• Title/Summary/Keyword: Junction device

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The Study on the Improvement of Mechanical Performance due to Change in Temperature and Sputtering by $SiO_2/Ag$ Material of Bonded Dissimilar Materials with Cylindrical Shape (원통형 이종 접합 소재의 $SiO_2/Ag$스퍼터 증착과 온도 변화에 따른 기계적 특성에 관한 연구)

  • Lee, Seung-Hyun;Choi, Seong-Dae;Lee, Jung-Hyong
    • Journal of the Korean Society of Manufacturing Process Engineers
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    • v.11 no.3
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    • pp.138-145
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    • 2012
  • The material used in this study is dielectric and ferrite. Because of the unique characteristics of the material, it is easily exposed to external shocks and pressure, which cause damage to the product. However, after being processed under high-temperature environment repeatedly, the mechanical strength of the product is greatly increased due to the change of the electrical properties. In this paper, dielectric and bonded ferrite material was tested for the material properties. The equipment for this experiment was produced and tested to allow Cylindrical and Three-dimensional geometry of the product for the vacuum deposition. For Cylindrical shape of the product, in order to obtain the equivalent film thickness, the device is constructed in a vacuum chamber which gives arbitrary revolving and rotating capability. The electrical performance of the product is obtained through this process as well. However, as mentioned above, with repeating processes under high temperature and exposure to external environment, the product is easy to be broken. This experiment has enabled us to find out a stable condition to apply the communication of the RF high frequency to each of the core elements, such as Ferrite and Dielectric which is then used for the mechanical strength of the Raw material, hetero-junction material, Hetero-junction Ag Coating material and hetero-junction Ag Coating SiO2 Coating material respectively.

Generation of Fine Droplets in a Simple Microchannel (유체 소자를 이용한 미세 액적 생성)

  • Kim, Su-Dong;Kim, Young-Won;Yoo, Jung-Yul
    • Transactions of the Korean Society of Mechanical Engineers B
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    • v.34 no.7
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    • pp.671-677
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    • 2010
  • In the present study, we designed a microfluidic platform for generating monodisperse droplets with diameters ranging from hundreds of nanometers to several micrometers. To generate fine droplets, T-junction and flow-focusing geometry are integrated into the microfluidic channel. Relatively large aqueous droplets are generated at the upstream T-junction and transported to the flow-focusing geometry, where each droplet is broken into smaller droplets of the desired size by the action of pressure and viscous stress. In this configuration, the flow rate of the inner fluid can be made very low, and the ratio of the inner- and outer-fluid flow rates in the flow-focusing region can be made very high. It has been shown that the present microfluidic device can generate droplets with diameters of approximately $1\;{\mu}m$ (standard deviation: <3%).

Fabrication of a Large-Area $Hg_{1-x}Cd_{x}$Te Photovoltaic Infrared Detector ($Hg_{1-x}Cd_{x}$Te photovoltaic 대형 적외선 감지 소자의 제작)

  • Chung, Han;Kim, Kwan;Lee, Hee-Chul;Kim, Jae-Mook
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.31A no.2
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    • pp.88-93
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    • 1994
  • We fabricated a large-scale photovoltaic device for detecting-3-5$\mu$m IR, by forming of n$^{+}$-p junction in the $Hg_{1-x}Cd_{x}$Te (MCT) layer which was grown by LPE on CdTe substrate. The composition x of the MCT epitaxial layer was 0.295 and the hole concentration was 1.3${\times}10^{13}/cm^{4}$. The n$^{+}$-p junction was formed by B+ implantation at 100 keV with a does 3${\times}10^{11}/cm^{2}. The n$^{+}$ region has a circular shape with 2.68mm diameter. The vacuum-evaporated ZnS with resistivity of 2${\times}10^{4}{\Omega}$cm is used as an insulating layer over the epitaxial layer. ZnS plays the role of the anti-reflection coating transmitting more than 90% of 3~5$\mu$m IR. For ohmic contacts, gole was used for p-MCT and indium was used for n$^{+}$-MCT. The fabrication took 5 photolithographic masks and all the processing temperatures of the MCT wafer were below 90$^{\circ}C$. The R,A of the fabricated devices was 7500${\Omega}cm^{2}$. The carrier lifetime of the devices was estimated 2.5ns. The junction was linearly-graded and the concentration slope was measured to be 1.7${\times}10^{17}/{\mu}m$. the normalized detectivity in 3~5$\mu$m IR was 1${\times}10^{11}cmHz^{12}$/W, which is sufficient for real application.

