• 한국진공학회:학술대회논문집
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• 한국진공학회 2012년도 제42회 동계 정기 학술대회 초록집
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• pp.484-484
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• 2012

OLED는 유기재료를 사용하는 특수성 때문에 선명한 고품질의 화질을 얻을 수 있다. 유기재료에 따른 수명이 정해져 있지만 열에 약한 재료를 사용하기 때문에 출력되는 색의 변화를 동반할 만큼 불안정 하다. OLED는 RGB를 순서에 따라 유리 기판 상에 나열한 구조이며 각 화소의 양극과 음극은 가로와 세로로 서로 직교하고 있다. 이러한 OLED의 구조 때문에 직, 간접적으로 전이되는 열과 OLED Device에서 발생하는 자체 열로 인하여 유기소자의 특성이 변형되는, 이른바 열화현상에 쉽게 노출되어 있다. OLED Device를 제작한 후 72시간동안 8V의 전압을 인가하여 열화현상을 촉진시킨 Aging샘플을 확보 하였다. Aging된 Device의 인가전압을 3V ~ 6V까지 변화를 주고 측정해본 결과 각각의 모든 전압에서 Aging Device의 Nomalized Intensity가 상대적으로 20% 감소했음을 확인 하였다. 또한 Aging 된 Device는 As is Device에 비해 단파장 쪽으로 Shift 되는 결과를 보여주었다. 이를 분석하기 위해 CIE 색 좌표계의 NTSC (National Television System(s) Committee)를 이용하였는데, 범위 안에 있던 As is Device의 색 좌표가 Aging 후에는 NTSC범위 밖으로 이동하였는데, 이는 열화현상이 발생하기 전에 비해 방출되는 빛의 파장이 변했다는 것을 의미하며 정확한 색 재현이 안 된다는 것을 보여준다. 또한 I-V특성을 보면 Aging Device의 구동전압 (3.3V) 이 As is Device (2.7V) 에 비해 더 커지는 것을 확인하였는데 이것은 스트레스로 인해서 발생한 트랩에 의하여 캐리어의 이동도가 떨어졌기 때문에 구동 전압이 증가한 것으로 확인할 수 있다. 연구 결과를 통하여 OLED Device의 사용시간 누적에 따른 열화현상은 색 재현성과 휘도의 저하 그리고 구동전압 증가에 영향을 미친다는 것을 확인 하였다.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2007년도 7th International Meeting on Information Display 제7권2호
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• pp.1658-1660
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• 2007

We fabricate green device having unique life time characteristics of operating voltage reduction with time, ${\Delta}V_{op}$ <0. A green device needs lower voltage than initial voltage for sustaining constant current as life time goes on. It means there are two possible reasons; one is interface modification between anode and HIL due to oxygen plasma treatment and the other is bulk property modification due to combination of new green host and new green dopant. From these materials and oxygen plasma treatment, we can make white OLED device having the characteristics of low ${\Delta}V_{op}$ increasing.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2014년도 제46회 동계 정기학술대회 초록집
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• pp.95-95
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• 2014

An OLED(Organic Light-Emitting Diode) device based on the emissive electroluminescent layer a film of organic materials. OLED is used for many electronic devices such as TV, mobile phones, handheld games consoles. ULVAC's mass production systems are indispensable to the manufacturing of OLED device. ULVAC is a manufacturer and worldwide supplier of equipment and vacuum systems for the OLED, LCD, Semiconductor, Electronics, Optical device and related high technology industries. The SMD Series are single-substrate sputtering systems for deposition of films such as metal films and TCO (Transparent Conductive Oxide) films. ULVAC has delivered a large number of these systems not only Organic Evaporating systems but also LTPS CVD systems. The most important technology of thin-film encapsulation (TFE) is preventing moisture($H_2O$) and oxygen permeation into flexible OLED devices. As a polymer substrate does not offer the same barrier performance as glass substrate, the TFE should be developed on both the bottom and top side of the device layers for sufficient lifetimes. This report provides a review of promising thin-film barrier technologies as well as the WVTR(Water Vapor Transmission Rate) properties. Multilayer thin-film deposition technology of organic and inorganic layer is very effective method for increasing barrier performance of OLED device. Gases and water in the organic evaporating system is having a strong influence as impurities to OLED device. CRYO pump is one of the very useful vacuum components to reduce above impurities. There for CRYO pump is faster than conventional TMP exhaust velocity of gases and water. So, we suggest new method to make a good vacuum condition which is CRYO Trap addition on OLED evaporator. Alignment accuracy is one of the key technologies to perform high resolution OLED device. In order to reduce vibration characteristic of CRYO pump, ULVAC has developed low vibration CRYO pumps to achieve high resolution alignment performance between Metal mask and substrate. This report also includes ULVAC's approach for these issues.

