• 한국진공학회:학술대회논문집
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• 한국진공학회 2012년도 제42회 동계 정기 학술대회 초록집
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• pp.312-312
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• 2012

Magnesium oxide has become focus for research activities due to its use in magnetic tunnel junctions and for understanding of do ferromagnetism. Theoretical investigations on such type of system indicate that the presence of defects greater than a threshold value is responsible for the magnetic behaviour. It has also been shown experimentally that by decreasing the film thickness and size of nanoparticles, enhancement/increase in magnetization can be achieved. Apart from the change in dimension, swift heavy ions (SHI) are well known for creating defects and modifying the properties of the materials. In the present work, we have studied the irradiation induced effects in magnesium oxide thin film deposited on quartz substrate via X-ray absorption spectroscopy (XAS). Magnesium oxide thin films of thickness 50nm were deposited on quartz substrate by using e-beam evaporation method. These films were irradiated by 200 MeV Ag15+ ion beam at fluence of $1{\times}10^{11}$, $5{\times}10^{11}$, $1{\times}10^{12}$, $3{\times}10^{12}$ and $5{\times}10^{12}ions/cm^2$ at Nuclear Science Centre, IUAC, New Delhi (India). The grain size was observed (as studied by AFM) to be decreased from 37 nm (pristine film) to 23 nm ($1{\times}10^{12}ions/cm^2$) and thereafter it increases upto a fluence of $5{\times}10^{12}ions/cm^2$. The electronic structure of the system has been investigated by X-ray absorption spectroscopy (XAS) measurements performed at the high energy spherical grating monochromator 20A1 XAS (HSGM) beamline in the National Synchrotron Radiation Research Center (NSRRC), Taiwan. Oxides of light elements like MgO/ZnO possess many unique physical properties with potentials for novel application in various fields. These irradiated thin films are also studied with different polarization (left and right circularly polarized) of incident x-ray beam at 05B3 EPU- Soft x-ray scattering beamline of NSRRC. The detailed analysis of observed results in the wake of existing theories is discussed.

• 방사성폐기물학회지
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• 제11권3호
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• pp.245-251
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• 2013

NaI(Tl) 섬광검출기로 측정한 에너지 스펙트럼으로부터 공간 감마 선량률을 계산하기 위하여 에너지밴드 방법과 G-factor 방법의 결과를 비교 검토하였다. 먼저 한국원자력연구원 내 운영 중인 환경방사선감시기 EFRD 3300에 장착된 3"${\Phi}X3$" NaI(Tl) 검출기의 G-factor를 MCNP 모델링을 통하여 입사 방사선의 방향에 따라 각각 구하였으며, 이로부터 계산된 선량률과 에너지밴드 방법으로 계산된 결과의 차이를 비교 검토함으로써 EFRD 3300에 적용 가능한 최적의 G-factor 값을 유도하였다. 그리고 EFRD 3300 방사선감시기가 운영되고 있는 지역 주변에 위치한 HPIC 방사선감시기의 선량률과 비교 검토를 수행하였으며, 3"${\Phi}X3$" NaI(Tl) 검출기 기반의 EFRD 3300에서 $7.7{\mu}R/h$의 측정값을 얻어 약 $3{\mu}R/h$ 정도의 차이를 보였다. 일반적으로 HPIC 방사선감시기는 고에너지 우주방사선량도 측정할 수 있는 것으로 알려져 있으므로, 이 차이는 3"${\Phi}X3$" NaI 계측기로 측정되지 못하는 고에너지 영역의 우주방사선에 의한 영향으로 평가할 수 있었다.