• Title/Summary/Keyword: Microwave reflection

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Complex Quadruplet Zero Locations from the Perturbed Values of Cross-Coupled Lumped Element

  • Um, Kee-Hong
    • International journal of advanced smart convergence
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    • v.6 no.4
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    • pp.33-40
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    • 2017
  • In this paper, complex quadruplet zeros of microwave filter systems are investigated. For the cascaded systems the chain matrices are most conveniently used to derive the voltage transfer function of Laplace transform with cascaded two-port subsystems. The convenient relations of transfer function and chain matrix are used in order to find the transmission zeros. Starting from a ladder network, we introduced a crossed-coupled lumped element, in order to show the improved response of bandpass filter. By solving the transmission zero characteristic equation derived from the cascaded subsystems, we found the zeros of filter system with externally cross-coupled lumped elements. With the cross-coupled elements of capacitors, the numerator polynomial of system transfer function is used to locate the quadruplet zeros in complex plane. When the two pairs of double are on the zeros -axis, with the perturbed values of element, we learned that the transition band of lowpass filter is improved. By solving the characteristic equation of cascaded transfer function, we can obtain the zeros of the cross-coupled filter system, as a result of perturbed values on lumped element.

Estimation of mechanical damage by minority carrier recombination lifetime and near surface micro defect in silicon wafer (실리콘 웨이퍼에서 소수 반송자 재결합 수명과 표면 부위 미세 결함에 의한 기계적 손상 평가)

  • 최치영;조상희
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.9 no.2
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    • pp.157-161
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    • 1999
  • We investigated the effect of mechanical back side damage in Czochralski silicon wafer. The intensity of mechanical damage was evaluated by minority carrier recombination lifetime by laser excitation/microwave reflection photoconductance decay ($\mu$-PCD) technique, wet oxidation/preferential etching methods, near surface micro defect (NSMD) analysis, and X-ray section topography. The data indicate that the higher the mechanical damage intensity, the lower the minority carrier lifetime, and NSMD density increased proportionally, also correlated to the oxidation induced stacking fault (OISF) density. Thus, NSMD technique can be used separately from conventional etching method in OISF measurement.

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Evaluation of mechanical backside damage by minority carrier recombination lifetime and photo-acoustic displacement method in silicon wafer (실리콘 웨이퍼에서 광열 변위법과 소수 반송자 재결합 수명 측정에 의한 기계적 후면 손상 평가)

  • 최치영;조상희
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.8 no.1
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    • pp.117-123
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    • 1998
  • We investigated the effect of mechanical backside damage in Czochralski grown silicon wafer. The intensity of mechanical damage was evaluated by minority carrier recombination lifetime by laser excitation/microwave reflection photoconductivity decay method, photo-acoustic displacement method, X-ray section topography, and wet oxidation/preferential etching methods. The data indicate that the higher the mechanical damage intensity, the lower the minority carrier lifetime, and the photo-acoustic displacement values increased proportionally, and it was at Grade 1: Grade 2:Grade 3 = 1:19.6:41 that the normalized relative quantization ratio of excess photo-acoustic displacement in damaged wafer was calculated, which are normalized to the excess PAD from sample Grade 1.

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Electical and Electomagnetic wave Absorbing Properties of MnZn Ferrite-Rubber Composites in Microwave Frequencies (MnZn계 페라이트-고무 복합체의 마이크로파대역에서의 전기적 특성 및 전자파 흡수 특성)

  • 김호철;이병택;정연춘;엄진섭
    • The Proceeding of the Korean Institute of Electromagnetic Engineering and Science
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    • v.4 no.2
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    • pp.41-47
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    • 1993
  • Electrical and electromagnetic wave absorbing properties of MnZn ferrite-rubber composites have been examined for varying the volume fraction of ferrite powder from 0.1 to 0.4 in the frequency range between 1-10 GHz. As the volume fraction of MnZn ferrite increased, the complex permittivity and permeability of composite increased. The peak of reflection loss at the frequency corresponding to 1/4 wavelength shifts to lower frequency, and shifts to lower frequency as the thickness of absorber increased. We show that for the ferrite-rubber composites the volume fraction of ferrite should be controled to obtain the absorbing properties required in given frequency range.

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Relative quantitative evaluation of mechanical damage layer by X-ray diffuse scattering in silicon wafer surface (실리콘 웨이퍼 표면에서 X-선 산만산란에 의한 기계적 손상층의 상대 정량 평가)

  • 최치영;조상희
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.8 no.4
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    • pp.581-586
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    • 1998
  • We investigated the effect of mechanical back side damage in Czochralski grown silicon wafer. The intensity of mechanical damage was evaluated by minority carrier recombination lifetime by laser excitation/microwave reflection photoconductivity decay method, degree of X-ray diffuse scattering, X-ray section topography, and wet oxidation/preferential etching methods. The data indicate that the higher the mechanical damage intensity, the lower the minority carrier lifetime, and the magnitude of diffuse scattering and X-ray excess intensity increased proportionally, and it was at Grade 1:Grade 2:Grade 3=1:7:18.4 that the normalized relative quantization ratio of excess intensity in damaged wafer was calculated, which are normalized to the excess intensity from sample Grade 1.

