• Proceedings of the Korean Vacuum Society Conference
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• 2014.02a
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• pp.340.1-340.1
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• 2014

본 실험에서는 Ag두께 변화에 따른 투과율과 Energy bandgap의 변화를 알아보기 위해 RF Sputter장비와 Evaporator장비를 사용하여 IGZO, ZnO, AZO OMO 구조로 Low-e 코팅된 Glass를 제작하였다. $3cm{\times}3cm$의 Corning1737 유리기판에 RF Sputtering 방식으로 Oxide layer를 증착 하였고 Evaporator장비로는 Metal layer인 Ag막을 증착하였다. Oxide layer 증착 시 RF Sputter장비의 조건은 $3.0{\times}10^{-6}Torr$이하로 하였으며, 증착압력은 $6.0{\times}10^{-3}Torr$, 증착온도는 실온으로 고정하였다. Metal layer 증착 시 Evaporator장비의 조건은 $5.0{\times}10^{-6}Torr$이하, 전압은 0.3 V, Rotate 2 rpm으로 고정하였다. 실험 변수로는 Ag 두께를 5,7,9,11,13 nm로 변화를 주어 실험을 진행하였다. 투과도 측정 장비를 사용하여 각 샘플을 측정한 결과 IGZO의 경우 가시광영역의 평균 투과율이 80% 이상이며 Ag두께가 5nm일 때부터 자외선 영역의 빛을 차단하여 low-e 특성을 나타내었다. 이는 산화물인 IGZO가 결정질인 AZO, ZnO 보다 낮은 표면거칠기를 가지기 때문이다. Ag 두께에 따른 각 물질의 Optical energy bandgap 분석결과 Ag 두께가 증가할수록 IGZO는 4.65~4.5 eV, AZO는 4.6~4.4 eV, ZnO는 4.55~4.45 eV로 Energy bandgap은 감소하였다. AFM장비를 이용하여 각 샘플의 표면 Roughness 측정 결과 Ag 두께가 증가할수록 표면거칠기도 증가하는 경향을 나타내었다.

• Journal of Forest and Environmental Science
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• v.34 no.6
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• pp.451-456
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• 2018

The use of single component distribution to describe the irregular stand structure of degraded forest often lead to bias. Such biasness can be overcome by the application of finite mixture distribution. Therefore, in this study, finite mixture distribution was used to characterise the irregular stand structure of the Gmelina arborea plantation in Omo forest reserve. Thirty plots, ten each from the three stands established in 1984, 1990 and 2005 were used. The data were pooled per stand and fitted. Four finite mixture distributions including normal mixture, lognormal mixture, gamma mixture and Weibull mixture were considered. The method of maximum likelihood was used to fit the finite mixture distributions to the data. Model assessment was based on negative loglikelihood value ($-{\Lambda}{\Lambda}$), Akaike information criterion (AIC), Bayesian information criterion (BIC) and root mean square error (RMSE). The results showed that the mixture distributions provide accurate and precise characterisation of the irregular diameter distribution of the degraded Gmelina arborea stands. The $-{\Lambda}{\Lambda}$, AIC, BIC and RMSE values ranged from -715.233 to -348.375, 703.926 to 1433.588, 718.598 to 1451.334 and 3.003 to 7.492, respectively. Their performances were relatively the same. This approach can be used to describe other irregular forest stand structures, especially the multi-species forest.

• The Bulletin of The Korean Astronomical Society
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• v.38 no.2
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• pp.57.1-57.1
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• 2013

We investigate the method to measure both the present value of the matter energy density contrast and the Hubble parameter directly from the measurement of the linear growth rate which is obtained from the large scale structure of the Universe. From this method, one can obtain the value of the nuisance cosmological parameter $\Omo$ (the present value of the matter energy density contrast) within 3% error if the growth rate measurement can be reached $z >3.5$. One can also investigate the evolution of the Hubble parameter without any prior on the value of $H_0$ (the current value of the Hubble parameter). Especially, estimating the Hubble parameter are insensitive to the errors on the measurement of the normalized growth rate $f \sigma_8$. However, this method requires the high $z$ ($z >3.5$) measurement of the growth rate in order to get the less than 5% errors on the measurements of $H(z)$ at $z \leq 1.2$ with the redshift bin $\Delta z = 0.2$. Thus, this will be suitable for the next generation large scale structure galaxy surveys like WFMOS and LSST.

