• 한국소음진동공학회:학술대회논문집
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• 한국소음진동공학회 2004년도 춘계학술대회논문집
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• pp.73-76
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• 2004

Tapping mode atomic force microscopy (TM-AFM) utilizes the dynamic response of a resonating probe tip as it approaches and retracts from a sample to measure the topography and material properties of a nanostructure. We present recent results based on numerical techniques that yield new perspectives and insight into AFM. It is compared that the dynamic models including van der Waals and Derjaguin-Muller-Toporov(DMT) or Johnson-Kendall-Roberts(JKR) contact forces demonstrates that periodic solutions can be represented with respect to the approach distance and excitation frequency.

• 대한기계학회:학술대회논문집
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• 대한기계학회 2003년도 추계학술대회
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• pp.1560-1565
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• 2003

Tapping mode atomic force microscopy (TM-AFM) utilizes the dynamic response of a resonating probe tip as it approaches and retracts from a sample to measure the topography and material properties of a nanostructure. We present recent results based on nonlinear dynamical systems theory, computational continuation techniques and detailed experiments that yield new perspectives and insight into AFM. A dynamic model including van der Waals and Derjaguin-Muller-Toporov (DMT) contact forces demonstrates that periodic solutions can be represented with respect to the approach distance and excitation frequency. Turning points on the surface lead to hysteretic amplitude jumps as the tip nears/retracts from the sample. Experiments are performed using a tapping mode tip on a graphite sample to verify the predictions.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2002년도 추계학술대회 논문집
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• pp.975-979
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• 2002

This paper studies the indirect parameters when the new and worn end mill working in the machining center. The parameter output methods are cutting force, current values and AE signals. In the result, when the worn end mill operating, cutting forces increase the 14.71〔N〕, current values increase the 2.917〔A〕 and 1.168〔A〕 according to the spindle mote. and feed motor, and AE signals increase the 0.588$\times$10$^{-5}$ 〔A〕. We can use these parameters in the detection of end mill wear.

• 천문학회보
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• 제36권2호
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• pp.74.2-74.2
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• 2011

We probe the tidal perturbation parameter f of Virgo cluster galaxies. The goal is to measure the strength of tidal fields around individual galaxies to get better understanding gravitational processes that can affect galaxy evolution in the cluster environment. The f-value is defined as a logarithmic ratio between the net internal gravitational force within a galaxy and the external tidal force exerted by a neighboring galaxy. Hence, it provides one way to quantify the tidal field strength of galaxies, in particular, due to galaxy neighbors. In this study, we determine f-values of the VIVA galaxies, samples of the VLA Imaging study of Virgo galaxies in Atomic gas, using the Extended Virgo Cluster Catalog (EVCC) which is the most complete Virgo cluster catalog to date. With diagnostics based on the HI gas and R-band morphologies, we discuss the impact of the tidal fields on the evolution of the VIVA sample. Also, we compare the tidal field strength to the intra cluster medium (ICM) pressure for each sample galaxy to pin down environmental processes at work.

• Bulletin of the Korean Chemical Society
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• 제28권1호
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• pp.81-84
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• 2007

Ab initio periodic Hartree-Fock calculations with the full potential and minimum basis set are applied to interpretation of scanning tunneling microscope (STM) and atomic force microscope (AFM) images on 1TVTe2. Our results show that the simulated STM image shows asymmetry while the simulated AFM image shows the circular electron densities at the bright spots without asymmetry of electron density to agree with the experimental AFM image. The bright spots of both the STM and AFM images of VTe2 are associated with the surface Te atoms, while the patterns of bright spots of STM and AFM images are different.

• 한국윤활학회:학술대회논문집
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• 한국윤활학회 2000년도 제32회 추계학술대회 정기총회
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• pp.341-346
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• 2000

The effect of OTS(octadecyltrichlorosilane) SAM(self-assembled monolayer) on the micro-adhesion has been studied. OTS SAM was formed on the Si(100) surface and SPM (scanning probe microscope) tips with different radius of curvature were fabricated by a series of masking and etching processes. Pull-off forces of different tips on Si and OTS SAM surfaces were measured by SPM in different relative humidities. The surface of OTS SAM was changed to hydrophobic surface and the micro-adhesion force of OTS SAM was lower than that of pure Si. As the tip radius of curvature and the relative humidity increased. the micro-adhesion force increased. Based on the test results. the main parameter affected to the micro-adhesion was absorbed humidity on the surface.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2013년도 제45회 하계 정기학술대회 초록집
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• pp.98.2-98.2
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• 2013

