• Macromolecular Research
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• v.10 no.5
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• pp.282-285
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• 2002

In this paper, we report a modified technique for the production of oriented continuous nanofibers instead of non-woven mats using a rapidly rotating collection device. We are interested in retaining physical properties such as electrical conductivity of fiber bundles in their axial direction. The experiments were performed using polyethylene oxide (PEO) and its blend with polyaniline (PANI). According to the results, a typical fiber with a uniform diameter of about 100 nanometer was produced. The fibers from the PEO/ CHCl$_3$ solution show high crystallinity and good orientation whereas the fibers from the blend solution of PEO/PANI/m-cresol and CHCl$_3$ show no preferred orientation. However, the fibers of the blend exhibit high electrical conductivity of 33 S/cm for a fiber bundle at a PANI level of 50 %.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.02a
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• pp.181-181
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• 2013

Recently, nanostructure and the molecular orientation of organic thin films have been largely paid attention due to its importance in organic electronics such as organic thin film transistors (OTFTs), organic light emitting diodes (OLEDs), and organic photovoltaics (OPVs). Among various methods, the diffraction and scattering techniques based on synchrotron x-rays have shown powerful results in organic thin film systems. In this work, we introduce the in-situ annealing system installed at PLS-II (Pohang Light Source II) for organic thin films by simultaneously conducting various x-ray scattering measurements of x-ray reflectivity, conventional x-ray scattering, grazing incidence wide angle x-ray scattering (GI-WAXS) and so on. Using the in-situ measurement, we could obtain real time variation of nanostructure as well as molecular orientation during thermal annealing in metal-phthalocyanine thin films. The variation of surface and interface also could be simultaneously investigated by the x-ray reflectivity measurement.

• Journal of the Korean Vacuum Society
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• v.4 no.4
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• pp.367-372
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• 1995

We investigate the Au(001) surface reconstruction, numerically, by Molecular Dynamics (MD) simulation. We find that the top-most layer of Au(001) surface is reconstructed to a contracted hexagonal face, and relaxed about 0.05$\AA$ upward at room temperature. The contraction ratio with respect to a unreconstructed Au(111) surface is about 3.5%. The hexagonal layer is slightly distorted and buckled. The surface corrugation is found to be about 0.28$\AA$ on average. In our earlier work we have predicted the in-plane orientation of the reconsturcted layer to be either $0^{\circ}$ or $0.7^{\circ}$ depending on the size of the cluster. However, we find only $0.0^{\circ}$ in this simulation because the size of the cluster correspoding to the $0.7^{\circ}$ orientation is larger than the current limitation of MD simulation. These findings are in good agreement with experimental results.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.20 no.11
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• pp.969-976
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• 2007

In this thesis, an anchoring energy in the upper and lower substrates of TFT-LCD cell has been modeled and applied in the numerical calculation of the molecular orientation of the TN-LCD. The molecular orientation of liquid crystals defined as tilt and twist angles was simulated using the Newton-Raphson method and the Gaussian integration method. From the results, the tilt and twist angles for the strong anchoring energy were proven to be coincide with those of the conventional results. on the other hand, for the weak anchoring energy, azimuth angles of the molecules were changed abruptly from $0^{\circ}\;to\;90^{\circ}$ near the middle area of the cell due to the balance of the anchoring energy and the elastic energy of the liquid crystals.

• Proceedings of the Korean Fiber Society Conference
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• 1987.06a
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• pp.12-13
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• 1987

• Proceedings of the Materials Research Society of Korea Conference
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• 2001.05a
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• pp.124-124
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• 2001

• Bulletin of the Korean Chemical Society
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• v.35 no.3
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• pp.783-792
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• 2014

The binding interaction between a hemolytic peptide ${\delta}$-lysin and a zwitterionic lipid bilayer POPC was investigated through a series of molecular dynamics (MD) simulations. ${\delta}$-Lysin is a 26-residue, amphipathic, ${\alpha}$-helical peptide toxin secreted by Staphylococcus aureus. Unlike typical antimicrobial peptides, ${\delta}$-lysin has no net charge and it is often found in aggregated forms in solution even at low concentration. Our study showed that only the monomer, not dimer, inserts into the bilayer interior. The monomer is preferentially attracted toward the membrane with its hydrophilic side facing the bilayer surface. However, peptide insertion requires the opposite orientation where the hydrophobic side of peptide points toward the membrane interior. Such orientation allows the charged residues, Lys and Asp, to have stable salt bridges with the lipid head-group while the hydrophobic residues are buried deeper in the hydrophobic lipid interior. Our simulations suggest that breaking these salt bridges is the key step for the monomer to be fully inserted into the center of lipid bilayer and, possibly, to translocate across the membrane.

• Polymer(Korea)
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• v.35 no.5
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• pp.493-498
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• 2011

Reactive mesogens were used to prepare photo-cured liquid crystal films in which orientations of liquid crystal molecules were preserved by crosslinked networks of cured reactive mesogens. The molecular orientations of liquid crystal mixtures of photo-reative mesogens and non-reactive nematic liquid crystals were studied and compared before and after curing reactions. The effects of temperature and the amount of the non-reactive nematic liquid crystal in the mixture on birefringence of the liquid crystal films were investigated. It was found that optical compensation films with different birefringence could be prepared by controlling the amount of the nematic liquid crystals in the reactive mesogen mixtures.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.13 no.10
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• pp.828-833
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• 2000

Growth characteristics and microstructure of AIN thin films grown by plasma assisted molecular beam epitaxy on Si substrates have been investigated. Growing temperature and substrate orientation were chosen as major variables of the experiment. Reflection high energy electron diffraction (RHEED), X-ray diffraction (XRD), atomic force microscopy (AFM) and transmission electron microscopy/diffraction (TEM/TED) techniques were employed to characterize the micorstructure of the films. On Si(100) substrates, AlN thin films were grown along the hexagonal c-axis preferred orientation at temperature range 850-90$0^{\circ}C$. However on Si(111), the AlN films were epitaxially grown with directional coherency in AlN(0001)/Si(111), AlN(1100)/Si(110), and AlN(1120)/Si(112) at 85$0^{\circ}C$ and the epitaxial coherencry seemed to be slightly distorted with increasing temperature. The microstructure of AlN thin films on Si(111) substrates showed that the films include a lot of crystal defects and there exist micro-gaps among the columns.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.07a
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• pp.111-114
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• 2000

Growth characteristics and microstructure of AlN thin films grown by plasma assisted molecular beam epitaxy on Si substrates have been investigated. Growing temperature and substrate orientation were chosen as major variables of the experiment. Reflection high energy electron diffraction (RHEED), X-ray diffraction (XRD), atomic force microscopy (AFM) and transmission electron microscopy/diffraction (TEM/TED) techniques were employed to characterize the microstructure of the films. On Si(100) substrates, AlN thin films were grown along the hexagonal c-axis preferred orientation at temperature range 850-90$0^{\circ}C$. However on Si(111), the AlN films were epitaxially grown with directional coherency in AlN(0001)/Si(111), AlN(1100)/Si(110), and AlN(1120)/Si(112) at 85$0^{\circ}C$ and the epitaxial coherencry seemed to be slightly distorted with increasing temperature. The microstructure of AlN thin films on Si(111) substrates showed that the films include a lot of crystal defects and there exist micro-gaps among the columns.