• Transactions on Electrical and Electronic Materials
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• v.17 no.4
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• pp.235-237
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• 2016

Oxide/metal/oxide (OMO) thin films were fabricated using amorphous indium-gallium-zinc-oxide (a-IGZO) and an Ag metal layer on a glass substrate at room temperature. The optical and electrical properties of the a-IGZO/Ag/a-IGZO samples changed systemically depending on the thickness of the Ag layer. The transmittance in the visible range tends to decrease as the Ag thickness increases while the resistivity, carrier concentration, and Hall mobility tend to improve. The a-IGZO/Ag (13 nm)/a-IGZO thin film with the optimum Ag thickness showed an average transmittance (T_av) of 71.7%, resistivity of 6.63 × 10⁻⁵ Ω·cm and Hall mobility of 15.22 cm²V⁻¹s⁻¹.

• Restorative Dentistry and Endodontics
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• v.28 no.5
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• pp.378-384
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• 2003

This study evaluated the influence of a desensitizer(MS coat) on microtensile bond strength of different adhesives:a three-step adhesive(All-Bond 2), a two-step adhesive(Single Bond), a one-step adhesive(One-up Bond F). Non-caries extracted human molars were used. Dentin surface was obtained by horizontal section on mid-portion of crown using a water-cooled low speed diamond saw. Teeth were randomly divided into 6 group. AMO(MS coat + All Bond), SMO(MS coat + Single Bond)- and OMO(MS coat + One-up Bond F)-dentin surface were treated with 17% EDTA before bonded adhesive. AMX-, SMX- and OMX-dentin surface were bonded with All-Bond 2, Single Bond and One-up Bond F, respectively. with no previous treatment with MS coat and 17% EDTA. About 1cm high resin composite($Z-250^{TM}$) were incrementally build-up on the treated surface. The specimens for the microtensile test were serially sectioned perpendicular to the adhesive layer to obtain $0.7{\times}0.7mm$ sticks. 30 sticks were prepared from each group. After that. tensile bond strength for each stick was measured with Microtensile Tester at a 1mm/min crosshead speed. Fractured dentin surfaces were observed under the SEM. The results were statistically analysed by using a One-way ANOVA and Tukey's test(p<0.05). Value in MPa were: $AMO-44.35{\pm}13.21;{\;}SMO-39.35{\pm}13.32;{\;}OMO-31.07{\pm}10.25;{\;}AMX-49.22{\pm}16.38;{\;}SMX-56.02{\pm}13.35;{\;}OMX-72.93{\pm}16.19$. Application of MS coat reduced microtensile bond strengths of both Single Bond and One-up Bond F, whereas microtensile bond strengths of All-Bond 2 were not affected significantly.

• Proceedings of the Korean Vacuum Society Conference
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• 2012.08a
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• pp.290-290
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• 2012

본 실험에서는 RF magnetron sputtering법과 evaporator법을 이용하여 다층박막 OMO구조를 $30{\times}30mm$ 유리기판 위에 제작하였다. Oxide층은 Sputter장비를 이용 IGZO막을 제작하였으며, Metal 층은 evaporator장비를 이용 Ag 막을 제작하였다. 변수로는 Oxide층의 시간에 따른 특성 변화를 연구하였다. 소결된 타겟으로는 In:Ga:ZnO를 각각 1:1:1 mol%의 조성비로 혼합하여 이용하였으며, Ag는 99.999%의 순도를 가진다. Oxide층의 RF sputter 공정 조건으로는 초기압력 $3.0{\times}10^{-6}$ Torr 이하로 하였으며, 증착 압력 $2.0{\times}10^{-2}$ Torr, Rf power 30 W, Ar gas 50 sccm으로 고정 시켰으며, 변수로는 5, 7, 9, 11분은 시간 차이를 두어 증착을 하였다. Metal층의 Evaporator 공정조건으로는 $5.0{\times}10^{-6}$ Torr이하, 전압은 0.3 V, Thickness moniter로 두께를 확인해가며 증착하였으며, $100{\AA}$으로 고정시켰다. 분석결과로는 XRD 측정 결과 35도 부근에서 Ag 피크가 관찰되었다. IGZO막 하나일때 90% 이상의 평균 투과율을 보였으며, 3층의 구조가 모두 증착됐을때의 투과도는 가시광영역에서 평균 80% 이상의 투과율을 보였으며, 500 nm부터 투과율이 떨어지기 시작해 800 nm부근에서는 평균 투과율이 30%까지 떨어져 Metal층인 Ag가 하나의 layer로 잘 증착이 된것을 보여주며, 플라즈몬효과를 보여줌을 알수있다. AFM측정 결과 평균 거칠기는 1.2 nm 정도의 거칠기를 확인했다. 홀 측정결과 전기적 특성은 발견되지 않았다.