Electrochemical phenomena underpin a broad spectrum of energy, chemical, and information technologies such as resistive memories and secondary batteries. The optimization of functionalities in these devices requires understanding electrochemical mechanisms on the nanoscale. Even though the nanoscale electrochemical phenomena have been studied by electron microscopies, these methods are limited for analyzing dynamic electrochemical behavior and there is still lack of information on the nanoscale electrochemical mechanisms. The alternative way can be an atomic force microscopy (AFM) because AFM allows nanoscale measurements and, furthermore, electrochemical reaction can be controlled by an application of electric field through AFM tip. Here, I will summarize recent studies to probe nanoscale electrochemical reaction in battery applications by AFM. In particular, we have recently developed electromechanical based AFM techniques for exploring reversible and irreversible electrochemical phenomena on the nanoscale. The present work suggests new strategies to explore fundamental electrochemical mechanisms using the AFM approach and eventually will provide a powerful paradigm for probing spatially resolved electrochemical information for energy applications.

• 한국표면공학회지
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• 제31권5호
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• pp.261-265
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• 1998

We investigated compositional separation of Co-23%Cr magnetic alloy thin films with varying film thicknesses. Saturation magnetization and magnetic microstructures were investigated using vibrating sample magnetometer (VSM) and scanning probe microscope (SPM), respectively. Saturation magnetization was as 700 emu/cc for films below 50 nm-thick, and changed to 430 emu/cc for the ones above 2000 nm-thick. This may be due to increment of molar volume of Cr-enriched phase as film thickness increases. The surface grain size in AFM (atomic force microscope) measurement becomes larger as film thickness increases. The MFM (magnetic force microscope) reveals that magnetic microstructure is changed from the fine spherical domains to the maze type domains as film thickness increases. We conclude that employing thickness of Co-22%Cr films below 50 nm is favorable for high density recording in order to enhance perpendicular saturation magnetization and SNR (signal to noise ratio).

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2004년도 하계학술대회 논문집 Vol.5 No.2
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• pp.1042-1045
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• 2004

ITO thin films ($\sim150nm$) are deposited on glass substrates by different deposition condition. The sheet resistance of ITO thin films measured by using a four probe station. The microstructure of these films is determined using a X-ray diffractometer (XRD) and a scanning electron microscope (SEM) and a atomic force microscope (AEM). The sheet resistance of ITO thin films compared $s_11$ values by using a near field scanning microwave microscope.

• 비파괴검사학회지
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• 제21권6호
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• pp.650-657
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• 2001

본 논문에서는 핵연료 피복재 튜브를 검사하기 위한 차폐된 관통형 원격장와전류 탐촉자의 설계과정을 설명하고, 이 탐촉자에 의한 결함신호의 특성을 조사하였다. 먼저, 자기 에너지가 튜브 내부로 관통될 수 있도록 여자코일 외부를 전기적으로 절연된 얇은 철 박판을 적층시켜 차폐시켰다. 그리고 유한요소 해석을 통하여 차폐의 효과와 탐상 주파수를 연구하였으며, 센서코일의 위치를 결정하였다. 그러나 이렇게 설계된 탐촉자를 사용하여 예측된 결함신호는 센서코일이 결함을 지날 때의 결함지시가 명확하지 않았으며, 여자코일이 결함을 지날 때의 결함지시도 차폐체로부터의 영향이 나타나는 등 여자코일로부터 자속이 직접적으로 센서코일에 영향을 미친다는 사실을 알게 되었다. 따라서 센서코일도 여자코일과 같은 형태로 차폐시켰는데 이 차폐의 효과는 놀라울 정도로 결함신호의 특성을 향상시켰다. 최종적으로 설계된 탐촉자를 사용하여 수치 모델링을 수행한 결과는 관내삽입 원격장와전류 탐촉자를 사용하였을 때의 신호와 매우 흡사한 신호특성을 보였다. 즉, 위상신호는 내부결함과 외부결함에 대하여 거의 동일한 민감도를 보였으며, 위상신호의 세기와 결함의 깊이 사이에 선형적인 관계가 있음이 관찰되었다.