• Atmosphere
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• v.14 no.2
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• pp.11-22
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• 2004

A technique on atmospheric correction algorithm to the multi-band reflectance of Landsat TM imagery has been developed using an atmospheric radiation transfer model for eliminating the atmospheric and surface diffusion effects. Despite the fact that the technique of satellite image processing has been continually developed, there is still a difference between the radiance value registered by satellite borne detector and the true value registered at the ground surface. Such difference is caused by atmospheric attenuations of radiance energy transfer process which is mostly associated with the presence of aerosol particles in atmospheric suspension and surface irradiance characteristics. The atmospheric reflectance depend on atmospheric optical depth and aerosol concentration, and closely related to geographical and environmental surface characteristics. Therefore, when the effects of surface diffuse and aerosol reflectance are eliminated from the satellite image, it is actually corrected from atmospheric optical conditions. The objective of this study is to develop an algorithm for making atmospheric correction in satellite image. The study is processed with the correction function which is developed for eliminating the effects of atmospheric path scattering and surface adjacent pixel spectral reflectance within an atmospheric radiation model. The diffused radiance of adjacent pixel in the image obtained from accounting the average reflectance in the $7{\times}7$ neighbourhood pixels and using the land cover classification. The atmospheric correction functions are provided by a radiation transfer model of LOWTRAN 7 based on the actual atmospheric soundings over the Korean atmospheric complexity. The model produce the upward radiances of satellite spectral image for a given surface reflectance and aerosol optical thickness.

• Korean Journal of Materials Research
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• v.19 no.8
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• pp.407-411
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• 2009

Reflection properties, such as specular reflection and diffuse reflection, are very important optical properties for the reflector, which has high reflectance in the display and architecture industry. Calcite is lowcost, nontoxic, and stable over a wide temperature range. Therefore, it is one of the most widely using fillers in many industries and has some advantages over titania as a filler to improve reflectance. However, optical properties, especially those of ceramic-filled composites, have not been analyzed. We studied the reflectance of calcite composites with their surface roughness. The reflectance of the composites was determined using a UV-visible spectrometer. The surface morphology and the micro-structure of the composites were investigated by atomic force microscope. The reflectance of the composites was improved by increasing the content of calcite in the calcite-frit composite. The reflectance is related with the surface roughness in the composites. However, the reflectance depends on the calcite contents in materials with similar surface roughness.

• Current Photovoltaic Research
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• v.3 no.3
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• pp.91-96
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• 2015

Optical modeling and characterization of transparent dye-sensitized solar cells (DSC) are presented to design and estimate DSC devices numerically. In order to model the inhomogeneous active layer of DSC, the porous structure of titanium oxide ($TiO_2$) and dye mixture, we prepared films consisting of layer by layer of the DSC's basic materials sequentially, and characterized the optical parameters of the films with the effective refractive index, which was extracted from the transmittance and reflectance measurements in ultra violet to near infra-red range. By using the effective refractive index, we made the optical model for DSC, and demonstrated that the optical model based on effective refractive index can be used to design and evaluate the performance of transparent-type DSC modules.

• Journal of the Semiconductor & Display Technology
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• v.11 no.1
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• pp.67-71
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• 2012

The optical properties of PDP, such as the transmittance and reflectance, were analyzed with 3D optical code. Three different ITO-less structures in the front panel are examined. In the assembled panel study, the test 1 structure shows 16.6% and 10.2% higher reflectance than the structures of tests 2 and 3, respectively. In order to check the validation of the simulation result, three 7.5-inch test panels having the same geometry and property are fabricated as simulation models. The calculated reflective properties are compared to the measured data from real panels. The relative difference extracted from the simulation and measurement methods is less than 4.9% and are well matched.

• Proceedings of the KSRS Conference
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• 2002.10a
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• pp.378-381
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• 2002

We retrieved the aerosol optical thickness $\tau$$_{a}$ over land from Landsat-7/ETM+ image data using the correlation between the visible reflectance and middle IR reflectance. This band correlation method for aerosol retrieval was originally proposed fur MODIS data analysis by Kaufman et al.(1977). The results of retrieved aerosol optical thickness $\tau$$_{a}$ from Landsat-7/ETM+ data were compared with the simultaneous sky observation data at our study site. We found a good agreement between the retrieved and observed values. We presented the distribution maps of the aerosol optical thickness over land, retrieved from Landsat-7/ETM+ image data. Then, the surface reflectance map was also presented. The aerosol optical thickness over sea was retrieved assuming no reflected contribution from sea in the near IR band. In addition, we discussed some limitations when we apply the band correlation method.

