• Title/Summary/Keyword: Programming Voltage

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Method for Safety-Decision to Apply International Standard Grounding Systems to Domestic Power System by Computer Simulation (국제 규격 접지시스템의 국내 적용을 위한 시뮬레이션 기반의 안전도 평가 방안)

  • Lee, Soon;Kim, Jung-Hoon;Park, Jung-Wook
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.57 no.3
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    • pp.344-353
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    • 2008
  • To apply the appropriate new grounding system to domestic power system, safety has to be guaranteed under the given circumstances. It is not possible to decide the safety of grounding systems by the experimental test because safety experiments directly relate to the human life and the installed electric machines. Therefore, the computer simulation program to decide the safety of grounding systems based on the IEC standard systems, has to be developed. This paper proposes the computer simulation based method to decide the safety of grounding system with the concepts of touch voltage, step voltage, human resistivity, and applied electric current according to the several conditions of human body located in the corresponding grounding systems. The proposed method is implemented by Matlab/Simulink and Visual C++ programming tools for its visualization.

Pattern Estimation of PQ Disturbances using Kalman Filter (Kalman 필터를 이용한 전력품질(PQ) 왜곡현상의 패턴추정)

  • Cho, Soo-Hwan;Kim, Jung-Wook;Han, Jong-Hoon
    • Proceedings of the KIEE Conference
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    • 2011.07a
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    • pp.286-287
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    • 2011
  • Kalman filter(KF) algorithm is a very useful application being used in many engineering fields. Through the KF, the next time step's estimation can be almost simultaneously calculated by the recursive least square optimization method with the present measurement data. It provides us with the superior detection performance of power quality events. This paper deals with the concrete programming example of KF to detect various kinds of PQ disturbances, such as voltage sag, swell, harmonics, voltage fluctuation and Frequency variation.

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A Study on SOA Driver with Capability to Control Current and Temperature Transient Response (온도 및 전류의 과도응답 제어가 가능한 SOA Driver에 관한 연구)

  • Eom, Jinseob
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.28 no.2
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    • pp.1-8
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    • 2014
  • In this paper, SOA Current and Temperature Driver which consisted of LabVIEW programming part capable of current and temperature transient response pattern design, DAQ module for analog voltage in&out, and voltage to current converting chips has realized. The output current(possible to 3A) from the Driver to SOA was clearly constant without ripple and also showed no variance until 1mA unit for a long time operation. The temperature of TEC took several seconds to reach a set temperature, and were maintained stably within ${\pm}^0.1{\circ}C$ for several hours. The proposed Driver can replace the previous high cost SOA Drivers for wavelength swept lasers fully and provides the convenience of transient response design capability for current and temperature.

A Study on SOA Dimming Driver with Current Pattern Design Capability (전류 패턴의 설계가 가능한 SOA Dimming Driver에 관한 연구)

  • Lee, Juchan;Eom, Jinseob
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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    • v.27 no.2
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    • pp.22-28
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    • 2013
  • In this paper, the low cost SOA Dimming Driver which consisted of LabVIEW programming part capable of current pattern design, DAQ module for analog voltage output, and voltage to current converter has realized. The output current(possible to 3A) from the Driver was clearly constant without ripple and also showed no variance until 1mA unit for a long time operation. The proposed low cost Driver can replace the previous high cost SOA Drivers for wavelength swept lasers fully and provide the convenience and safety of auto-supplying a designed current pattern.

Back bias effects in the programming using two-step pulse injection (2 단계 펄스 주입을 이용한 프로그램 방법에서 백바이어스 효과)

  • An, Ho-Myoung;Zhang, Yong-Jie;Kim, Hee-Dong;Seo, Yu-Jeong;Kim, Tae- Geun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.258-258
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    • 2010
  • In this work, back bias effects in the program of the silicon-oxide-nitride-oxide-silicon (SONOS) cell using two-step pulse sequence, are investigated. Two-step pulse sequence is composed of the forward biases for collecting the electrons at the substrate terminal and back bias for injecting the hot electrons into the nitride layer. With an aid of the back bias for electron injection, we obtain a program time as short as 600 ns and an ultra low-voltage operation with a substrate voltage of -3 V.

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Design of Charge Pump Circuit with VCO (VCO를 이용한 차지펌프 설계)

  • Chai, Yong-Yoong
    • The Journal of the Korea institute of electronic communication sciences
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    • v.6 no.1
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    • pp.118-122
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    • 2011
  • For programming such as writing or erasing of the flash memory, two different kinds of high voltage are required, and the charge pump circuit has been used for this. The charge pump circuit proposed in this paper uses the VCO to adjust the clock frequency in order to match the reference voltage approved from the outside and the charge pump's output. Accordingly, I suggest a circuit that can produce a predictable output, regardless of not only an error by fabrication but also MOSFET's body effect generated in each part of the charge pump.

