• Title/Summary/Keyword: Josephson junction array

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Uncertainty Evaluation of Josephson Voltage Standard in the level of $10^{-10}$ (10의 -10승 수준에서 조셉슨 전압표준기 불확도 평가)

  • Kim, K.T.;Kim, M.S.;Chong, Y.;Kim, W.S.;Song, W.
    • Progress in Superconductivity
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    • v.9 no.1
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    • pp.56-61
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    • 2007
  • The most recent improvement in the 10 V array system was carried out with focusing on noise reduction. We have evaluated the uncertainty of the 10 V Josephson array system after the improvement. The uncertainty evaluation of 10 V standard included a comparison with a programmable Josephson array system at 1 V. Every contribution to the measurement uncertainty was evaluated in the level of $10^{-10}$. The estimated combined uncertainty was found to be approximately $10^{-9}$ at 10 V, which was limited only by the indirect verifying method. In the near future, a direct comparison with another 10 V Josephson voltage standard is expected to be carried out to provide more accurate uncertainty evaluation for the KRISS Josephson voltage standard.

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Novel Interface-engineered Junction Technology for Digital Circuit Applications

  • Yoshida, J.;Katsuno, H.;Inoue, S.;Nagano, T.
    • Progress in Superconductivity
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    • v.3 no.1
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    • pp.1-4
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    • 2001
  • Interface-engineered junctions with $YbBa_2$$Cu_3$$O_{7}$ as the counter electrode were demonstrated. The junctions exhibited excellent Josephson characteristics with a Josephson critical current ($I_{c}$) ranging from 0.1 mA to 8 mA and a magnetic field modulation of the $I_{c}$ exceeding 80% at 4.2 K while maintaining complete c-axis orientation of the counter-electrode layer. The$ 1\sigma$ spreads in $I_{c}$ for junctions with an average $I_{c}$ of 1-2 mA were 5-8% for 16 junctions within a chip, and 9.3% for a 100-junction array. Our dI/dV measurements suggest that a theoretical approach taking into account both a highly transparent barrier and the proximity effect is required to fully understand the Junction characteristics.ristics.

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Fabrication and statistical characterization of Nb SQUID sensors for multichannel SQUID system

  • Kim, B.K.;Yu, K.K.;Kim, J.M.;Kwon, H.;Lee, S.K.;Lee, Y.H.
    • Progress in Superconductivity and Cryogenics
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    • v.22 no.4
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    • pp.62-66
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    • 2020
  • We fabricated superconducting quantum interference devices (SQUIDs) based on Nb Josephson junctions, and characterized the key parameters of the SQUIDs. The SQUIDs are double relaxation oscillation SQUIDs (DROSs) having larger flux-to-voltage transfer coefficient than the standard DC-SQUIDs. SQUID sensors were fabricated by using Nb junction technology consisted of a DC magnetron sputtering and a conventional photolithography process. In multichannel SQUID systems for whole-head magnetoencephalography measurement with a helmet-type SQUID array, we need about 336 SQUID sensors for each system. In this paper, we fabricated a few hundred SQUID sensors, measured the critical current, flux modulation voltage and decided if each tested SQUID can be used for the multichannel systems. As the criterion for the acceptance of the sensors, we chose the critical current and amplitude of the modulation voltage to be 8 ㎂ and 80 ㎶, respectively. The average critical current of the SQUIDs was 10.58 ㎂. The typical flux noise of the SQUIDs with input coil shorted was 2 μΦ0/√Hz at white region.