• 제목/요약/키워드: Laser profiler

검색결과 35건 처리시간 0.035초

Portable Laser Profiler를 이용한 도로 포장의 노면조직 깊이 측정 방법 연구 (A Study on the Measurement of Texture Depth of Pavement Using Portable Laser Profiler)

  • 홍성재;현택집;김형배;권오선;이승우
    • 한국도로학회논문집
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    • 제14권6호
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    • pp.45-55
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    • 2012
  • PURPOSES : Skid resistance and noise of roads highly depend on the characteristics of pavement texture. Therefore, estimation of texture characteristics may give useful information for the skid resistance and noise of road. Generally, Sand Patch Test is performed in order to estimate MTD(Mean Texture Depth). However, it is time-consuming and needs traffic control. This study aimed to investigate the effectiveness of measurement texture depth using the Portable Laser Profiler that give the MPD(Mean Profile Depth). METHODS : MTD and MPD were collected on the number of expressway sections including Central Inland Test Road sections in Korea. Statistical analysis are performed to establish the relationship between MTD data based on Sand Patch Test and MPD data obtained by the Portable Laser Profiler. RESULTS : Linear relationship MPD and MTD is observed for both of asphalt pavement and concrete pavement such as R-square of 0.51 to 0.58. CONCLUSIONS : Even though, the test method and definition of MPD and MTD are different. EMTD(Estimated Mean Texture Depth) can be obtained by using the correlationship between MPD with MTD.

지표면 산란 계수 예측을 위한 정확한 지표면 거칠기 변수 측정 방법 및 오차 분석 (Precise Measurement Method and Error Analysis with Roughness Variables for Estimation of Scattering Coefficients)

  • 권순구;황지환;오이석;홍성욱
    • 한국전자파학회논문지
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    • 제24권1호
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    • pp.91-97
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    • 2013
  • 지표면의 후방 산란 계수를 계산하는 지표면 산란 모델의 입력 변수로는 크게 수분함유량과 지표면 거칠기가 있고, 산란 계수 계산에 있어 지표면 거칠기의 영향이 수분함유량의 영향보다 크다. 본 연구에서는 지표면 거칠기의 정확한 측정 방법을 제기하고, 측정 오차를 분석한다. 이를 위하여 대표적인 지표면 거칠기 측정 장치인 pin-board profiler(1 m, 0.5 cm 간격)와 laser profiler(1 m, 0.25 cm 간격)를 이용하여 실제 지표면을 측정하였다. 두 측정 장치의 평균 차이는 유효 높이(RMS height)가 0.097 cm, 상관 길이(correlation length)가 1.828 cm이었다. 그리고 상관 함수, 상대오차를 분석한 결과, laser-profiler의 반복 측정에 대한 장치의 안전성이 더 좋았다. 두 측정 장치의 차이가 후방 산란 계수에 미치는 영향을 분석하기 위해 지표면 산란 모델을 이용하여 비교한 결과, 입사각 $20{\sim}60^{\circ}$에서 1 dB 이하의 차이를 보였다.

분말 표면 조도의 3차원 레이저 분석기를 이용한 정량화와 압분성형체 강도에 미치는 영향 분석 (Quantitative Analysis of Roughness of Powder Surface Using Three-Dimensional Laser Profiler and its Effect on Green Strength of Powder Compacts)

  • 이동준;윤은유;김하늘;강희수;이언식;김형섭
    • 한국분말재료학회지
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    • 제18권5호
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    • pp.406-410
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    • 2011
  • Green strength is an important property of powders since high green strength guarantees easy and safe handling before sintering. The green strength of a powder compact is related to mainly mechanical and surface characters, governed by interlocking of the particles. In this study, the effect of powder surface roughness on the green strength of iron powders was investigated using a transverse rupture test. Three-dimensional laser profiler was employed for quantitative analyses of the surface roughness. Two different surface conditions, i.e. surface roughness, of powders were compared. The powders having rough surfaces show higher green strength than the round surface powders since higher roughness leads increasing interlocked area between the contacting powders.

집속 아르곤 이온 레이저 빔을 이용한 레이저 유도 직접 구리 패터닝 (Laser-Induced Direct Copper Patterning Using Focused $Ar^+$ Laser Beam)

  • 이홍규;이경철;안민영;이천
    • 한국전기전자재료학회논문지
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    • 제13권11호
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    • pp.969-975
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    • 2000
  • Laser direct writing of micro-patterned copper lines has been achieved by pyrolytic decomposition of copper formate films (Cu(HCOO)$_2$.4$H_2O$), as a metallo-organic precursor, using a focused CW Ar$^{+}$ laser beam (λ=514nm) on PCB boards and glass substrates. The linewidth and thickness of the lines wee investigated as a functin of laser power and scan speed. The profiles of the lines were measured by scanning electron microscope (SEM), surface profiler ($\alpha$-step) and atomic force measured by scanning electron microscope (SEM), surface profiler ($\alpha$-step) and atomic force microscopy (AFM). The electrical resistivities of the patterned lines were also investigated as a function of laser parameters using probe station and semiconductor analyzer. We compared resistivities of the patterned copper lines with these of the Cu bulk. Resistivities decreased due to changes in morphology and porosity of the deposit, which were about 3.8 $\mu$$\Omega$cm and 12$\mu$$\Omega$cm on PCB and glass substrates after annealing at 30$0^{\circ}C$ for 5 minutes.s.

