• 제목/요약/키워드: Optical Emission Spectrometer

검색결과 92건 처리시간 0.029초

수화과정에서 전처리가 알루미늄 합금의 용출에 미치는 효과 (Effect of Pretreatment on the Dissolution of Aluminum Alloy during Hydration Process)

  • 이병구;이호연;탁용석
    • Corrosion Science and Technology
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    • 제12권5호
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    • pp.215-219
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    • 2013
  • Aluminum alloy(3003) can be dissolved during hydration process with hot tap water. In order to increase the stability of aluminum alloy, it was pretreated with anodization and phosphoric acid before hydration process. The effect of pretreatment on the surface property changes was analyzed with X-ray Photoelectron Spectroscopy (XPS) and Inductively Coupled Plasma-Optical Emission Spectrometer (ICP-OES) and their results supported that the increase of hydroxyl group (-OH) on the surface formed during anodization and phosphorous acid treatment prevented the dissolution of aluminum alloy during hydration process at high temperature.

DC Pulse 전압을 이용한 DBD 대기압 플라즈마의 특성 분석 (Properties of dielectric-barrier atmospheric pressure plasma driven by DC pulse voltage)

  • 이종봉;하창승;김동현;이호준;이해준
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2011년도 제42회 하계학술대회
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    • pp.1523-1524
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    • 2011
  • 본 연구에서는 대기압 하에서 평판형의 금속전극 양단에 펄스전압을 인가하여 대기압/저온 마이크로 플라즈마를 지속적으로 발생시키는 방법을 제안하고 구동전원 특성 및 플라즈마의 전기, 광학적 특성에 관한 연구를 수행하였다. 또한 Comsol 프로그램을 사용하여 이론적 해석을 하였으며, OES(Optical Emission Spectrometer)를 사용하여 측정 및 분석을 하였다.

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Multiple-Bit Encodings of Bragg Photonic-structures by Using Consecutive Etch with Various Square Wave Currents

  • Lee, Bo-Yeon;Hwang, Minwoo;Cho, Hyun;Kim, Hee-Chol;Cho, Sungdong
    • 통합자연과학논문집
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    • 제4권3호
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    • pp.192-196
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    • 2011
  • New method to encode multiple photonic features of Bragg type reflector on silicon wafer has been investigated. Multiple bit encodes of distributed Bragg reflector features have been prepared by electrochemical etching of crystalline silicon by using various square wave current densities. Optical characterization of multi-encoding of distributed Bragg reflectors on porous silicon was achieved by Ocean optics 2000 spectrometer for the search of possible applications of multiple bit encoding of distributed Bragg reflectors such as multiplexed assays and chemical sensors. The morphology and cross-sectional structure of multi-encoded distributed Bragg reflectors was investigated by field emission scanning electron micrograph.

고밀도 산소 플라즈마를 이용한 감광제 제거공정에 관한 연구 (A Study on Photoresist Stripping Using High Density Oxygen Plasma)

  • 정형섭;이종근;박세근;양재균
    • 한국전기전자재료학회논문지
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    • 제11권2호
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    • pp.95-100
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    • 1998
  • A helical inductively coupled plasma asher, which produces low energy and high density plasma, has been built and investigated for photoresist stripping process. Oxygen ion density in the order of $10^{11}/cm^3$ is measured by Langmuir probe, and higher oxygen radical density is observed by Optical Emission Spectrometer. As RF source power is increased, the plasma density and thus photoresist stripping rate are increased. Independent RF bias power to the wafer stage provides a dc bias to the wafer and an ability to add the ion assisted reaction. At 1 KW of the source power, the coupling mechanism of the RF power to the plasma is changed from the inductive mode to the capacitive one at about 1 Torr. This change causes the plasma density and ashing rate decreases abruptly. The critical pressure of the mode change becomes larger with larger RF power.

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BCl3/Ar 혼합가스를 이용한 $Y_2O_3$ 박막의 유도결합 플라즈마 식각 (Etching characteristics of $Y_2O_3$ Thin films using inductively coupled Plasma of $BCl_3$/Ar Gas Mixtures)

  • 김문근;양대왕;김영호;권광호
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2009년도 춘계학술대회 논문집
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    • pp.67-67
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    • 2009
  • 본 연구는 강유전체 박막의 buffer 층으로 사용되는 Yttrium oxide($Y_2O_3$) 박막에 대한 $BCl_3$/Ar 혼합가스 식각 특성에 대해 연구하였다. 식각 메카니즘을 해석하기 위해 QMS(Quadrupole Mass Spectrometer), OES(Optical Emission Spectroscopy)를 사용하여 플라즈마 특성을 추출하였다. 공정 조건(source power, bias power, pressure, total gas flow)을 동일하게 유지하고 $BCl_3$/Ar 혼합가스 비율을 변화시키며 실험을 진행 하였다. 혼합가스의 비율이 $BCl_3$(80%)/Ar(20%)일때 가장 높은 식각 속도을 나타냈고, 이후 점차 감소하였다. 이때의 식각 속도는 8.8 nm/min 였다. 이에 $Y_2O_3$는 이온 보조 화학식각 특성을 가짐을 확인하였다.