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Characteristics of Spectral Reflectance in Tidal Flats

  • Ryu, Joo-Hyung;Na, Young-Ho;Choi, Jong-Kook;Won, Joong-Sun
    • Proceedings of the KSRS Conference
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    • 2002.10a
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    • pp.734-738
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    • 2002
  • We present spectral characteristics of tidal flat sediments and algal mat that were tested in the Gomso and Saemangum tidal flats, Korea. The objective of this study is to investigate the spectral reflectance and the radar scattering modeling in the tidal flats. Ground truth data obtained in the tidal flats include grain size, soil moisture content and its variation with time, surface roughness, chlorophyll, ground leveling, and field spectral reflectance measurement. The concept of an effective exposed area (EEA) is introduced to accommodate the effect of remnant surface water, and it seriously affects the reflection of short wavelength infrared and microwave. The nin size of 0.0625 mm has been normally used as a critical size of mud and sand discrimination. But we propose here that 0.25 mm is more practical grain size criterion to discriminate by remote sensing. Algal mat is the primary product in tidal flats, and it is found to be very important to understand spectral characteristics for tidal flat remote sensing. We have also conducted radar scattering modeling, and showed L-band HV-polarization would be the most effective combination.

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Soil Moisture Content Estimation Using Remote Sensing Technique (원격 측정 기법을 이용한 토양 함수비의 측정)

  • Lee, Jae Soo
    • KSCE Journal of Civil and Environmental Engineering Research
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    • v.14 no.3
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    • pp.535-542
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    • 1994
  • Remote sensing technique is based on the estimation of land surface characteristics from the measurement of the emitted radiation from the earth. The hydrologically related parameters studied using this approach include surface temperature, evapotranspiration, soil moisture, precipitation and snow. This study introduces a method for estimating moisture content of a bare soil from the observed and simulated brightness temperature. In a bare soil, microwave emission depends on moisture content, soil temperature, and surface roughness. The method is based on a radiative transfer model with some modifications of Fresnel reflection coefficient to take into account the effect of surface roughness. One smooth bare field and two fields with different surface roughness are prepared for the study. The results indicate that the effect of surface roughness is to increase the soil's brightness temperature and to reduce the slope of regression between brightness temperature and moisture contents.

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Complex Dielectric Constant Measurements for Conductor-Loaded Composite Materials Using Genetic Algorithms (유전알고리듬을 이용한 도체 입자가 함유된 복합물질의 복수유전율 측정)

  • Lee, Sang-Il
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.30 no.2C
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    • pp.10-15
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    • 2005
  • In this paper, a simple but fast and reliable technique for the complex dielectric constant measurement of non-magnetic materials is introduced using a measured transmission coefficient (S21) and a genetic algorithm as an inversion process at microwave frequencies. In this experiment, it has been found that the transmission method is less susceptible with the measurement errors than that of the reflection method and the genetic algorithm can be efficiently used as a search technique. The suggested technique is validated with known and unknown conductor-loaded lossy materials and the conductor-loaded PCB at X-band.

Compact Mobile Quad-Band Slot Antenna Design for GPS L1, WiMAX, and WLAN Applications

  • Piao, Haiyan;Jin, Yunnan;Tak, Jinpil;Choi, Jaehoon
    • Journal of electromagnetic engineering and science
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    • v.17 no.2
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    • pp.57-64
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    • 2017
  • In this paper, an asymmetric compact multiband slot antenna is proposed for global positioning system (GPS), worldwide interoperability for microwave access (WiMAX), and wireless area network (WLAN) applications. The top plane, a ground is composed of a rectangular slot with a trapezoidal-like stub, an inverted U-shaped slot at the right side of the rectangular slot, an inverted L-shaped slot at the left side of the rectangular slot, and three stubs. The proposed antenna is fed by an asymmetric cross-parasitic strip on the bottom plane. By properly designing the slots and stubs, four resonant frequency bands are achieved with -10 dB reflection coefficient bandwidths of 50 MHz, 400 MHz, 390 MHz, and 830 MHz in the 1.57 GHz GPS band, 2.4 GHz WLAN band, 3.5 GHz WiMAX band, and 5.5 GHz WLAN bands, respectively. The antenna has a total compact size of $13mm{\times}32mm{\times}0.8mm$. Simulated and measured results indicate that the proposed antenna has sufficient bandwidth and good radiation performance in each band.

Embedded RF Test Circuits: RF Power Detectors, RF Power Control Circuits, Directional Couplers, and 77-GHz Six-Port Reflectometer

  • Eisenstadt, William R.;Hur, Byul
    • Journal of information and communication convergence engineering
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    • v.11 no.1
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    • pp.56-61
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    • 2013
  • Modern integrated circuits (ICs) are becoming an integrated parts of analog, digital, and radio frequency (RF) circuits. Testing these RF circuits on a chip is an important task, not only for fabrication quality control but also for tuning RF circuit elements to fit multi-standard wireless systems. In this paper, RF test circuits suitable for embedded testing are introduced: RF power detectors, power control circuits, directional couplers, and six-port reflectometers. Various types of embedded RF power detectors are reviewed. The conventional approach and our approach for the RF power control circuits are compared. Also, embedded tunable active directional couplers are presented. Then, six-port reflectometers for embedded RF testing are introduced including a 77-GHz six-port reflectometer circuit in a 130 nm process. This circuit demonstrates successful calibrated reflection coefficient simulation results for 37 well distributed samples in a Smith chart. The details including the theory, calibration, circuit design techniques, and simulations of the 77-GHz six-port reflectometer are presented in this paper.