• Title/Summary/Keyword: NHTs

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Analysis on the Operation of a Charging Station with Battery Energy Storage System

  • Zhu, Lei;Pu, Yongjian
    • Journal of Electrical Engineering and Technology
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    • v.12 no.5
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    • pp.1916-1924
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    • 2017
  • Fossil oil, as the main energy of transportation, is destined to be exhausted. The electrification of transportation is a sustainable solution to the energy crisis, since electric power could be acquired from the inexhaustible sun, wind and water. Among all the problems that hinder the development of Electric Vehicle (EV) industry, charging issue might be the most prominent one. In this paper, the service process of a charging station with Battery Energy Storage System (BESS) is analyzed by means of $Cram{\acute{e}}r$ - Lundberg model which has been intensively utilized in ruin theory. The service quality is proposed in two dimensions: the service efficiency and the service reliability. The arrival rate and State of Charge (SOC) upon arrival are derived from 2009 National Household Travel Survey (NHTS). The simulations are performed to show how the service quality is determined by the system parameters such as the number of servers, the service rate, the initial capacity, the charge rate and the maximum waiting time. At last, the economic analysis of the system is conducted and the best combination of the system parameters are given.

Trapping and Detrapping of Transport Carriers in Silicon Dioxide Under Optically Assisted Electron Injection

  • Kim, Hong-Seog
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.1 no.3
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    • pp.158-166
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    • 2001
  • Based on uniform hot carrier injection (optically assisted electron injection) across the $Si-SiO_2$ interface into the gate insulator of n-channel IGFETs, the threshold voltage shifts associated with electron injection of $1.25{\times}l0^{16}{\;}e/\textrm{cm}^2 between 0.5 and 7 MV/cm were found to decrease from positive to negative values, indicating both a decrease in trap cross section ($E_{ox}{\geq}1.5 MV/cm$) and the generation of FPC $E_{ox}{\geq}5{\;}MV/cm$). It was also found that FNC and large cross section NETs were generated for $E_{ox}{\geq}5{\;}MV/cm$. Continuous, uniform low-field (1MV/cm) electron injection up to $l0^{19}{\;}e/\textrm{cm}^2 is accompanied by a monatomic increase in threshold voltage. It was found that the data could be modeled more effectively by assuming that most of the threshold voltage shift could be ascribed to generated bulk defects which are generated and filled, or more likely, generated in a charged state. The injection method and conditions used in terms of injection fluence, injection density, and temperature, can have a dramatic impact on what is measured, and may have important implications on accelerated lifetime measurements.

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