• Title/Summary/Keyword: Light reflectance

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DEVELOPMENT OF QUALITY EVALUATION SYSTEM FOR PEANUT WITH POD USING OPTICAL METHODS

  • Morta, Kazuo;Taharazako, Shoji;Zhang, Han;Maekaji, Kenji;Ikeda, Hirohiko
    • Proceedings of the Korean Society for Agricultural Machinery Conference
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    • 1993.10a
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    • pp.1354-1363
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    • 1993
  • Optical methods were developed to examine their feasibility for quality evaluation of peanut with pod. Surface color and internal quality of peanut were measured without contact. The surface color of peanut was measured by light reflectance at a region of visible wavelengths. Its characteristic was high correlated with a visual grading of peanut. A trial machine for the color grading of peanut was developed using an optical sensor and it was considered to compare with the visual grading. The spectral reflectance at a region of near infrared wavelengths from 1,200 to 2,500nm was measured , and the chemical components of peanut were related to spectral reflectance at special wavelengths. The protein, fat and moisture contents of peanut were estimated by the near infrared methods. An infrared imaging method was developed to evaluate the internal quality of peanut with pod. As thermal characteristic of peanut with pod was deeply related to internal quality , the quality of peanut can be evaluated by temperature changes on the surface of peanut. Measurement of surface color, near infrared reflectance and thermal imaging were shown to be very effective in grading of peanut with pod.

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A Study on the fabrication and Characteristic Analysis of Organic Light Emitting Device using Inorganic Metal Multi-layer (무기금속 다층박막을 적용한 유기발광소자의 제작 및 특성 분석에 관한 연구)

  • Hwang, Soo-Woong;Kang, Seong-Jong;Cho, Jae-Young;Kim, Tae-gu;Oh, Hwan-Sool
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.18 no.10
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    • pp.936-940
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    • 2005
  • IMML(Inorganic metal multi-layer) was used as cathode in the OLED devices to reduce the reflectance or ITO and increase the contrast ratio. Device structure was $ITO/{\alpha}-NPD/Alq_3:DCJTB/Alq_3/IMML/Al$. $Alq_3$ and DCJTB (4 - (dicyanomethylene) - 2 - ( 1 - propyls) 6 - methy 4H - pyrans) as host material lot red emission and red emitting guest material. IMML made three different layer: thin aluminum layer, aluminum layer doped with silicon monoxide, thick aluminum layer. The red OLED device with IMML showed the average reflectance of $4.97\%$, and then normal OLED with or without polarizer showed the average reflectance of $4.55\%$, $46\%$ at visible range from 380 nm to 780 nm. The brightness of OLED with IMML at 13 V was 5557 $cd/m^2$, and that of normal OLED with polarizer was 4872 $cd/m^2$. IMML could be the substitution for polarizer with same reflection, low cost, easy process in flat panel display market.

A Study on Thermal Conductivity Measurement and Optical Characteristics of Thin Films (박막의 열물성 측정 및 광학특성 연구)

  • Gwon, Hyuk-Rok;Lee, Seong-Hyuk
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.56 no.12
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    • pp.2202-2207
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    • 2007
  • The present article investigates experimentally and theoretically thermal and optical characteristics of thin film structures through measurement of thermal conductivity of Pyrex 7740 and reflectance in silicon thin film. The $3{\omega}$ method is used to measure thermal conductivity of very thin film with high accuracy and the optical characteristics in thin films are studied to examine the influence of incidence angle of light on reflectance by using the CTM(Characteristics Transmission Method) and the 633 nm He-Ne laser reflectance measurement system. It is found that the estimated reflectance of silicon show good agreement with experimental data. In particular, the present study solves the EPRT(Equation of Phonon Radiative Transport) which is based on Boltzmann transport equation for predicting thermal conductivity of nanoscale film structures. From the results, the measured thermal conductivity is in good agreement with the previous published data. Moreover, thermal conductivities are estimated for different film thickness. It indicates that as film thickness decreases, thermal conductivity decreases substantially due to internal scattering.

A Study on Change in Window Transmitted Solar and the Resultant Wall Surface Convective Heat Gain with Regard to Slat Reflectance of External and Internal Blinds (실내·외 블라인드의 Slat 반사율에 따라 창호 일사투과량 및 그에 따른 벽체 대류열획득량 분석)

  • Hyun, In-Tak;Lee, Jae-Ho;Yoon, Yeo-Beom;Lee, Kwang Ho
    • Korean Journal of Air-Conditioning and Refrigeration Engineering
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    • v.26 no.12
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    • pp.565-571
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    • 2014
  • Nowadays, to make buildings light weight and aesthetically pleasing, curtain wall structure are commonly used. Therefore, window to wall ratio is increasing, which has caused cooling and heating load in crease in buildings as well. This phenomenon has negative impact from energy point of view. This paper analyzes window and wall convective heat gain when the slat reflectance of external and internal blinds are changed for the better understanding of the fundamentals behind the phenomena. It was observed that, if slat reflectance is increased, window transmitted solar increases and convection heat rate is clearly affected. Among six surfaces including four walls, ceiling and floor, maximum convection heat rate occurs on the south wall in summer. On the other hand, ceiling and floor showed the lowest convection heat gain, since they are shared by adjacent floors.

