph. The microspot SE integrated with an AFM is expected to be useful in characterizing the structure and optical properties of finely patterned samples.