• 제목/요약/키워드: Protecting layer

검색결과 132건 처리시간 0.029초

반응성 스퍼트링에 의한 MgO 유전체 보호층 형성에 관한 연구 (Preparation of MgO Protective layer by reactive magnetron Sputtering)

  • 하홍주;이우근;류재하;송용;조정수;박정후
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 1996년도 춘계학술대회 논문집
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    • pp.59-62
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    • 1996
  • Plasma displays (PDP) as a large area wall-hanging display device are rabidly developed with flat CRT, TPT LCD and etc. Especially, AC Plasma Display Panels(AC PDPs) have the inherent memory function which is effective for large area displays. The memory function in AC PDPs is caused by the accumulation of the electrical charge on the protecting layer formed on the dielectric layer. This MgO protective layer prevents the dielectric layer from sputtering by ion in discharge plasma and also has the additional important roll in lowering the firing voltage due to the large secondary electron emission coefficient). Until now, the MgO Protective layer is mainly formed by E-Beam evaporation. With increasing the panel size, this process is difficult to attain cost reduction, and are not suitable for large quantity of production. To the contrary, the methode of shuttering are easy to apply on mass production and to enlarge the size of the panel and shows the superior adhesion and uniformity of thin film. In this study, we have prepared MgO protective layer on AC PDP Cell by reactive magnetron sputtering and studied the effect of MgO layer on the surface discharge characteristics of ac PDP.

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Effect of Stress of MgO protecting layer on Discharge Characteristics of AC-PDP

  • Lee, Mi-Jung;Park, Sun-Young;Kim, Soo-Gil;Kim, Hyeong-Joon;Moon, Sung-Hwan;Kim, Jong-Kuk
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2004년도 Asia Display / IMID 04
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    • pp.540-543
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    • 2004
  • The stress of MgO thin film, which is used as a dielectric protective layer in AC-PDP, was measured by a laser scanning method. MgO films were deposited bye-beam evaporation on glass substrates with dielectrics layer on them in various deposition temperatures ranging from room temperature to 300 $^{\circ}C$. The compressive stress of MgO films was increased with increasing substrate temperature due to intrinsic stress accumulation, causing the densification of the films. Both firing voltage ($V_f$) and sustaining voltage ($V_s$) were reduced for the higher compressively stressed and densified films. In the other hand, another film properties such as preferred crystallographic orientation and surface roughness seemed not to influence the discharge characteristics of $V_f$ and $V_s$ significantly.

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Effect of various MgO E-beam evaporation sources on the characteristics of MgO protecting layer of AC-PDP

  • Park, Sun-Young;Lee, Mi-Jung;Kim, Soo-Gil;Kim, Hyeong-Joon;Moon, Sung-Hwan;Kim, Jong-Kuk
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2004년도 Asia Display / IMID 04
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    • pp.223-226
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    • 2004
  • MgO thin films were deposited bye-beam evaporation on $SiO_2$/Si wafers for the application of a protective layer in alternating current plasma display panels (AC-PDPs). Three different MgO sources, single crystal, melted polycrystal and sintered polycrystal, were used to find out the change of the properties of MgO protective layer depending on the source type. The properties of MgO thin films such as density, orientation and surface morphology were influenced by the source type. MgO thin films deposited with the melted polycrystal source had the highest density with the highest (100) preferred orientation, whereas the films deposited with the sintered polycrystal source had the lowest density with less preferred orientation. Such a result seems to be originated from the different mobility of adatoms on the surface of the deposited MgO thin films. Different microstructures of MgO thin films deposited even in the same deposition condition were observed depending on the MgO source type, resulting in different discharge characteristics.

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블루투스 환경에서 데이터 전송 시 보안 취약점 분석 및 개선 방안 관련 연구 (A study of analysis and improvement of security vulnerability in Bluetooth for data transfer)

  • 백종경;박재표
    • 한국산학기술학회논문지
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    • 제12권6호
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    • pp.2801-2806
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    • 2011
  • 블루투스를 통한 데이터 전송 시 Windows-Kernel-Driver의 Major Function Hooking 방법을 이용하면 PC의 키보드해킹과 같이 응용계층과 장치계층 사이에서 암호화되기 전 평문 데이터를 해킹할 수 있다. 본 논문에서는 블루투스 장치계층에서 데이터 전송 드라이버의 함수를 후킹하여 데이터를 암호화 전송하는 보호모듈을 제안하였다. 또한 제안한 자가보호기법을 적용하여 수정된 보호모듈은 해킹 툴에 의해서 데이터가 노출되지 않도록하였다. 제안한 보호모듈을 실제 구현하여 해킹에 의한 기밀성 보장여부를 확인하였다. 블루투스를 통하여 데이터통신을 하는 장치에 대해 보안을 보장하고, 여러 분야에 활용될 수 있을 것이다.

