• Proceedings of the Korean Vacuum Society Conference
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• 2012.02a
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• pp.312-312
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• 2012

Magnesium oxide has become focus for research activities due to its use in magnetic tunnel junctions and for understanding of do ferromagnetism. Theoretical investigations on such type of system indicate that the presence of defects greater than a threshold value is responsible for the magnetic behaviour. It has also been shown experimentally that by decreasing the film thickness and size of nanoparticles, enhancement/increase in magnetization can be achieved. Apart from the change in dimension, swift heavy ions (SHI) are well known for creating defects and modifying the properties of the materials. In the present work, we have studied the irradiation induced effects in magnesium oxide thin film deposited on quartz substrate via X-ray absorption spectroscopy (XAS). Magnesium oxide thin films of thickness 50nm were deposited on quartz substrate by using e-beam evaporation method. These films were irradiated by 200 MeV Ag15+ ion beam at fluence of $1{\times}10^{11}$, $5{\times}10^{11}$, $1{\times}10^{12}$, $3{\times}10^{12}$ and $5{\times}10^{12}ions/cm^2$ at Nuclear Science Centre, IUAC, New Delhi (India). The grain size was observed (as studied by AFM) to be decreased from 37 nm (pristine film) to 23 nm ($1{\times}10^{12}ions/cm^2$) and thereafter it increases upto a fluence of $5{\times}10^{12}ions/cm^2$. The electronic structure of the system has been investigated by X-ray absorption spectroscopy (XAS) measurements performed at the high energy spherical grating monochromator 20A1 XAS (HSGM) beamline in the National Synchrotron Radiation Research Center (NSRRC), Taiwan. Oxides of light elements like MgO/ZnO possess many unique physical properties with potentials for novel application in various fields. These irradiated thin films are also studied with different polarization (left and right circularly polarized) of incident x-ray beam at 05B3 EPU- Soft x-ray scattering beamline of NSRRC. The detailed analysis of observed results in the wake of existing theories is discussed.

• Journal of Nuclear Fuel Cycle and Waste Technology(JNFCWT)
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• v.11 no.3
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• pp.245-251
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• 2013

The energy band and the G-factor method were compared to determine the exposure rate from the measured spectrum using a NaI(Tl) scintillation detector. First, G-factors of a 3"${\Phi}X3$" NaI(Tl) detector mounted to a EFRD 3300, which means the environmental radiation monitor, in Korea Atomic Energy Research Institute (KAERI) were calculated for several directions of incident photons through the MCNP modeling, and the optimum G-factor applicable to that monitor was then determined by comparing the results both the energy band method and the G-factor method. The results for these spectrometric determinations were also compared with the dose rate from a HPIC radiation monitor around a EFRD 3300. The measured value at the EFRD 3300 based on a 3"${\Phi}X3$" NaI(Tl) detector was $7.7{\mu}R/h$ and its difference was shown about $3{\mu}R/h$, when compared with the results from a HPIC radiation moditor. Since a HPIC is known to be able to measure cosmic rays with the relatively high energy, the difference between them was caused by cosmic rays which were not detected in a 3"${\Phi}X3$" NaI(Tl) detector.