• 한국정밀공학회지
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• 제11권2호
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• pp.110-119
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• 1994

The Robust Controller for scan-loop is designed using LQG/LTR Methodology. The design and analysis of spiral, rosette and conical scan patterns are discussed. The perfermance and robustness of the LQG/LTR controller are analyzed through experiments and cpmpared with those of the P-controller. Especially to improve the scan performance at large look angle, the cage coil output is linearized using a binomial equation. It is demonstrated that the scan-loop system by the LQG/LTR control is very robust to phase uncertainties.