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전해정련 및 진공정련 공정을 이용한 고순도 주석 회수 기술 (High purity Tin recovery technique by electro-refining and vacuum-refining process)

  • 김용환;박성철;손성호;김형미;이기웅
    • 한국표면공학회:학술대회논문집
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    • 한국표면공학회 2015년도 추계학술대회 논문집
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    • pp.221-221
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    • 2015
  • 폐 자원에서 회수한 주석 조금속의 주석 순도 및 불순물 순도, 전해정련 및 진공정련 후 주석 순도를 ICP-OES (Inductively Coupled Plasma Optical Emission Spectrometer)분석을 통해 확인하였다. 무기산 전해액에서 전해정련 수행결과 고순도 주석을 확보하였고, 이후 증기압, 온도 및 유지시간 별 진공정련 수행결과 초고순도 주석을 회수할 수 있는 최적화 기술을 도출하였다.

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다양한 기판에 제작한 ITO 박막의 실온 특성 변화 (Properties of ITO thin film's aging change prepared on the various substrate)

  • 김상모;임유승;손인환;김경환
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2008년도 하계학술대회 논문집 Vol.9
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    • pp.403-404
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    • 2008
  • In this study, we prepared ITO thin film on glass, polycarbonate (PC) and polyethersulfone (PES) substrate in Facing Targets sputtering (FTS) system. Properties of as-deposited thin films's aging change were investigated as a function of time placed in the air. The electrical and optical properties of as-deposited thin films were employed by a four point probe and an UV/VIS spectrometer, an X-ray diffractometer (XRD), a Field Emission Scanning Electron Microscope(FESEM) and a Hall Effect measurement. As a result, as time went by, transmittance of all films did not change but resistivity of films was decreasing.

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$CF_4$ 첨가에 따른 po1yimide 박막의 패터닝 연구 (The Patterning of Polyimide Thin Films for the Additive $CF_4$ gas)

  • 강필승;김창일;김상기
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2001년도 추계학술대회 논문집
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    • pp.209-212
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    • 2001
  • Polyimide(PI) films have been considered as the interlayer dielectric materials due to low dielectric constant, low water absorption, high gap-fill and planarization capability. The PI film was etched with using inductively coupled plasma (ICP). The etching characteristics such as etch rate and selectivity were evaluated to gas mixing ratio. High etch rate was 8300$\AA$/min and vertical profile was approximately acquired 90$^{\circ}$ at CF$_4$/(CF$_4$+O$_2$) of 0.2. The selectivies of polyimide to PR and SiO$_2$ were 1.2, 5.9, respectively. The etching profiles of PI films with an aluminum pattern were measured by a scanning electron microscope (SEM). The chemical states on the PI film surface were investigated by x-ray photoelectron spectroscopy (XPS). Radical densities of oxygen and fluorine in different gas mixing ratio of 07CF4 were investigated by optical emission spectrometer (OES).

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Development of a DC Pulse Atmospheric Micro Plasma using a Voltage Doubled Capacitive Ballast

  • 하창승;차주홍;김동현;이해준;이호준
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2013년도 제45회 하계 정기학술대회 초록집
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    • pp.157.1-157.1
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    • 2013
  • 외부 Ballast Capacitor를 이용한 Voltage Doubler 전원장치를 이용하여 Micro size의 대기압 플라즈마를 발생장치를 개발하였다. 2개의 외부 Capacitor를 병렬로 연결하여 충전한 다음 외부 Capacitor를 직렬로 연결하여 전압을 2배압 시킨 상태에서 방전이 일어나도록 하였다. Capacitor의 충 방전 제어는 Switch Device인 Insulated Gate Bipolar Transistor (IGBT)를 사용하였다. 개발된 대기압 플라즈마는 외부 Capacitor와 인가전압을 독립적으로 변화시킬 수 있기 때문에 방전 시 전류 전압을 독립적으로 제어할 수 있으며 용도에 따라 Glow 방전에서 Arc 방전까지 제어가 가능하다. 본 연구에서는 900 V의 1.22 nF 외부 Capacitor 방전과 400 V의 10 nF 외부 Capacitor 방전을 비교하였다. 방전 시 전압파형과 전류파형은 서로 다르지만 소비된 방전에너지는 340 ${\mu}J$로 동일하다. ICCD camera와 Spectrometer를 이용하여 비교 분석을 실시하였다. 방전 image 및 Optical Emission Spectroscopy 분석을 이용하여 플라즈마의 온도, 밀도 등을 시간적, 공간적으로 분석하였다.

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Investigation of Relationship between Reflection Resonance and Applied Current Density in Bragg Photonic Crystal

  • Kim, Bumseok
    • 통합자연과학논문집
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    • 제5권1호
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    • pp.27-31
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    • 2012
  • Relationship between reflection resonance and applied current density in Bragg photonic crystal has been investigated. Multiple bit encodes of distributed Bragg reflector features have been prepared by electrochemical etching of crystalline silicon by using various square wave current densities. Optical characterization of multi-encoding of distributed Bragg reflectors on porous silicon was achieved by Ocean optics 2000 spectrometer for the search of possible applications of multiple bit encoding of distributed Bragg reflectors such as multiplexed assays and chemical sensors. The morphology and cross-sectional structure of multi-encoded distributed Bragg reflectors was investigated by field emission scanning electron micrograph.