• Proceedings of the KSRS Conference
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• 1999.11a
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• pp.95-99
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• 1999

We proposed a new retrieval method for aerosol's real part of refractive index, optical thickness, and Angstrom exponent using POLDER's directional reflectance and polarization data. We showed that aerosol's real part of refractive index can be retrieved systematically using multi-directional PR(polarization and reflectance) diagrams in a single infrared band by our algorithm for the first time. We examined the retrieved results, by comparing with the simultaneously measured sky observation data at the study site and we obtained a reasonable agreement between them.

• 한국신재생에너지학회:학술대회논문집
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• 2007.11a
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• pp.264-267
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• 2007

It is important to reduce optical losses from front surface reflection to improve the efficiency of crystalline silicon solar cells. Surface texturing by isotropic etching with acid solution based on HF and $HNO_3$ is one of the promising methods that can reduce surface reflectance. Anisotropic texturing with alkali solution is not suitable for multicrystalline silicon wafers because of its various grain orientations. In this paper, we textured multicrystalline silicon wafers by simple wet chemical etching using acid solution to reduce front surface reflectance. After that, surface morphology of textured wafer was observed by Scanning Electron Microscope(SEM) and Atomic Force Microscope(AFM), surface reflectance was measured in wavelength from 400nm to 1000nm. We obtained 29.29% surface reflectance by isotropic texturing with acid solution in wavelength from 400nm to 1000nm for fabrication of multicrystalline silicon solar cells.

• Korean Journal of Optics and Photonics
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• v.9 no.5
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• pp.300-306
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• 1998

We have studied the optical effects in dielectric multilayer due to the interdiffusion formed during the deposition process. We suggest a numerical method to calculate the optical properties of periodical multilayer thin-films with gradient-index profiles. Using this method the spectral transmittance and reflectance were obtained for Fabry-Perot type filters, broad-band total reflectors and antireflection filters with interdiffusion layers. Interdiffusion reduced the spectral band width of high reflectance in total reflectors, and deteriorated the characteristics of multilayer AR-coatings leading to a large variation of reflectance if the number of the layers is large.

• Korean Journal of Remote Sensing
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• v.25 no.6
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• pp.487-499
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• 2009

Atmospheric correction of satellite measurements is a major step to estimate accurate surface reflectance of solar spectrum channels. In this study, Simplified Method for the Atmospheric Correction (SMAC) radiative transfer model used to retrieve surface reflectance from MODIS (MODerate resolution Imaging Spectrometer) top of atmosphere (TOA) reflectance. It is fast and simple atmospheric correction method, so it uses for work site operation in various satellite. This study attempts a test of accuracy of SMAC through a sensitivity test to detected error sources and to improve accuracy of surface reflectance using SMAC. The results of SMAC as compared with MODIS surface reflectance (MOD09) was represented that low accuracy ($R^2\;=\;0.6196$, Root Means Square Error (RMSE) = 0.00031, bias = - 0.0859). Thus sensitivity analysis of input parameters and coefficients was conducted to searching error sources. Among the input parameters, Aerosol Optical Depth (AOD) is the most influence input parameter. In order to modify AOD term in SMAC code, Stepwise multiple regression was performed with testing and remove variable in three stages with independent variables of AOD at 550nm, solar zenith angle, viewing zenith angle. Surface reflectance estimation by using Newly proposed AOD term in the study showed that improve accuracy ($R^2\;=\;0.827$, RMSE = 0.00672, bias = - 0.000762).

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1996.11a
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• pp.143-146
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• 1996

In (GeTe)$_{100-x}$(Sb$_2$Te$_3$)$_{x}$(x=33.5, 50, 66.5, 80 at.%) thin films, the optical properties of amorphous and crystalline thin film, XRD were studied. Also, the application for the phase change optical recording materials with the high stability and rapid erasing ability were studied. In the (GeTe)$_{100-x}$(Sb$_2$Te$_{3}$)$_{x}$ the transmittance was decreased with the increase of x. In all thin films, the transmittance was decreased and the reflectance was increased by annealing and particularly, the reflectance before and after annealing showed the large reflectance ratio. The XRD pattern, it was confined that these change of optical properties was due to the crystallization of amorphous thin films. The reflectance change was investigated using isothermal annealing condition.ion.ion.