The Possible Minimum Chicken Nutrient Requirements for Protecting the Environment and Improving Cost Efficiency - Review -

  • Nahm, K.H.;Carlson, C.W.
    • Asian-Australasian Journal of Animal Sciences
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    • 제11권6호
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    • pp.755-768
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    • 1998
  • Nitrogen and phosphorus are major nutrients in animal feeds which partially remain in the environment as pollution. In addition, nitrogen and phosphorus along with energy are the main nutrients which determine the feed cost. Any decreases in the levels of these three nutrients can contribute to reducing the pollution problem as well as the cost of feed. The nutrient requirements for chickens in the work here reported should allow for the addition of mixed enzymes (phytases, proteases, glucanases, xylanases and others). Such minimal levels of crude protein in the research results which are here reported are 16% for 0-6 weeks of age, 13.5% for 7-12 weeks of age, 11.5% for 13-18 weeks of age for layer type chicks, 13% for layer, 18% for 0-3 weeks of age broiler and 16.5% for 4-7 weeks of age broiler. These research projects have been done without adding enzyme supplements to their experimental diets. The minimal values of phosphorus, shown as available phosphorus, are 0.25% for pullets, 0.09% for layers and 0.25% for broilers with the addition of phytase. The minimum energy requirement (metabolizable energy) for reducing the feed cost could be summarized as 2,750 kcal per kg feed for pullets, 2,800 kcal for layers and 2,700 kcal for broilers.

굽힘 압전 복합재료 작동기의 전기적 피로 거동 (Electric Fatigue Behavior of a Bending Piezoelectric Composite Actuator)

  • 우성충;구남서
    • 대한기계학회:학술대회논문집
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    • 대한기계학회 2008년도 추계학술대회A
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    • pp.362-367
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    • 2008
  • In the present work, we address electric fatigue behavior in bending piezoelectric actuators using an acoustic emission technique. Electric cyclic fatigue tests have been performed up to ten million cycles on the fabricated specimens. To confirm the fatigue damage onset and its pathway, the source location and distributions of the AE behavior in terms of count rate are analyzed over the fatigue range. It is concluded that electric cyclic loading leads to fatigue damages such as transgranular damages and intergranular cracking in the surface of the PZT ceramic layer, and intergranular cracking even develops into the PZT inner layer, thereby degrading the displacement performance. The electric-induced fatigue behavior seems to show not a continuous process but a step-by-step process because of the brittleness of PZT ceramic. Nevertheless, this fatigue damage and cracking do not cause the final failure of the bending piezoelectric actuator loaded up to 107 cycles. Investigations of the AE behavior and the linear AE source location reveal that the onset time of the fatigue damage varies considerably depending on the existence of a glass-epoxy protecting layer.

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전기적 피로하중을 받는 압전 작동기의 손상 메커니즘 (Damage Mechanisms of a Piezoelectric Actuator under Electric Fatigue Loading)

  • 우성충;구남서
    • 대한기계학회논문집A
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    • 제32권10호
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    • pp.856-865
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    • 2008
  • Damage mechanisms in bending piezoelectric actuators under electric fatigue loading are addressed in this work with the aid of an acoustic emission (AE) technique. Electric cyclic fatigue tests have been performed up to $10^7$ cycles on the fabricated bending piezoelectric actuators. An applied electric loading range is from -6 kV/cm to +6 kV/cm, which is below the coercive field strength of the PZT ceramic. To confirm the fatigue damage onset and its pathway, the source location and distributions of the AE behavior in terms of count rate and amplitude are analyzed over the fatigue range. It is concluded that electric cyclic loading leads to fatigue damages such as transgranular damages and intergranular cracking in the surface of the PZT ceramic layer, and intergranular cracking even develops into the PZ inner layer, thereby degrading the displacement performance. However, this fatigue damage and cracking do not cause the final failure of the bending piezoelectric actuator loaded up to $10^7$ cycles. Investigations of the AE behavior and the linear AE source location reveal that the onset time of the fatigue damage varies considerably depending on the existence of a glass-epoxy protecting layer.

