• Journal of the Korean Vacuum Society
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• v.6 no.2
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• pp.109-113
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• 1997

PR spectra of MBE grown AlGaAs/GaAs MQW have been measured at room temperature using the He-Ne laser and the Ar laser as the pump source. We have observed various subband transition peaks and PR spectra were fitted to standard analytic line shape. Above that results, obtained us transition energy from n=1 conduction band to heavy hole(C1-H1) and to light hole(C1-L1) subband. Photoluminescence(PL) at room temperature showed main peak with a shoulder. Good agreement between PL and PR measured n=1 intersubband transition energies was confirmed that PL main peak with a shoulder is associated with the C1-H1, C1-L1 transition. Additionally, we have calculated the C1-H1 and C1-L1 intersubband energy within envelope function approximation(EFA).

• Electrical & Electronic Materials
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• v.8 no.4
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• pp.418-425
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• 1995

The surface of GaAs was treated by using the 0.1M solution of N $a_{2}$S.9 $H_{2}$O. The passivation of the surface in this sample was investigated by the photoreflectance(PR) experiment. The surface electric field( $E_{s}$) and built-in voltage( $V_{bi}$ ) discussed from Franz-Keldysh oscillation of PR signals. The density of surface states and Fermi level of GaAs treated with N $a_{2}$S.9 $H_{2}$O for 40min were determined 1.61*10$^{12}$ c $m^{-2}$ and 0.73eV. These values were about 15 and 10% smaller than those in untreated sample.e.

• Journal of the Korean Vacuum Society
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• v.5 no.2
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• pp.127-132
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• 1996

We measured photoreflectance spectrum characteristics of InGaAs grown by MBE method on semi-insulating GaAs. The PR signal splitting of substate and epilayer was observed. The band gap energy was about 1.40 eV. It make to 8 meV difference when it is fitted by Pan's equation. The reason is stress on the interface, which is due to lattice mismatch between epilayer and substate . We became to know that reason influence crystalline on growing sample. In InGaAs epilayer, temperature dependency is low. The efficiency of photo absorption is high and activate over 200K. In this case when it is annealed at $400^{\circ}C$ below growing temperature, PR signal splitting is remarkable and crystalline is inhanced.

• Electrical & Electronic Materials
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• v.7 no.6
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• pp.490-495
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• 1994

We investigated photoreflectance of semi-insulating GaAs with respect to modulation sources, that is, modulation beam intensity, modulation frequency, temperature, and thickness of sample. PR spectra by each modulation source turned out to be signals of low electric field third differential, and band gap values of sample were fitted by least square root method for Aspnes' theoretical equation.

• Journal of the Korean Vacuum Society
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• v.16 no.2
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• pp.141-144
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• 2007

We investigated variation of the photoreflectance(PR) signals for n-GaAs furnace and laser annealed. The samples were annealed by using ArF excimer laser(5 min, $30{\sim}50\;W$) and furnace(5 min $400{\sim}700^{\circ}C$). The PR signals(top point) measured from the ArF excimer laser annealed sample showed 1.42 eV and furnace annealed sample showed 1.43 eV. This result is ArF excimer laser annealed sample was uniform annealed surface and inter state.

• Proceedings of the Korean Vacuum Society Conference
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• 2012.02a
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• pp.429-429
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• 2012

본 연구에서는 분자선 박막 성장법(MBE)으로 성장된 GaAs single junction solar cell의 광학적 특성 변화를 photoreflectance (PR)을 이용하여 연구하였다. 본 연구에 사용된 태양전지 구조는 n+-GaAs (100)기판 위에 n+-GaAs buffer를 200 nm 성장 후 그 위에 i-GaAs 250 nm와 p+-GaAs 200 nm 성장 하였다. 상온에서 PR 측정 결과, 변조빔 세기가 증가할수록 Franz-Keldysh oscillation (FKO)의 주파수가 증가하는 현상이 관측되었다. 이는 변조빔의 세기가 강해질수록 광케리어수의 증가로 인한 스크리닝 효과에 기인한 것으로 사료된다. 아울러 Fast Fourier transform (FFT) 결과, 변조빔의 세기가 약할 때는 세 개의 주된 피크가 나타났으며, 이러한 현상은 GaAs에서 가전자대의 heavy hole (HH)과 light hole (LH)의 전이로 인해 나타나는 FKO 신호가 중첩되어 HH과 LH 피크가 HH과 HH-,LH과 LH-로 나뉘어진 것으로 사료된다. 여기광의 세기가 $1.40mW/cm^2$ 이상일 때는 주된 세 개 피크 이외에 부가적인 피크가 상대적으로 고 주파수 영역에서 관측되었다. 이러한 고주파수 영역에서의 나타나는 FKO 주파수는 시료의 내부전기장이 여기광의 세기가 증가할수록 감소하는 결과로 사료된다.

