• 한국진공학회:학술대회논문집
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• 한국진공학회 2012년도 제42회 동계 정기 학술대회 초록집
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• pp.100-101
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• 2012

The plasma damage free and room temperature processedthin film deposition technology is essential for realization of various next generation organic microelectronic devices such as flexible AMOLED display, flexible OLED lighting, and organic photovoltaic cells because characteristics of fragile organic materials in the plasma process and low glass transition temperatures (Tg) of polymer substrate. In case of directly deposition of metal oxide thin films (including transparent conductive oxide (TCO) and amorphous oxide semiconductor (AOS)) on the organic layers, plasma damages against to the organic materials is fatal. This damage is believed to be originated mainly from high energy energetic particles during the sputtering process such as negative oxygen ions, reflected neutrals by reflection of plasma background gas at the target surface, sputtered atoms, bulk plasma ions, and secondary electrons. To solve this problem, we developed the NBAS (Neutral Beam Assisted Sputtering) process as a plasma damage free and room temperature processed sputtering technology. As a result, electro-optical properties of NBAS processed ITO thin film showed resistivity of $4.0{\times}10^{-4}{\Omega}{\cdot}m$ and high transmittance (>90% at 550 nm) with nano- crystalline structure at room temperature process. Furthermore, in the experiment result of directly deposition of TCO top anode on the inverted structure OLED cell, it is verified that NBAS TCO deposition process does not damages to the underlying organic layers. In case of deposition of transparent conductive oxide (TCO) thin film on the plastic polymer substrate, the room temperature processed sputtering coating of high quality TCO thin film is required. During the sputtering process with higher density plasma, the energetic particles contribute self supplying of activation & crystallization energy without any additional heating and post-annealing and forminga high quality TCO thin film. However, negative oxygen ions which generated from sputteringtarget surface by electron attachment are accelerated to high energy by induced cathode self-bias. Thus the high energy negative oxygen ions can lead to critical physical bombardment damages to forming oxide thin film and this effect does not recover in room temperature process without post thermal annealing. To salve the inherent limitation of plasma sputtering, we have been developed the Magnetic Field Shielded Sputtering (MFSS) process as the high quality oxide thin film deposition process at room temperature. The MFSS process is effectively eliminate or suppress the negative oxygen ions bombardment damage by the plasma limiter which composed permanent magnet array. As a result, electro-optical properties of MFSS processed ITO thin film (resistivity $3.9{\times}10^{-4}{\Omega}{\cdot}cm$, transmittance 95% at 550 nm) have approachedthose of a high temperature DC magnetron sputtering (DMS) ITO thin film were. Also, AOS (a-IGZO) TFTs fabricated by MFSS process without higher temperature post annealing showed very comparable electrical performance with those by DMS process with $400^{\circ}C$ post annealing. They are important to note that the bombardment of a negative oxygen ion which is accelerated by dc self-bias during rf sputtering could degrade the electrical performance of ITO electrodes and a-IGZO TFTs. Finally, we found that reduction of damage from the high energy negative oxygen ions bombardment drives improvement of crystalline structure in the ITO thin film and suppression of the sub-gab states in a-IGZO semiconductor thin film. For realization of organic flexible electronic devices based on plastic substrates, gas barrier coatings are required to prevent the permeation of water and oxygen because organic materials are highly susceptible to water and oxygen. In particular, high efficiency flexible AMOLEDs needs an extremely low water vapor transition rate (WVTR) of $1{\times}10^{-6}gm^{-2}day^{-1}$. The key factor in high quality inorganic gas barrier formation for achieving the very low WVTR required (under ${\sim}10^{-6}gm^{-2}day^{-1}$) is the suppression of nano-sized defect sites and gas diffusion pathways among the grain boundaries. For formation of high quality single inorganic gas barrier layer, we developed high density nano-structured Al2O3 single gas barrier layer usinga NBAS process. The NBAS process can continuously change crystalline structures from an amorphous phase to a nano- crystalline phase with various grain sizes in a single inorganic thin film. As a result, the water vapor transmission rates (WVTR) of the NBAS processed $Al_2O_3$ gas barrier film have improved order of magnitude compared with that of conventional $Al_2O_3$ layers made by the RF magnetron sputteringprocess under the same sputtering conditions; the WVTR of the NBAS processed $Al_2O_3$ gas barrier film was about $5{\times}10^{-6}g/m^2/day$ by just single layer.