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Simulation Analysis of Spatially Arterial Pulse Wave using Two-dimensional Array Sensors with Magnetoresistive Device (2차원 배열 자기저항소자를 이용한 공간 맥진파형의 전산모사 분석)

  • Kim, M.S.;Kim, S.W.;Kim, G.W.;Lee, S.J.;Lee, S.G.;Lee, H.S.;Park, D.H.;Hwang, D.G.;Lee, S.S.
    • Journal of the Korean Magnetics Society
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    • v.15 no.6
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    • pp.307-310
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    • 2005
  • To get the spatial feature of arterial pulse, we designed spatial pulse diagnostic apparatus (SPDA) using a 2-dimensional magnetoresistive sensor array. The magnetic field distribution fur magnet may was simulated using finite element method. We recognized that the field distribution of parallel magnet mays was more sensitive and uniformed than that of perpendicular one. Also the spatial displacements of magnet array were agreed with the output signal of magnetic tunnel junction (MTJ) sensor array.

Development of Thermocouple Sensor for Thermal Boundary Layer Measurement (온도 경계층 측정용 열전대 센서 개발)

  • Seo, Jongbeom;Han, S.
    • Transactions of the Korean Society of Mechanical Engineers B
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    • v.38 no.12
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    • pp.983-990
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    • 2014
  • This research focused on designing an appropriate thermocouple sensor for a thermal boundary layer with a large temperature gradient. It was designed to minimize the conduction error from a constant temperature wall in a boundary layer. A $79.9-{\mu}m$ thermocouple was chosen, and a five-axis device jig was developed to fabricate a butt-welded thermocouple, which is different from arc-welded junction thermocouples. This was used to minimize the size of the thermocouple junction. In addition to fabricating butt-welded thermocouples, a thorough calibration was conducted to decrease the internal error of a multimeter to ensure that the data from the butt-welded and regular thermocouples were almost the same. Based on this method, a butt-welded thermocouple with a small junction was found to be suitable for measuring the temperature in a thermal boundary layer with very large thermal gradients. Using this thermal boundary layer probe, the thermal boundary layers in a turbine cascade were measured, and the Nusselt numbers were obtained for the turbine endwall.

Interface Characteristics and Electrical Properties of SiO2 and V2O5 Thin Films Deposited by the Sputtering (스퍼터링 방법으로 증착한 SiO2와 V2O5박막의 전류특성과 계면분석)

  • Li, Xiangjiang;Oh, Teresa
    • Journal of the Semiconductor & Display Technology
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    • v.17 no.4
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    • pp.66-69
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    • 2018
  • This study was researched the electrical properties of semiconductor devices such as ITO, $SiO_2$, $V_2O_5$ thin films. The films of ITO, $SiO_2$, $V_2O_5$ were deposited by the rf magnetron sputtering system with mixed gases of oxygen and argon to generate the plasma. All samples were cleaned before deposition and prepared the metal electrodes to research the current-voltage properties. The electrical characteristics of semiconductors depends on the interface's properties at the junction. There are two kinds of junctions such as ohmic and schottky contacts in the semiconductors. In this study, the ITO thin film was shown the ohmic contact properties as the linear current-voltage curves, and the electrical characteristics of $SiO_2$ and $V_2O_5$ films were shown the non-linear current-voltage curves as the schottky contacts. It was confirmed that the electronic system with schottky contacts enhanced the electronic flow owing to the increment of efficiency and increased the conductivity. The schottky contact was only defined special characteristics at the semiconductor and the interface depletion layer at the junction made the schottky contact which has the effect of leakage current cutoff. Consequently the semiconductor device with shottky contact increased the electronic current flow, in spite of depletion of carriers.

3.3kV Low Resistance 4H-SiC Semi-SJ MOSFET (3.3kV급 저저항 4H-SiC Semi-SJ MOSFET)

  • Cheon, Jin-Hee;Kim, Kwang-Soo
    • Journal of IKEEE
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    • v.23 no.3
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    • pp.832-838
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    • 2019
  • In this paper, 4H-SiC MOSFET, the next generation power semiconductor device, was studied. In particular, Semi-SJ MOSFET structures with improved electrical characteristics than conventional DMOSFET structures were proposed in the class of 3300V, and static characteristics of conventional and proposed structures were compared and analyzed through TCAD simulations. Semi-SuperJunction MOSFET structure is partly structure that introduces SuperJunction, improves Electric field distribution through the two-dimensional depletion effect, and increases breakdown voltage. Benefit from the improvement of breakdown voltage, which can improve the on resistance as high doping is possible. The proposed structure has a slight reduction in breakdown voltage, but has an 80% decrease in on resistance compared to the conventional DMOSFET structure, and a 44% decrease in on resistance compared to the Current Spreading Layer(CSL) structure that improves the conventional DMOSFET structure.