• Electrical & Electronic Materials
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• v.9 no.4
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• pp.372-378
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• 1996

The phtoreflectance(PR) spectra of B ion implanted semi-insulating(SI) GaAs were studied. Ion implantation was performed by 150keV implantation energy and 1*10/aup 12/-10$^{15}$ ions/c $m^{2}$ doses. Electronic band structure was damaged by ion implantation with above 1*10$^{13}$ ions/c $m^{2}$ dose. When samples were annealed, " peak was observed at 30-40meV below band gap( $E_{g}$). It should be noted that this energy is close to the ionization energies of S $i_{As}$ , and GeAs in G $a_{As}$ which are also found as impurities in LEC GaAs, it is therefore possible that this feature is related to S $i_{As}$ , or G $e_{As}$ and B ions by implanted defect associated with them. From PR spectra of etched samples which is as-implanted by 1*10$^{14}$ and 1*10$^{15}$ ions/c $m^{2}$ dose, the depth of destroyed electronic band structure was from surface to 0.2.mu.m below surface.nic band structure was from surface to 0.2.mu.m below surface.

• Electrical & Electronic Materials
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• v.10 no.6
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• pp.555-561
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• 1997

The passivation of n-GaAs(100) surface has investigated by photoreflectance(PR). The surface of the sample was treated with the 0.001 N solution Se/NH$_4$OH. After the surface treatment, the samples were annealed between 400 to $700^{\circ}C$ in a $N_2$atmosphere for 10 min. The intensity of PR signal and period of Franz-Deldysh oscillation(FKO) gradually decreased as the annealing temperature increased. The surface electric field(E$_{s}$) of the sample annealed at $600^{\circ}C$ is obtained 1.34$\times$10$^{5}$ V/cm. This value is 1.97 times less than that of unannealed sample. It has found that the passivation of surface occurred when the surface of the sample had been treated with Se/NH$_4$OH solution and annealed from 500 to $600^{\circ}C$. This result could be due to activation of elemental Se on the surface. It has also found that the elemental Se of the surface diffused about 100 $\AA$ into the bulk GaAs when Se-treated sample was annealed at $600^{\circ}C$.>.

• Proceedings of the Korean Vacuum Society Conference
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• 2014.02a
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• pp.378.2-378.2
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• 2014

We have investigated optical characteristics of $p-Ge_{0.99}Sn_{0.01}$ and Ge films grown on Si substrates using photoreflectance (PR) spectroscopy. The $Ge_{0.99}Sn_{0.01}$ and Ge films were grown by using an ultra-high vacuum chemical vapor deposition and molecular beam epitaxy methods, respectively. PR spectra were measured at 25 K and an extended InGaAs detector was used. By comparing $Ge_{0.99}Sn_{0.01}/Si$ and Ge/Si spectra, we observed the signals related to direct transition and split-off band of $Ge_{0.99}Sn_{0.01}$. The transition energies of $Ge_{0.99}Sn_{0.01}$ and Ge films were approximately 0.74 and 0.84 eV, respectively. Considering the shift of split-off band transition of $Ge_{0.99}Sn_{0.01}$, we suppose that the transition at 0.74 eV is attributed to direct transition between ${\Gamma}$ band and valence band. The temperature- and excitation power-dependent PR spectra were also measured.

• Proceedings of the Korean Vacuum Society Conference
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• 1998.02a
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• pp.114-115
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• 1998

Photoreflectance (pR) measurement h have been employed to study the uniformity of G GaAs!Si 3" wafer. The PR shows the energy of l light and heavy hole even at room temperature. F From the observed energy of LH and HH, it can b be seen that the center of the wafer is more s stressed than the 뼈ge. On the basis of biaxial t tensile stress the higher and lower. transitions are a attributed to heavy and light hole respectively.vely.