• 한국안광학회지
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• 제16권4호
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• pp.357-362
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• 2011

목적: $Ti_3O_5$와 $SiO_2$를 이용하여 중심파장이 500 nm에서 반치폭이 약 12 nm이고 투과율이 99%인 협대역 칼라투과필터를 제작하고, 이 칼라필터의 박막 특성을 연구하고자 한다. 방법: 두께 800 nm인 $Ti_3O_5$박막과 $SiO_2$박막의 투과율로부터 박막의 광학상수 n(굴절률)과 k(소멸계수)를 구하였고, Essential Macleod program을 이용하여 중심파장이 500 nm에서 반치폭이 약 12 nm이고 투과율이 99%인 협대역 칼라투과필터의 필터층과 AR 코팅층을 설계하였다. 또 한 electron beam evaporation 장치를 이용하여 $Ti_3O_5/SiO_2$ 다층막 칼라필터을 만든 후, 분광광도계를 이용하여 투과율을 측정하였고, SEM 사진에 의한 칼라필터의 단면으로부터 칼라필터의 박막두께와 층수를 알 수 있었고, XPS분석으로부터 박막 성분을 분석하였다. 결과: 칼라필터의 AR 코팅층의 최적조건은 6층으로 [air$|SiO_2(90)|Ti_3O_5(36)|SiO_2(5)|Ti_3O_5(73)|SiO_2(30)|Ti_3O_5(15)|$ glass]이며, 반치폭이 12 nm인 칼라필터의 필터층의 최적조건은 41층으로 [air$|SiO_2(20)|Ti_3O_5(64)|SiO_2(102)|Ti_3O_5(66)|SiO_2(112)|Ti_3O_5(74)|SiO_2(120)|Ti_3O_5(68)|SiO_2(123)|Ti_3O_5(80)|SiO_2(109)|Ti_3O_5(70)|SiO_2(105)|Ti_3O_5(62)|SiO_2(99)|Ti_3O_5(63)|SiO_2(98)|Ti_3O_5(51)|SiO_2(60)|Ti_3O_5(42)|SiO_2(113)|Ti_3O_5(88)|SiO_2(116)|Ti_3O_5(68)|SiO_2(89)|Ti_3O_5(49)|SiO_2(77)|Ti_3O_5(48)|SiO_2(84)|Ti_3O_5(51)|SiO_2(85)|Ti_3O_5(48)|SiO_2(59)|Ti_3O_5(34)|SiO_2(71)|Ti_3O_5(44)|SiO_2(65)|Ti_3O_5(45)|SiO_2(81)|Ti_3O_5(52)|SiO_2(88)|$ glass] 이었다. 위의 데이터를 이용하여 제작한 칼라필터는 SEM 사진에 의해 41층으로 확인되었으며, XPS 분석에 의해 $SiO_2$층이 맨 위층이며 $Ti_3O_5$층과 교번인 다층막으로 형성돼 있으며, $Ti_3O_5$박막 형성 시 TiO2 박막과 $Ti_3O_5$박막이 섞여 형성됨을 알 수 있었다. 결론: 41층의 $Ti_3O_5/SiO_2$ 다층박막을 이용하여 12 nm 반치폭을 갖으며 500 nm 중심파장에서 투과율은 99%인 협대역 칼라투과필터를 제작하였으며, 이 칼라필터는 $Ti_3O_5$박막 형성 시 TiO2 박막과 $Ti_3O_5$박막이 섞여 형성됨을 알 수 있었다.

• Radiation Oncology Journal
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• 제25권4호
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• pp.268-277
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• 2007

목적: 호흡에 의한 종양의 움직임은 사이버나이프를 이용한 정위적 방사선수술과 같은 정확한 치료에 있어 고려할 만한 방해 요인이다 이 연구에서는 사이버나이프를 이용한 방사선 수술의 Interplay현상을 보고자 팬텀을 움직이게 하고 또한 움직이지 않게 하여 선량 분포의 왜곡을 조사하였다. 대상 및 방법: 팬텀은 $2.5{\times}2.5{\times}5.0$ 인치의 4개의 직육면체로 구성된 폴리에틸렌과 2장의 Gafchromic 필름으로 구성되었다. 치료 계획은 20, 30, 40, 50 mm지름을 가진 구를 가상하여 사이버나이프 치료기를 이용하여 104개의 빔 방향과 single center mode의 치료 계획 하에 총 30 Gy를 조사하였다. 특별히 제작된 로봇은 팬텀을 좌우, 전후, 두미쪽으로 각각 5, 10, 20 mm 움직이도록 고안되었다. 필름의 optical density을 이용하여 정적인 상태의 팬텀과 로봇에 의해 움직일 때의 팬텀의 선량 분포를 구하였다. 결 과: 정적인 상태에서 종양을 모두 포함할 수 있는 최소의 등선량은 20 mm 종양의 경우 80%, 30 mm에 84%, 40 mm에 83%이며 50 mm 종양에 80%였다. 정적인 상태와 움직일 때의 팬텀 사이에서 발생한 선량 분포의 차이(gap)는 20 mm 종양에서 두미방향으로 각각 3.2, 3.3 cm이며 오른쪽 3.5 mm, 왼쪽 1.1 mm였다. 30 mm 종양의 경우는 각각 3.9, 4.2, 2.8과 0 mm였고 40 mm 종양은 각각 4.0, 4.8, 1.1, 0 mm였다. 50 mm 종양의 경우 각각 3.9, 3.9, 0.0 mm였다. 결 론: 20 mm의 적은 종양을 치료할 때 80%의 등선량이 계획되더라도 움직이는 실제 치료에 있어 종양 움직임을 보완하기 위하여 60% 등선량으로 처방할 필요가 있다. 이때 두 등선량 곡선의 차이는 5 mm정도이다. 또한 30, 40과 50 mm의 종양에서는 움직임을 보완하기 위하여 등선량 곡선을 70%정도로 처방할 필요가 있다. 이때의 차이도 약 5 mm 미만이다. 이는 사이버나이프를 이용한 방사선수술 시 움직임 그 차체 보다 여유폭을 적게 줄 수 있다는 의미이며 이는 일반 방사선치료와 다른 점이라 할 수 있다.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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• pp.292-292
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• 2016

