• Title/Summary/Keyword: List NBTI

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Illumination Assisted Negative Bias Temperature Instability Degradation in Low-Temperature Polycrystalline Silicon Thin-Film Transistors

  • Lin, Chia-Sheng;Chen, Ying-Chung;Chang, Ting-Chang;Hsu, Wei-Che;Chen, Shih-Ching;Li, Hung-Wei
    • 한국정보디스플레이학회:학술대회논문집
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    • 2009.10a
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    • pp.550-552
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    • 2009

  • The negative bias temperature instability on LTPS TFTs in a darkened and an illuminated environment was investigated. Experimental results reveal that the generation of interface state density showed no change between the different NBTI stresses. The degradation of the grain boundary trap under illumination was more significant than for the darkened environment.

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