• Title/Summary/Keyword: Phase Shifting ESPI

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A Study on Shape Measurement by Using Electronic Speckle Pattern Interferometry (전자 스페클 패턴 간섭법을 이용한 형상 측정에 관한 연구)

  • 강영준;김계성
    • Journal of the Korean Society for Precision Engineering
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    • v.15 no.10
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    • pp.156-164
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    • 1998
  • Electronic Speckle Pattern Interferometry(ESPI) has been used to measure surface deformations of engineering components and materials in industrial areas. ESPI, a non-contact and non-destructive technique, is capable of providing full-field results with high spatial resolution and high speed. One of the important application using electronic speckle pattern interferometry is electronic speckle contouring of a diffused object for 3-D shape analysis and topography measurement. Generally the electronic speckle contouring is suitable for providing measurement range from millimeters to several centimeters. In this study, we introduce the contouring method by modified dual-beam speckle pattern interferometer and the shift of the two illumination beams through optical fiber in order to obtain the contour fringe patterns. We also describe formation process of depth contour fringes and grid contour fringes by shifting direction of the two illumination beams. Before the experiments, we performed the geometric analysis for dual-beam-shifted ESPI contouring, and then, the electronic speckle contouring experiment with various specimens. For quantitative analysis of the contour fringes, we used 4-frame phase shifting method with PZT Finally, good agreement between the geometric analysis and experimetal results is obtained.

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Development of Bulge Testing System for Mechanical Properties Measurement of Thin Films : Elastic Modulus of Electrolytic Copper Film (박막의 기계적 물성 측정을 위한 벌지 시험 시스템 개발: 전해 동 박의 탄성 계수)

  • Kim, Dong-Iel;Huh, Yong-Hak;Kim, Dong-Jin;Kee, Chang-Doo
    • Proceedings of the KSME Conference
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    • 2007.05a
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    • pp.1807-1812
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    • 2007
  • A bulge testing system was developed to measure mechanical properties of thin film materials. A bulge pressure test system for pressurizing the bulge window of the film and a micro out-of-plane ESPI(Electronic Speckle Pattern Interferometric) system for measuring deflection of the film were included in the testing system developed. For the out-of-plane ESPI system, whole field speckle fringe pattern, corresponding to the out-of-plane deflection of the bulged film, was 3-dimensionally visualized using 4-bucket phase shifting algorithm and least square phase unwrapping algorithm. The bulge pressure for loading and unloading was controlled at a constant rate. From the pressure-deflection curve measured by this testing system, ain-plane stress-strain curve could be determined. In this study, elastic modulus of an electrolytic copper film 18 ${\mu}m$ was determined. The modulus was calculated from determining the plain-strain biaxial elastic modulus at the respective unloading slopes of the stress-strain curve and for the Poisson's ratio of 0.34.

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Phase-Shifting System Using Zero-Crossing Detection for use in Fiber-Optic ESPI (영점검출을 이용한 광섬유형 전자 스페클 패턴 간섭계의 위상이동)

  • Park, Hyoung-Jun;Song, Min-Ho;Lee, Jun-Ho
    • Korean Journal of Optics and Photonics
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    • v.16 no.6
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    • pp.516-520
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    • 2005
  • We proposed an efficient phase stepping method for the use in fiber-optic ESPI. To improve phase-stepping accuracy and efficiency, a fiber-optic Michelson interferometer was phase-modulated by a ramp-driven fiber stretcher, resulting in 4$\pi$ phase excursion in the PD interference signal. The zero-crossing points of the signal, which have consecutive $\pi$ phase difference, were carefully detected and used to generate trigger signals for the CCD camera. From the experimental results by using this algorithm, $\pi$/2 phase-stepping errors between the speckle patterns were measured to be less than 0.6 mrad with 100 Hz image capture speed. Also it has been shown that the error from the nonlinear phase modulation and environmental perturbations could be minimized without any feedback algorithm.

A Study on Measurement and Analysis of In-Plane Deformations by Using Laser Speckle Interferometry (II) (레이저 스페클 간섭법을 이용한 면내 변형 측정 및 해석에 대한 연구 (II))

  • 강영준;노경완;나의균
    • Journal of the Korean Society for Precision Engineering
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    • v.15 no.12
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    • pp.113-119
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    • 1998
  • Recently Electronic Speckle Pattern Interferometry(ESPI) has been studied because it has the advantages to be able to measure the whole-field surface deformations of engineering components and materials in industrial areas with noncontact. The speckle patterns to be formed with interference phenomena of scattering light from rough surfaces illuminated by laser light have phase informations of surface deformations. In this study we used this interference phenomena and the phase shifting method to measure the inplane deformations, together with the use of digital image equipment to process the informations contained in the speckle pattern and to display consequent interferograms on TV monitor. FEA was performed before experiments and we obtained good agreement between the experimental results and FEA.

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Optical-fiber Electronic Speckle Pattern Interferometry for Quantitative Measurement of Defects on Aluminum Liners in Composite Pressure Vessels

  • Kim, Seong Jong;Kang, Young June;Choi, Nak-Jung
    • Journal of the Optical Society of Korea
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    • v.17 no.1
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    • pp.50-56
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    • 2013
  • Optical-fiber electronic speckle pattern interferometry (ESPI) is a non-contact, non-destructive examination technique with the advantages of rapid measurement, high accuracy, and full-field measurement. The optical-fiber ESPI system used in this study was compact and portable with the advantages of easy set-up and signal acquisition. By suitably configuring the optical-fiber ESPI system, producing an image signal in a charge-coupled device camera, and periodically modulating beam phases, we obtained phase information from the speckle pattern using a four-step phase shifting algorithm. Moreover, we compared the actual defect size with that of interference fringes which appeared on a screen after calculating the pixel value according to the distance between the object and the CCD camera. Conventional methods of measuring defects are time-consuming and resource-intensive because the estimated values are relative. However, our simple method could quantitatively estimate the defect length by carrying out numerical analysis for obtaining values on the X-axis in a line profile. The results showed reliable values for average error rates and a decrease in the error rate with increasing defect length or pressure.

Ideal Phase map Extraction Method and Filtering of Electronic Speckle Pattern Interferometry (전자 스페클 간섭법에서의 이상적인 위상도 추출과 필터링 방법)

  • 강영준;이주성;박낙규;권용기
    • Journal of the Korean Society for Precision Engineering
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    • v.19 no.12
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    • pp.20-26
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    • 2002
  • Deformation phase can be obtained by using Least-Square fitting. In extraction of phase values, Least-Square Fitting is superior to usual method such as 2, 3, 4-Bucket Algorithm. That can extract almost noise-free phase and retain 2 $\pi$ discontinuities. But more fringes in phase map, 2 $\pi$ discontinuities are destroyed when that are filtered and reconstruction of deformation is not reliable. So, we adapted Least-Square fitting using an isotropic window in dense fringe. Using Sine/cosine filter give us perfect 2 $\pi$ discontinuities information. We showed the process and result of extraction of phase map and filtering in this paper.