• 대한안전경영과학회지
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• 제10권4호
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• pp.145-152
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• 2008

According to the Korea Agency for Technology and Standards under the Commerce Ministry, OLED device's lifetime is defined 50% drop of luminance. OLED device is self-emitting operating device, that means it becomes different color between pixels under using environment. That's reason of the different luminance drop ratio & chromaticity coordinates shift ratio with time. The problem is there is not recovered after luminance drop and color shift. We can recognize the difference of color as image sticking. First we studied when human recognize the difference of color and second we apply the method of OLED device's lifetime test that's able to check different color between pixels.

• 대한안전경영과학회:학술대회논문집
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• 대한안전경영과학회 2008년도 추계학술대회
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• pp.131-143
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• 2008

According to the Korea Agency for Technology and Standards under the Commerce Ministry, OLED device's lifetime is defined 50% drop of luminance. OLED device is self-emitting operating device, that means it becomes different color between pixels under using environment. That's reason of the different luminance drop ratio & chromaticity coordinates shift ratio with time. The problem is there is not recovered after luminace drop and color shift. We can recognize the difference of color as image sticking. First we studied when human recognize the difference of color and second we apply the method of OLED device's lifetime test that's able to check different color between pixels

• 한국재료학회지
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• 제28권1호
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• pp.18-23
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• 2018

To study the impedance characteristics of a fluorescent OLED according to the device structure, we fabricated Device 1 using ITO / NPB / $Alq_3$ / Liq / Al, Device 2 using ITO / 2-TNATA / NPB / $Alq_3$ / Liq / Al, and Device 3 using ITO / 2-TNATA / NPB / SH-1:BD / $Alq_3$ / Liq / Al. The current density and luminance decreased with an increasing number of layers of the organic thin films in the order of Device 1, 2, 3, whereas the current efficiency increased. From the Cole-Cole plot at a driving voltage of 6 V, the maximum impedance values of Devices 1, 2, and 3 were respectively 51, 108, and $160{\Omega}$ just after device fabrication. An increase in the impedance maximum value is a phenomenon caused by the charge mobility and the resistance between interfaces. With the elapse of time after the device fabrication, the shape of the Cole-Cole plot changed to a form similar to 0 or a lower voltage due to the degradation of the device. As a result, we were able to see that an impedance change in an OLED reflects the characteristics of the degradation and the layer.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2006년도 6th International Meeting on Information Display
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• pp.987-989
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• 2006

1.52" $130(RGB){\times}130$ full color PM OLED device with $70\;{\mu}m{\times}210\;{\mu}m$ of sub-pixel pitch was fabricated using shadow mask method for metal cathode deposition. Instead of conventional patterning process to form cathode separator via photolithography, regularly patterned shadow mask was applied to deposit metal cathode in this OLED display. Metal cathode was patterned via 2-step evaporation using shadow mask with shape of rectangular stripe and its alignment margin is $2.5\;{\mu}m$. Technical advantages of this method include reduction of process time according to skipping over photolithographic process for cathode separator and minimizing pixel shrinkage caused by PR cathode separator as well as improving lifetime of OLED device.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2009년도 9th International Meeting on Information Display
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• pp.758-761
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• 2009

The electroluminescent devices with the phenylnaphthyldiamine HTMs as the hole-transporting layer were more efficient than that with the biphenyldiamine HTM 1. Particularly, the life-time of the device IV using HTM 2 is about two times longer than that of the reference device III with HTM 1 within the measured current density, indicating more effective recombination at the emitting layer of device IV.

• 대한안전경영과학회:학술대회논문집
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• 대한안전경영과학회 2009년도 춘계학술대회
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• pp.523-529
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• 2009

The ACF(Anisotropic Conductive Film) is used for bonding Drive IC and OLED display device panel. If ACF bonding process is problem, a malfunction of line defect can occur. Because electric resistance increase between the panel and drive IC after a period of time, drive IC can not supply enough current to the panel. This paper is studied on a method of test for line defect.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2009년도 9th International Meeting on Information Display
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• pp.1212-1215
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• 2009

The theoretical equations for J-V characteristics in an OLED was derived according to the internal carrier emission equation based on a diffusion model at Schottky barrier contact and the mobility equation based on the Pool-Frenkel model. The J-V characteristics of OLED are presented using a behavioral model for analog systems (Verilog-A language), and the accuracy of this model was verified by comparing with the device simulation results.