• Proceedings of the Korean Vacuum Society Conference
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• 2014.02a
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• pp.151.1-151.1
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• 2014

Wake field effect on the electron beam from the undulator chamber in PAL-XFEL is analyzed. The wake field takeover some energy from the electron beam which will increase the energy spread of the electron beam. This will cause the degradation of the radiation power in PAL-XFEL. To decrease the effect, the surface of the undulator vacuum chamber should be fabricated with 200 nm surface roughness and 5 nm oxidation layer. In this presentation, the numerical calculation of the wake will be shown. Simulation results of the radiation generation in PAL-XFEL also will be presented.

• Journal of the Korean institute of surface engineering
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• v.32 no.1
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• pp.61-66
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• 1999

The Spin-dependent tunneling magnetoresistance (TMR) effect was observed in $NiFe/Al_2O_3$/Co thin films. The samples were prepared by magnetron sputtering in a system with a base pressure of $3\times10^{-6}$Torr. the insulating $Al_2O_3$layer was prepared by r.f. plasma oxydation method of a metallic Al layer. The ferromagnetic and insulating layers were deposited through metallic masks to produce the cross pattern form. The junction has an active area of $0.3\times0.3\textrm{mm}^2$ and the $Al_2O_3$layer is deposited through a circular mask with a diameter of 1mm. It is very important that insulating layer is formed very thinly and uniformly in tunneling junction. The ferromagnetic layer was fabricated in optimum conditions and the surface of that was very flat, which was observed by AFM. Tunneling junction was confirmed through nonlinear I-V curve. $NiFe/Al_2O_3$/Co junction was observed for magnetization behavior and magnetoresistance property and magnetoresistance property is dependent on magnetization behavior and magnetoresistance property and magnetoresistance property is dependent on magnetization behavior of t재 ferromagnetic layer. The maximum magnetoresistance ratio was about 6.5%.