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Automated texture mapping for 3D modeling of objects with complex shapes --- a case study of archaeological ruins

  • Fujiwara, Hidetomo;Nakagawa, Masafumi;Shibasaki, Ryosuke
    • 대한원격탐사학회:학술대회논문집
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    • 대한원격탐사학회 2003년도 Proceedings of ACRS 2003 ISRS
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    • pp.1177-1179
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    • 2003
  • Recently, the ground-based laser profiler is used for acquisition of 3D spatial information of a rchaeological objects. However, it is very difficult to measure complicated objects, because of a relatively low-resolution. On the other hand, texture mapping can be a solution to complement the low resolution, and to generate 3D model with higher fidelity. But, a huge cost is required for the construction of textured 3D model, because huge labor is demanded, and the work depends on editor's experiences and skills . Moreover, the accuracy of data would be lost during the editing works. In this research, using the laser profiler and a non-calibrated digital camera, a method is proposed for the automatic generation of 3D model by integrating these data. At first, region segmentation is applied to laser range data to extract geometric features of an object in the laser range data. Various information such as normal vectors of planes, distances from a sensor and a sun-direction are used in this processing. Next, an image segmentation is also applied to the digital camera images, which include the same object. Then, geometrical relations are determined by corresponding the features extracted in the laser range data and digital camera’ images. By projecting digital camera image onto the surface data reconstructed from laser range image, the 3D texture model was generated automatically.

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Mean Profile Depth를 이용한 아스팔트 포장의 타이어-노면소음 산정 연구 (Estimation of Tire-Pavement Noise for Asphalt Pavement by Mean Profile Depth)

  • 현택집;홍성재;김형배;이승우
    • 대한토목학회논문집
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    • 제33권4호
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    • pp.1631-1638
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    • 2013
  • 포장파손과 IRI 등의 요소들은 포장상태를 평가하는 중요한 요소이다. 최근 들어 주행쾌적성에 영향을 주는 타이어-노면소음을 포장관리 시스템에 포함시키는 필요성이 대두되고 있다. PLP(Portable Laser Profiler)를 이용하여 주행 중 노면조직특성인 평균프로파일깊이(MPD)를 측정할 수 있는 기법이 개발되었다. 일반적으로 타이어-노면소음은 노면조직특성에 따라 다르게 발생하며, 타이어-노면소음을 예측하는 유용한 정보로 사용할 수 있다. 본 연구에서는 아스팔트 구간의 노면조직특성에 따른 타이어-노면소음을 평가하기 위해 다수의 아스팔트 구간에서 MPD와 타이어-노면소음을 동시에 측정하여 데이터를 획득하였으며, 통계학적 분석을 통해 타이어-노면소음 추정식을 제안하였다.

삼차원 표면 조도 측정기와 삼차원 레이저 공초점 현미경 적용에 따른 표면 거칠기에 대한 영향 연구 (Study of the Effect of Surface Roughness through the Application of 3D Profiler and 3D Laser Confocal Microscope)

  • 정희영;김대은
    • Tribology and Lubricants
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    • 제40권2호
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    • pp.47-53
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    • 2024
  • Surface topography plays a decisive role in determining the performance of several precision components. In particular, the surface roughness of semiconductor devices affects the precision of the circuit. In this regard, the surface topography of a given surface needs to be appropriately assessed. Typically, the average roughness is used as one of the main indicators of surface finish quality because it is influenced by both dynamic and static parameters. Owing to the increasing demand for such accurate and reliable surface measurement systems, studies are continuously being conducted to understand the parameters of surface roughness and measure the average roughness with high reliability. However, the differences in the measurement methods of surface roughness are not clearly understood. Hence, in this study, the surface roughness of the back of a silicon wafer was measured using both contact and noncontact methods. Subsequently, a comparative analysis was conducted according to various surface roughness parameters to identify the differences in surface roughness depending on the measurement method. When using a 3D laser confocal microscope, even smaller surface asperities can be measured compared with the use of a 3D profiler. The results are expected to improve the understanding of the surface roughness characteristics of precision components and be used as a useful guideline for selecting the measurement method for surface topography assessment.

절삭방향(切削方向)이 목재(木材)의 레이저절삭특성(切削特性)에 미치는 영향(影響) (Effects of Cutting Direction on the Laser Machining Characteristics of Wood)

  • 이형우
    • Journal of the Korean Wood Science and Technology
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    • 제24권4호
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    • pp.87-92
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    • 1996
  • When cutting 2.0cm-thick red oak and hard maple with an air-jet-assisted carbon-dioxide laser of 2kW output power, maximum feed speed at the point of full penetration of the beam decreased with increasing the angle between grain and cutting direction. Feed speed averaged 3.75 and 3.38 meters per minute for red oak and hard maple, respectively. Gray-level of laser-cut surfaces were analyzed by image analysis system. The highest gray level of laser-cut surface was obtained when red oak was cut parallel to grain by laser. Surface profiler was used to scan the sawn and laser-cut surfaces. Center line average roughnesses of laser-cut surfaces were higher than those of sawn surfaces. Scanning electron micrographs showed the cell walls which were melted by laser.

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아르곤 이온 레이저를 이용한 CU의 직접 쓰기 기술 (Laser dissect writing from copper(II) formate using Ar+ laser)

  • 이홍규;이천
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2000년도 하계학술대회 논문집
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    • pp.663-666
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    • 2000
  • Laser direct writing of micro-patterned copper lines has been achieved by pyrolytic decomposition of copper formate films (Cu(HCOO)$_2$$.$4H$_2$O), as a precursor, using a focused Ar$\^$+/ laser beam ($\lambda$= 514 nm) on PCB boards and glass substrates. The linewidth and thickness of the lines were investigated as a function of laser power and scan speed. The profiles of the lines were measured by scanning electron microscope (SEM), surface profiler (${\alpha}$-step) and atomic force microscopy (AFM). The electrical resistivities of the patterned lines were also investigated as a function of laser parameter using probe station and semiconductor analyzer. we compared resistivities of the patterned lines with that of the Cu bulk, respectively.

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