V2O5 Embedded All Transparent Metal Oxide Photoelectric Device (V2O5 기반의 금속 산화물 투명 광전소자)

  • Kim, Sangyun;Choi, Yourim;Lee, Gyeong-Nam;Kim, Joondong
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.67 no.6
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    • pp.789-793
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    • 2018
  • All transparent metal oxide photoelectric device based on $V_2O_5$ was fabricated with structure of $V_2O_5/ZnO/ITO$ by magnetron sputtering system. $V_2O_5$ was deposited by reactive sputtering system with 4 inch vanadium target (purity 99.99%). In order to achieve p-n junction, p-type $V_2O_5$ was deposited onto the n-type ZnO layer. The ITO (indium tin oxide) was applied as the electron transporting layer for effective collection of the photo-induced electrons. Electrical and optical properties were analyzed. The Mott-Schottky analysis was applied to investigate the energy band diagram through the metal oxide layers. The $V_2O_5/ZnO/ITO$ photoelectric device has a rectifying ratio of 99.25 and photoresponse ratios of 1.6, 4.88 and 2.68 under different wavelength light illumination of 455 nm, 560 nm and 740 nm. Superior optical properties were realized with the high transmittance of average 70 % for visible light range. Transparent $V_2O_5$ layer absorbs the short wavelength light efficiently while passing the visible light. This research may provide a route for all-transparent photoelectric devices based on the adoption of the emerging p-type $V_2O_5$ metal oxide layer.

Performance Characteristics of p-i-n type Organic Thin-film Photovoltaic Cell with Rubrene:CuPc Hole Transport Layer (Rubrene:CuPc 정공 수송층이 도입된 p-i-n형 유기 박막 태양전지의 성능 특성 연구)

  • Kang, Hak-su;Hwang, Jongwon;Kang, Yongsu;Lee, Hyehyun;Choe, Youngson
    • Korean Chemical Engineering Research
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    • v.48 no.5
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    • pp.654-659
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    • 2010
  • We have investigated the effect of rubrene-doped CuPc hole transport layer on the performance of p-i-n type bulk hetero-junction photovoltaic device with a structure of ITO/PEDOT:PSS/CuPc: rubrene/CuPc:C60(blending ratio 1:1)/C60/BCP/Al and have evaluated the current density-voltage(J-V) characteristics, short-circuit current($J_{sc}$), open-circuit voltage($V_{oc}$), fill factor(FF), and energy conversion efficiency(${\eta}_e$) of the device. By rubrene doping into CuPc hole transport layer, absorption intensity in absorption spectra decreased. However, the performance of p-i-n organic type bulk hetero-junction photovoltaic device fabricated with crystalline rubrene-doped CuPc was improved since rubrene shows higher bandgap and hole mobility compared to CuPc. Increased injection currents have effected on the performance improvement of the present device with energy conversion efficiency(${\eta}_e$) of 1.41%, which is still lower value compared to silicone solar cell and many efforts should be made to improve organic photovoltaic devices.

Flexible InGaP/GaAs Double-Junction Solar Cells Transferred onto Thin Metal Film (InGaP/GaAs 이중접합 기반의 고효율 플렉시블 태양전지 제조기술 연구)

  • Moon, Seungpil;Kim, Youngjo;Kim, Kangho;Kim, Chang Zoo;Jung, Sang Hyun;Shin, Hyun-Beom;Park, Kyung Ho;Park, Won-Kyu;Ahn, Yeon-Shik;Kang, Ho Kwan
    • Current Photovoltaic Research
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    • v.4 no.3
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    • pp.108-113
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    • 2016
  • III-V compound semiconductor based thin film solar cells promise relatively higher power conversion efficiencies and better device reliability. In general, the thin film III-V solar cells are fabricated by an epitaxial lift-off process, which requires an $Al_xGa_{1-x}As$ ($x{\geq}0.8$) sacrificial layer and an inverted solar cell structure. However, the device performance of the inversely grown solar cell could be degraded due to the different internal diffusion conditions. In this study, InGaP/GaAs double-junction solar cells are inversely grown by MOCVD on GaAs (100) substrates. The thickness of the GaAs base layer is reduced to minimize the thermal budget during the growth. A wide band gap p-AlGaAs/n-InGaP tunnel junction structure is employed to connect the two subcells with minimal electrical loss. The solar cell structures are transferred on to thin metal films formed by Au electroplating. An AlAs layer with a thickness of 20 nm is used as a sacrificial layer, which is removed by a HF:Acetone (1:1) solution during the epitaxial lift-off process. As a result, the flexible InGaP/GaAs solar cell was fabricated successfully with an efficiency of 27.79% under AM1.5G illumination. The efficiency was kept at almost the same value after bending tests of 1,000 cycles with a radius of curvature of 10 mm.