Two-dimensional model simulation for reflectance of single crystalline silicon solar cell (단결정 실리콘 태양전지 2차원 모델의 반사율 시뮬레이션)

  • Lee, Sang-Hun;Kang, Gi-Hwan;Yu, Gwon-Jong;Ahn, Hyung-Keun;Han, Deuk-Young
    • 한국태양에너지학회:학술대회논문집
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    • 2012.03a
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    • pp.237-242
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    • 2012
  • At present, crystalline solar cells take up a significant percentage of the solar industry. The ways of increasing the efficiency of crystalline solar cell are texturing and AR(Anti-Reflection) coating, and the purpose of these technologies is to increase the amount of available light on the solar cell by reducing the reflectivity. The reflectance of crystalline silicon solar cell combined with such technologies will be able to predict using the proposed simulation in this paper. The simulation algorithm was made using MATLAB, and it is a combination of the theories of reflection in textured wafer and in anti-reflection coated wafer. The simulation results were divided into three wavelength band and were compared with actual reflectance measured by a spectrometer. The wavelength band from 300 to 380 was named ultraviolet region and the wavelength band from 380 to 780 is named visible region. Finally, the wavelength band from 780 to 1200 named infrared region. When compared with measured reflection data, the simulation results had a small error from 0.4 to 0.5[%] in visible region. The error occurred in the rest two regions is larger than visible region. The extreme error occurred the infrared region is due to internal reflection effect, but in the ultraviolet region, the rationale on reduction phenomenon of reflectance occurred in small range did not proved. If these problem will be solve, this simulation will have high reliability more than now and be able to predict the reflectance of solar cells.

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A Study on the Spectral Information and Reflectance Characteristic of Levee Crack (제방 균열의 분광정보 및 반사율 특성에 관한 연구)

  • Kim, Jong-Tae;Lee, Chang-Hun;Kang, Joon-Gu
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.21 no.9
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    • pp.17-24
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    • 2020
  • This study examined the spectral information and reflectance of cracks of an embankment with drone-based hyperspectral imagery for crack detection. A Nano-Hyperspec mounted on a drone was used as a sensor, and hyperspectral videos of different intensities of illumination of the cracks on the embankment located in the downstream of Andong-Dam were obtained. An analysis of the data value of the illumination and peak data-value, the coefficients of determination were calculated to be 0.9864 of the uncracked areas and 0.9851 of the cracked area. The reflectance of each area showed a similar value and pattern, regardless of the intensity of illumination. This result may have occurred because the reference values of the white reference as the calculation criteria of reflectance varied according to the intensity of illumination. The reflectance at the cracked area was 5.65% lower in visible light and 4.58% lower in near-infrared light than that at the uncracked area. The detection of cracks may offer more precise results in further studies when the gimbal direction and camera angles of the drone are calibrated. Because hyperspectral imagery enables the detection of crack depths and types of clay minerals, which are difficult to identify in general RGB imagery, it can serve as a preemptive measure for evaluating the embankment stability.

A Study on the Effect on UV Exposure in Coastal Buildings (연안건축물의 자외선 노출에 따른 안전성 연구)

  • Kim, Taehwan;Uh, Jesun
    • Journal of the Society of Disaster Information
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    • v.17 no.2
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    • pp.195-205
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    • 2021
  • Purpose: The ultraviolet reflectance and transmittance of coastal building materials are one of the important factors of ultraviolet radiation in and out of coastal building. In this research, the ultraviolet spectral reflectance of many kinds of building materials was measured. Also, the relationships with the lightness, roughness, and chromaticity, which are surface characteristics, were reviewed and suggested. Method: In this study, according to the CIE classification, the ultraviolet region was defined as short-wavelength region UV-C(10nm~280nm), medium-wavelength region UV-B (280-315 nm), and long-wavelength region UV-A (315-400nm), and the visible light region was defined as (400nm~780nm). Spectrophotometer was used to continuously measure the reflectance from the ultraviolet region to the visible light region. Results: From the measurement results, the ultraviolet reflectance on Wood was shown to be about Visible 55-68%, UV-A* 7-12%, and UV-B 4-5%. Wall tiles are about Visible18-40%, UV-A* 8-20%, and UV-B* 7-8%. That on concrete was shown to be about Visible 37%, UV-A* 28%, and UV-B*19%. Conclusion: The ultraviolet reflectance can be estimated by visible reflectance. Also, it is important to select a variety of materials according to the application when blocking UV.

