• Journal of the Institute of Electronics and Information Engineers
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• v.50 no.8
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• pp.121-127
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• 2013

Memory devices including SRAM and DRAM are very susceptible to high energy radiation particles in the space. Abnormal operation of the devices is caused by SEE or TID. This paper presents a method to estimate proton SEU cross section representing the susceptibility of the latch circuit that the unit cell of the SRAM and proposes a new latch circuit to mitigate the SEU. 50b shift register was fabricated by using the conventional latch and the proposed latch in $0.35{\mu}m$ process. Irradiation experiment was conducted at KIRAMS by using 43MeV proton beam. It was found that the proposed latch-shift register is not affected by the radiation environment compared to the conventional latch-shift register.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.38 no.11
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• pp.1215-1220
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• 2014

Breaking time is an important performance indicator of a circuit breaker. Thus, the operating mechanism of the circuit breaker should be optimized for reducing the breaking time. The operating mechanism in a gas circuit breaker is made up of several latches. Specifically, the geometry and relative positions of latches influence the dynamic behaviors of the operating mechanism. In this study, a three-stage latch operating mechanism is analyzed on the basis of the verified multibody dynamics model constructed using the MSC.ADAMS program. The relative positions and lengths of latches are selected as design variables. The dominant design variables are selected by a design study. Optimization is performed using a genetic algorithm (GA). The study results demonstrate that the performance of the circuit breaker improves by about 22.5.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.45 no.6
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• pp.111-118
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• 2008

In this paper, novel latch-up prevention method that employs power-up sequential switches has been proposed to relieve latch-up problem in liquid crystal display (LCD) driver ICs. These sequential switches are inserted in the 2'nd and 3'rd boosting stages, and are used to short the emitter-base terminals of parasitic p-n-p-n circuit before relevant boosting stages are activated during power-up sequence. To verily the performance of the proposed method, test chips were designed and fabricated in a 0.13-um CMOS process technology. The measurement results indicated that, while the conventional LCD driver If entered latch-up mode at $50^{\circ}C$ accompanying a significant amount of excess current, the driver IC adopting the proposed method showed no latch-up phenomenon up to $100^{\circ}C$ and maintained normal current level of 0.9mA.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2012.05a
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• pp.719-721
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• 2012

In this study, we carried out transient radiation experiments for identify failure situation by a transient radiation effect on DC/DC converter device due to high energy ionizing radiation pulse induced to electronic device. This experiments were carried out using a 60 MeV electron beam pulse of the LINAC(Linear Accelerator) facility in the Pohang Accelerator Laboratory. In this experiment, we has found that the latch-up phenomena could be checked in more than $1.0{\times}10^8$rad(si)/sec condition.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2011.10a
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• pp.892-895
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• 2011

Power consumption during testing System-On-Chip (SOC) are becoming increasingly important as the IP core increases in SOC. We present a new algorithm to reduce the scan-in power using the modified scan latch reordering and clock gating. We apply scan latch reordering technique for minimizing the hamming distance in scan vectors. Also, during scan latch reordering, the don't care inputs in scan vectors are assigned for low power. Also, we apply the clock gated scan cells. Experimental results for ISCAS 89 benchmark circuits show that reduced low power scan testing can be achieved in all cases.

• Journal of the Korean Institute of Telematics and Electronics
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• v.22 no.5
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• pp.50-56
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• 1985

A common failure mechanism in bulk CMOS integrated circuits is the latch-up of parasitic SCR structure inherent in the bulk CMOS structure. Latch-up triggering and holding charac-teristics have been measured in the test devicrs which include conventional and Schottky-damped CMOS structures with various well depths and n+/p+ spacings. It is demonstrated that Schottky-clamped CMOS is more latch-up immune than conventional bulk CMOS. Finally, the simulation results by circuit simulation program (SPICE) are compared with measured results in order to verify the validity of the latch-up modal composed of nan, pnp transistors and two external resistors.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.38 no.1
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• pp.25-30
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• 2014

The dynamic characteristics of a gas circuit breaker depend on the underlying high-speed operating mechanism with a spring-actuated latch system. Many studies have been carried out to reduce the breaking time of circuit breakers. In this study, the optimum latch contour design is determined for reducing the breaking time of a circuit breaker. A multi-body dynamic model of the latch is established for analyzing the dynamic behaviors of the circuit breaker by using the MSC/ADAMS program. Simulation results are matched against experimental data. VisualDoc is employed for determining the optimal latch contour. From the optimum design, the breaking time of a gas circuit breaker is improved by about 8.6%.

• Asia-pacific Journal of Multimedia Services Convergent with Art, Humanities, and Sociology
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• v.7 no.2
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• pp.227-236
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• 2017

Quantum-dot cellular automata(QCA) consists of nano-scale cells and demands very low power consumption so that it is one of the alternative technologies that can overcome the limits of scaling CMOS technologies. Various circuits on QCA have been researched until these days, a latch required for counter and state control has been proposed as a component of sequential logic circuits. A latch uses a feedback loop to maintain previous state. In QCA, a latch uses a square structure using 4 clocks for feedback loop. Previous latches have been proposed using many cells and clocks in coplanar. In this paper, in order to eliminate these defects, we propose a SR and D latch using multilayer structure on QCA. Proposed three dimensional loop structure is based on multilayer and consists of 3 layers. Each layer has 2 clock differences between layers in order to reduce interference. The proposed latches are analyzed and compared to previous designs.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.32A no.1
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• pp.103-110
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• 1995

Trench-Gate SOI LIGBT with improved latch-up capability has been proposed and verified by MEDICI simulation. The new SOI LIGBT exhibits 6 time larger latch-up capability of the new device is almost preserved independent of lifetime. the large latch-up capability of the new SOI LIGBT may be realized due to the fact that the hole current in the new device would bypass through the shorted cathode contact without passing the p-well region under the n+ cathode. Forward voltage drop is increased by 25% when a epi thickness is 6$\mu$m. However, the increase of the forward voltage is negligible when the epi thickness is increased to 10$\mu$m. It is found that the swithcing time of the new device is almost equal to the conventional devices. Evaluated breakdown voltage of proposed SOILIGBT is 250 V and that of the conventional SOI LIGBT is 240 V, where the thickness of the vuried oxide and n- epi is 3$\mu$m and 6$\mu$m, respectively.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.40 no.10
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• pp.63-67
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• 2003

This paper proposes a new BLSA(Bit Line Sense Amplifier) for MRAM. Current BLSA employs a latch-type circuit to amplify a signal from the selected memory cell. The proposed BLSA simplifies the circuit by amplifying the signal using cross-coupled PMOS transistors. It shows the same operation speedas the latch-type BLSA in simulation and occupies only 85% of the area taken by the latch-type BLSA.