• The Sea:JOURNAL OF THE KOREAN SOCIETY OF OCEANOGRAPHY
• /
• v.24 no.4
• /
• pp.495-508
• /
• 2019

Tidal datums are key and basic information used in fields of navigation, coastal structures' design, maritime boundary delimitation and inundation warning. In Korea, the Approximate Lowest Low Water (ALLW) and the Approximate Highest High Water (AHHW) have been used as levels of tidal datums for depth, coastline and vertical clearances in hydrography and coastal engineering fields. However, recently the major maritime countries including USA, Australia and UK have adopted the Lowest Astronomical Tide (LAT) and the Highest Astronomical Tide (HAT) as the tidal datums. In this study, 1-hr interval 19-year sea level records (1999-2017) observed at 9 tidal observation stations along the west and south coasts of Korea were used to calculate LAT and HAT for each station using 1-minute interval 19-year tidal prediction data yielded through three tidal harmonic methods: 19 year vector average of tidal harmonic constants (Vector Average Method, VA), tidal harmonic analysis on 19 years of continuous data (19-year Method, 19Y) and tidal harmonic analysis on one year of data (1-year Method, 1Y). The calculated LAT and HAT values were quantitatively compared with the ALLW and AHHW values, respectively. The main causes of the difference between them were explored. In this study, we used the UTide, which is capable of conducting 19-year record tidal harmonic analysis and 19 year tidal prediction. Application of the three harmonic methods showed that there were relatively small differences (mostly less than ±1 cm) of the values of LAT and HAT calculated from the VA and 19Y methods, revealing that each method can be mutually and effectively used. In contrast, the standard deviations between LATs and HATs calculated from the 1Y and 19Y methods were 3~7 cm. The LAT (HAT) differences between the 1Y and 19Y methods range from -16.4 to 10.7 cm (-8.2 to 14.3 cm), which are relatively large compared to the LAT and HAT differences between the VA and 19Y methods. The LAT (HAT) values are, on average, 33.6 (46.2) cm lower (higher) than those of ALLW (AHHW) along the west and south coast of Korea. It was found that the S_a and N₂ tides significantly contribute to these differences. In the shallow water constituents dominated area, the M₄ and MS₄ tides also remarkably contribute to them. Differences between the LAT and the ALLW are larger than those between the HAT and the AHHW. The asymmetry occurs because the LAT and HAT are calculated from the amplitudes and phase-lags of 67 harmonic constituents whereas the ALLW and AHHW are based only on the amplitudes of the 4 major harmonic constituents.

• Journal of Technology Innovation
• /
• v.26 no.3
• /
• pp.37-68
• /
• 2018

Since the 20th century, automobiles, which are the most common means of transportation, have been evolving as the use of electronic control devices and automotive semiconductors increases dramatically. Automotive semiconductors are a key component in automotive electronic control devices and are used to provide stability, efficiency of fuel use, and stability of operation to consumers. For example, automotive semiconductors include engines control, technologies for managing electric motors, transmission control units, hybrid vehicle control, start/stop systems, electronic motor control, automotive radar and LIDAR, smart head lamps, head-up displays, lane keeping systems. As such, semiconductors are being applied to almost all electronic control devices that make up an automobile, and they are creating more effects than simply combining mechanical devices. Since automotive semiconductors have a high data rate basically, a microprocessor unit is being used instead of a micro control unit. For example, semiconductors based on ARM processors are being used in telematics, audio/video multi-medias and navigation. Automotive semiconductors require characteristics such as high reliability, durability and long-term supply, considering the period of use of the automobile for more than 10 years. The reliability of automotive semiconductors is directly linked to the safety of automobiles. The semiconductor industry uses JEDEC and AEC standards to evaluate the reliability of automotive semiconductors. In addition, the life expectancy of the product is estimated at the early stage of development and at the early stage of mass production by using the reliability test method and results that are presented as standard in the automobile industry. However, there are limitations in predicting the failure rate caused by various parameters such as customer's various conditions of use and usage time. To overcome these limitations, much research has been done in academia and industry. Among them, researches using data mining techniques have been carried out in many semiconductor fields, but application and research on automotive semiconductors have not yet been studied. In this regard, this study investigates the relationship between data generated during semiconductor assembly and package test process by using data mining technique, and uses data mining technique suitable for predicting potential failure rate using customer bad data.