Study on Reflectance Improvement of Al-Ti Based Oxide Thin Films for Semitransparent Solar Cell Applications (반투명 태양전지용 Al-Ti계 산화물 박막의 반사율 특성 개선에 관한 연구)

  • Lee, Eun Kyu;Jeong, So Un;Bang, Ki Su;Lee, Seung-Yun
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.31 no.7
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    • pp.437-442
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    • 2018
  • This work reports the preparation of Al-Ti based oxide thin films and their optical properties. Although the transmittance of a $TiO_2/Al2O_3$ bilayer structure was as high as 90% at wavelengths of 600 nm or larger, the reflectance of the bilayer reached its minimum at wavelengths of around 360 nm. The transmittance of an 89-nm-thick $TiO_2$ thin film rapidly increased and then decreased at a critical wavelength because of destructive interference. The wavelength corresponding to the reflectance minimum increased after an increase in $TiO_2$ film thickness. The smooth surface morphology of the AlTiO thin film was retained up to a film thickness of 65 nm, and the transmittance of the film was inversely proportional to film thickness, in accordance with the general tendency for optical films. The reflectance of the AlTiO film at visible light wavelengths was lower than that of the $TiO_2$ film, which implies that the AlTiO film is suitable for applications as an optical thin film layer in semitransparent solar cells.

Evaluating Applicability of Photochemical Reflectance Index using Airborne-Based Hyperspectral Image: With Shadow Effect and Spectral Bands Characteristics (항공 초분광 영상을 이용한 광화학반사지수 이용 가능성 평가: 그림자 영향 및 대체 밴드를 중심으로)

  • Ryu, Jae-Hyun;Shin, Jung Il;Lee, Chang Suk;Hong, Sungwook;Lee, Yang-Won;Cho, Jaeil
    • Korean Journal of Remote Sensing
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    • v.33 no.5_1
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    • pp.507-519
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    • 2017
  • The applications of NDVI (Normalized Difference Vegetation Index) as a vegetation index has been widely used to understand vegetation biomass and physiological activities. However, NDVI is not suitable way for monitoring vegetation stress because it is less sensitive to change in physiological state than biomass. PRI (Photochemical Reflectance Index) is well developed to present physiological activities of vegetation, particularly high-light-stress condition, and it has been adopted in several satellites to be launched in the future. Thus, the understanding of PRI performance and the development of analysis method will be necessary. This study aims to interpret the characteristics of light-stress-sensitive PRI in shadow areas and to evaluate the PRI calculated by other wavelengths (i.e., 488.9 nm, 553.6 nm, 646.9 nm, and 668.4 nm) instead of 570 nm that used in original PRI. Using airborne-based hyperspectral image, we found that PRI values were increased in shadow detection due to the reduction of high light induced physiological stress. However, the qualities of both PRI and NDVI data were dramatically decreased when the shadow index (SI) exceeded the threshold (SI<25). In addition, the PRI calculated using by 553.6 nm had best correlation with original PRI. This relationship was improved by multiple regression analysis including reflectances of RED and NIR. These results will be helpful to the understanding of physiological meaning on the application of PRI.

The Change of Collected Light According to Changing of Reflectance and Thickness of CdWO4 Scintillator for High Energy X-ray Imaging Detection (고에너지 X-선 영상검출을 위한 CdWO4 섬광체 두께와 반사체의 반사율 변화에 따른 광 수집량의 변화)

  • Lim, Chang Hwy;Park, Jong-Won;Lee, Junghee
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.24 no.12
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    • pp.1704-1710
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    • 2020
  • The high-energy X-ray imaging detector used for container inspection uses a thick scintillator to effectively acquire X-rays. X-ray incident on the scintillator is generally up to 9MeV. Therefore, to effectively collect X-ray, it is necessary to use a thick scintillator. To collect the light generated by the reaction between X-ray and scintillator, an optical-sensor must be combined with the scintillator. In this study, a study on the design conditions of the detector using a CdWO4 and a small sensor is described. To calculate the collected light according to the change of the scintillator thickness and the reflectance of surface, MCNP6 and DETECT2000 were used. As a result of calculating, it was confirmed that when the reflectance of the surface was low, it was appropriate to select a scintillator with a thickness of 15 to 20-mm, but as the reflectance increased, it was confirmed that it was appropriate to select a CdWO4 with a thickness of 25 to 30-mm.