• Journal of Forest and Environmental Science
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• v.30 no.4
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• pp.315-321
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• 2014

Forest timber production potential of any site is oftentimes measured quantitatively by site index, which is defined as dominant height of a particular stand at a specified age. A site index was developed for estimating site quality of monoculture Pinus caribaea plantations in southwestern Nigeria using a base age of 25 years. Dominant height data were collected from 60 Temporary Sample Plots (TSPs) of $20{\times}20m$ in plantations of 15 to 37 years. Linear and non-linear models as been widely applied in quantitative forest measurements were fitted to dominant height-age data and the best site index equation is : $SI=Exp^{(InHd-23.495(A^{-2}-0.04)}$. The site index curves constructed for the three sites (Omo Forest Reserve - OFR (J4), Oluwa Forest Reserve - OLFR and Shasha Forest Reserve - SFR) across the southwestern Nigeria using the chosen equation revealed that a 15 year old Pinus caribaea in the study area attained average dominant heights of 25, 22 and 21 m in OFR (J4), OLFR and SFR respectively. The site index equation and curves proffer veritable insight into better silvicultural options and management practices for the future plantations suitable sites.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.31 no.6
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• pp.408-411
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• 2018

We fabricated highly flexible Mn-doped $SnO_2$ (MTO)/Ag/MTO/polydimethylsiloxane (PDMS)/MTO multilayer transparent conducting films. To reduce refractive-index mismatching of the MTO/Ag/MTO/polyethylene terephthalate (PET), index-matching layers were inserted between the oxide-metal-oxide-structured films and the PET substrate. The PDMS layer was deposited by spin-coating after adjusting the mixing ratio of PDMS and hexane. We investigated the effects of the index-matching layer on the color and reflectance differences with different PDMS dilution ratios. As the dilution ratio increased from 1:100 to 1:130, the color difference increased slightly, while the reflectance difference decreased from 0.62 to 0.32. The MTO/Ag/MTO/PDMS/MTO film showed a transmittance of 87.18~87.68% at 550 nm. The highest value of the Haacke figure of merit was $47.54{\times}10^{-3}{\Omega}^{-1}$ for the dilution ratio of 1:130.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.26 no.7
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• pp.510-514
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• 2013

In order to prevent heat loss that occurs through the glass, low-emissivity (Low-E) coating methods with good insulating properties and high transmittance were used. InGaZnO/Ag/InGaZnO (IGZO/Ag/IGZO) multilayer thin films have been deposited on XG glass substrate by RF magnetron sputtering. Depending on the different thickness of Ag in multilayer films, the structural and optical properties of Low-E multilayer films were analyzed. By XRD analysis results, the multilayer thin films were observed to be amorphous structure regardless of Ag thickness. According to the AFM results, surface morphology of the multilayer films was observed and compared. Using UV-VIS spectroscopy, low emissivity property has been observed clearly with the transmittance of higher than 85% at visible range and lower than 30% at IR range.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.32 no.2
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• pp.134-140
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• 2019

Oxide ($SnO_2$)/metal alloy (Cu(Ni))/oxide ($SnO_2$) multilayer films were fabricated using the magnetron sputtering technique. The oxide and metal alloy were $SnO_2$ and Ni-doped Cu, respectively. The structural, optical, and electrical properties of the multilayer films were investigated using X-ray diffraction (XRD), ultraviolet-visible (UV-vis) spectrophotometry, and 4-point probe measurements, respectively. The properties of the $SnO_2/Cu(Ni)/SnO_2$ multilayer films were dependent on the thickness and Ni doping of the mid-layer film. Since Ni atoms inhibit the diffusion and aggregation of Cu atoms, the grain growth of Cu is delayed upon Ni addition. For $250^{\circ}C$, the Haccke's figure of merit (FOM) of the $SnO_2$ (30 nm)/Cu(Ni) (8 nm)/$SnO_2$ (30 nm) multilayer film was evaluated to be $0.17{\times}10^{-3}{\Omega}^{-1}$.