Total Transfer Capability Based on Optimal Power Flow (최적조류계산을 기초로한 총송전용량 결정)

  • Kim, Kyu-Ho;Song, Kyung-Bin;Rhee, Sang-Bong;Lee, Sang-Keun
    • Proceedings of the KIEE Conference
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    • 2008.07a
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    • pp.570-571
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    • 2008
  • This paper presents a method for the determination of total transfer capability in interconnected power systems, which is based on sequential quadratic programming (SQP). The objective function is the maximization of the interconnected line flow. To calculate TTC the control variables are the active power of the generating units, the voltage magnitude of the generator, transformer tap settings and SVC setting. The state variables are the bus voltage magnitude, the reactive power of the generating unit, line flows and the tie line flow. The method proposed is applied to the modified IEEE 14 buses model system.

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Investigation on the Memory Traps in the Scaled MONOS Nonvolatile Semoconductor Memory Devices (Scaled MONOS 비휘발성 반도체 기억소자의 기억트랩 조사)

  • 이상은;김선주;이상배;서광열
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1994.11a
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    • pp.46-49
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    • 1994
  • In this paper we investigate the characteristics of switching and memory traps in sealed MONOS nonvolatile memory devices with different nitride thicknesses. We have demonttrated flatband voltage shift of 1V with 5V programming voltage. By fitting the experimental observations with theoretical calculations, trap density and capture cross section of memory trap at the nitride-blocking oxide interface are estimated to be 1.0${\times}$10$\^$13/ cm$\^$-2/ and 8.0${\times}$10$\^$14/ cm$\^$-2/

A Word Line Ramping Technique to Suppress the Program Disturbance of NAND Flash Memory

  • Lee, Jin-Wook;Lee, Yeong-Taek;Taehee Cho;Lee, Seungjae;Kim, Dong-Hwan;Wook-Ghee, Hahn;Lim, Young-Ho;Suh, Kang-Deog
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.1 no.2
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    • pp.125-131
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    • 2001
  • When the program voltage is applied to a word line, a part of the boosted channel charge in inhibited bit lines is lost due to the coupling between the string select line (SSL) and the adjacent word line. This phenomenon causes the program disturbance in the cells connected to the inhibited bit lines. This program disturbance becomes more serious, as the word line pitch is decreased. To reduce the word line coupling, the rising edge of the word-line voltage waveform was changed from a pulse step into a ramp waveform with a controlled slope. The word-line ramping circuit was composed of a timer, a decoder, a 8 b D/A converter, a comparator, and a high voltage switch pump (HVSP). The ramping voltage was generated by using a stepping waveform. The rising time and the stepping number of the word-line voltage for programming were set to $\mutextrm{m}-$ and 8, respectively,. The ramping circuit was used in a 512Mb NAND flash memory fabricated with a $0.15-\mutextrm{m}$ CMOS technology, reducing the SSL coupling voltage from 1.4V into a value below 0.4V.

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LabVIEW Based Laboratory Typed Test Setup for the Determination of Induction Motor Performance Characteristics

  • Calis, Hakan;Caki, Eyup
    • Journal of Electrical Engineering and Technology
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    • v.9 no.6
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    • pp.1928-1934
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    • 2014
  • Induction motors are widely used due to their rugged, robust and easy to care features. Since they are heavily used in industry, testing of three phase induction motors have play a vital role. In order to determine motor equivalent circuit parameters, efficiency of motor, squirrel caged laboratory sized an induction motor test setup is prepared. It is suitable for the induction motor with the frame size of 100 and 112. A virtual Instrumentation typed engineering workbench (called as LabVIEW) software packet, is utilized as a graphical user interface program. Motor input power is measured by measuring the input voltage, current and power factor with the help of hall effect typed voltage and current transformers. Also, the output power is measured by measuring the speed and torque with the help of an encoder and torque sensor. All outputs of the voltage and current transformer, encoder and temperature, torque sensors are given to the Data Acquisition Card (DAQ) which acquires the data for processing and then the equivalent circuit parameters, efficiency, performance and loading characteristics are found out, using LabVIEW based user interface. It is suggested to use this test rig for the quality control of produced motors in industry, and an educational experiment setup in the school laboratories.