Degradation analysis of AlGaAs/GaAs HBTs and improvement of reliability by using InGaP ledge emitter (AlGaAs/GaAs HBT의 열화분석과 InGaP ledge 에미터에 의한 신뢰도 개선)
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- Journal of the Korean Institute of Telematics and Electronics D
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- v.35D no.7
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- pp.88-93
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- 1998