Transition metal dichalcogenides (TMDs) with a two-dimensional layered structure have been considered highly promising materials for next-generation flexible, wearable, stretchable and transparent devices due to their unique physical, electrical and optical properties. Recent studies on TMD devices have focused on developing a suitable doping technique because precise control of the threshold voltage ($V_{TH}$) and the number of tightly-bound trions are required to achieve high performance electronic and optoelectronic devices, respectively. In particular, it is critical to develop an ultra-low level doping technique for the proper design and optimization of TMD-based devices because high level doping (about $10^{12}cm^{-2}$) causes TMD to act as a near-metallic layer. However, it is difficult to apply an ion implantation technique to TMD materials due to crystal damage that occurs during the implantation process. Although safe doping techniques have recently been developed, most of the previous TMD doping techniques presented very high doping levels of ${\sim}10^{12}cm^{-2}$. Recently, low-level n- and p-doping of TMD materials was achieved using cesium carbonate ($Cs_2CO_3$), octadecyltrichlorosilane (OTS), and M-DNA, but further studies are needed to reduce the doping level down to an intrinsic level. Here, we propose a novel DNA-based doping method on $MoS_2$ and $WSe_2$ films, which enables ultra-low n- and p-doping control and allows for proper adjustments in device performance. This is achieved by selecting and/or combining different types of divalent metal and trivalent lanthanide (Ln) ions on DNA nanostructures. The available n-doping range (${\Delta}n$) on the $MoS_2$ by Ln-DNA (DNA functionalized by trivalent Ln ions) is between $6{\times}10^9cm^{-2}$ and $2.6{\times}10^{10}cm^{-2}$, which is even lower than that provided by pristine DNA (${\sim}6.4{\times}10^{10}cm^{-2}$). The p-doping change (${\Delta}p$) on $WSe_2$ by Ln-DNA is adjusted between $-1.0{\times}10^{10}cm^{-2}$ and $-2.4{\times}10^{10}cm^{-2}$. In the case of Co-DNA (DNA functionalized by both divalent metal and trivalent Ln ions) doping where $Eu^{3+}$ or $Gd^{3+}$ ions were incorporated, a light p-doping phenomenon is observed on $MoS_2$ and $WSe_2$ (respectively, negative ${\Delta}n$ below $-9{\times}10^9cm^{-2}$ and positive ${\Delta}p$ above $1.4{\times}10^{10}cm^{-2}$) because the added $Cu^{2+}$ ions probably reduce the strength of negative charges in Ln-DNA. However, a light n-doping phenomenon (positive ${\Delta}n$ above $10^{10}cm^{-2}$ and negative ${\Delta}p$ below $-1.1{\times}10^{10}cm^{-2}$) occurs in the TMD devices doped by Co-DNA with $Tb^{3+}$ or $Er^{3+}$ ions. A significant (factor of ~5) increase in field-effect mobility is also observed on the $MoS_2$ and $WSe_2$ devices, which are, respectively, doped by $Tb^{3+}$-based Co-DNA (n-doping) and $Gd^{3+}$-based Co-DNA (p-doping), due to the reduction of effective electron and hole barrier heights after the doping. In terms of optoelectronic device performance (photoresponsivity and detectivity), the $Tb^{3+}$ or $Er^{3+}$-Co-DNA (n-doping) and the $Eu^{3+}$ or $Gd^{3+}$-Co-DNA (p-doping) improve the $MoS_2$ and $WSe_2$ photodetectors, respectively.