OLED의 Barrier와 Encapsulation을 위한 원자층 증착 기술로 공정된 Al2O3/TiO2/Al2O3 다층 필름 (Characterization of ALD Processed Al2O3/TiO2/Al2O3 Multilayer Films for Encapsulation and Barrier of OLEDs)

  • 이사야;송윤석;김현;류상욱
    • 반도체디스플레이기술학회지
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    • 제16권1호
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    • pp.1-5
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    • 2017
  • Encapsulation of organic based devices is essential issue due to easy deterioration of organic material by water vapor. Thin layer of encapsulation film is required to preserve transparency yet protecting materials in it. Atomic layer deposition(ALD) is a promising solution because of its low temperature deposition and quality of the deposited film. $Al_2O_3$ or $Al_2O_3/TiO_2/Al_2O_3$ multilayer film has shown excellent environmental protection characteristics despite of thin thicknesses of the films. $Al_2O_3/TiO_2/Al_2O_3$ multilayer and 1.5 dyad layer of $Al_2O_3/polymer/Al_2O_3$ deposited by ALD was measured to have water vapor transmittance rate(WVTR) well below the detection limit($5.0{\times}10^{-5}g/m^2day$) of MOCON Aquatran 2 equipment.

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Current- voltage (I-V) Characteristics of the Molecular Electronic Devices using Various Organic Molecules

  • Koo, Ja-Ryong;Pyo, Sang-Woo;Kim, Jun-Ho;Kim, Jung-Soo;Gong, Doo-Won;Kim, Young-Kwan
    • Transactions on Electrical and Electronic Materials
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    • 제6권4호
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    • pp.154-158
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    • 2005
  • Organic molecules have many properties that make them attractive for electronic applications. We have been examining the progress of memory cell by using molecular-scale switch to give an example of the application using both nano scale components and Si-technology. In this study, molecular electronic devices were fabricated with amino style derivatives as redox-active component. This molecule is amphiphilic to allow monolayer formation by the Langmuir-Blodgett (LB) method and then this LB monolayer is inserted between two metal electrodes. According to the current-voltage (I-V) characteristics, it was found that the devices show remarkable hysteresis behavior and can be used as memory devices at ambient conditions, when aluminum oxide layer was existed on bottom electrode. The diode-like characteristics were measured only, when Pt layer was existed as bottom electrode. It was also found that this metal layer interacts with organic molecules and acts as a protecting layer, when thin Ti layer was inserted between the organic molecular layer and Al top electrode. These electrical properties of the devices may be applicable to active components for the memory and/or logic gates in the future.

RF 마그네트론 스퍼터링법을 이용하여 사파이어 기판과 ZnO 박막 위에 증착한 AlN 박막의 특성분석 (Growth of AlN Thin Film on Sapphire Substrates and ZnO Templates by RF-magnetron Sputtering)

  • 나현석
    • 한국진공학회지
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    • 제19권1호
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    • pp.58-65
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    • 2010
  • 먼저 RF 마그네트론 스퍼터링법을 이용하여 사파이어 기판 위에 AlN 박막을 증착하였다. AlN 공급원으로는 분말소결된 AlN 타겟을 적용하였다. 플라즈마 파워를 50에서 110 W로 증가시켰을 때 AlN 층의 두께는 선형적으로 증가하였다. 그러나 동작압력을 3에서 10 mTorr로 증가시켰을 때는 동작기체인 아르곤 양이 증가함에 따라 AlN 타겟으로부터 스퍼터링되어 나온 AlN 입자들의 평균자유행정의 거리가 감소하기 때문에 AlN 층의 두께는 약간 감소하였다. 질소 기체를 아르곤과 섞어주었을 때는 질소의 낮은 스퍼터링 효율에 의해서 AlN의 두께는 크게 감소하였다. 다음으로는 ZnO 형판 위에 AlN를 증착하였다. 그러나 700도 이상의 열처리에 의해서 AlN와 ZnO의 계면이 약간 분리되어 계면의 열적 안정성이 낮다는 결과를 얻었다. 게다가 스퍼터링으로 증착한 AlN 박막의 나쁜 결정성으로 인하여 700도에서 MOCVD의 반응기 기체인 수소와 암모니아에 의해서 AlN 밑의 ZnO 층이 분해되는 현상도 관찰하였다. 그리고 900도 이상에서는 ZnO가 완전히 분해되어 AlN 박막이 완전히 분리되었다.