• Korean Journal of Veterinary Service
• /
• v.41 no.2
• /
• pp.125-131
• /
• 2018

This study investigated the effects of the alkaline detergent and acid rinse used for cleaning milking machines on the rubber composition of the newly-developed teat cup liners. The samples prepared for use in the clean-in-place process were analyzed by ultraviolet spectrophotometer, ion chromatography and liquid chromatography. In the absorption spectrum of the first sample solution, the form of absorbance or absorption peak was largely different, compared to the absorption spectrum of alkaline detergent alone, but in the absorption spectra of the second and third sample solutions, the absorbance decreased, which was similar to the absorption spectrum in the pure acid detergent. In the ion chromatogram, two main peaks only, which might be shown by the pure alkaline detergent alone, were measured. In the liquid chromatograms, however, new peaks were observed in addition to the two main peaks caused by the pure alkaline detergent alone, which suggested that various molecular materials were created or eluted from the liner by the reaction with the alkaline detergent, but when washed with the acid detergent, any ion species were not produced. Therefore, we propose that an acid rinse should be applied, after cleaning the milking machine with the alkaline detergent.

• Journal of Korean Society for Atmospheric Environment
• /
• v.15 no.5
• /
• pp.677-685
• /
• 1999

Aerosol mass size distributions were measured at Kosan, Cheju Island in April 1998 and their compositions were analyzed. Microorifice Uniform Deposit Impactor(MOUDI) was used to collect aerosols. Sulfate and ammonium ions were predominatly present at fine mode of the aerosols while nitrate, chloride, and metal ions were mostly at coarse mode. Based on the size distribution of nitrate, it is suggested that most nitrate were from gas to particle conversion on coarse particles. Non-sea salt(nss) fraction of sulfate accounted for more than 90% of total sulfate mass concentration. In general, ion concentrations in this study are lower than those measured at the same site from the previous studies. Ion balance and chloride ion levels indicates that there had been anthropogenic chloride emission sources near to the site during the measurements.

• Proceedings of the Korean Vacuum Society Conference
• /
• 1994.02a
• /
• pp.35-35
• /
• 1994

The surface segragation of NiZr, CuZr alloy has been studied wi th X-ray Imotoelectron spectroscopy(XPS), Auger electron spectroscopy(AES) and low energy ion scattering(LEIS). The composition of outmost atomic layer has been determinded by the use of LEIS at several incident energies using Ar+ ion. In the LEIS analysis, the effect of charge exchange has been estimated by a novel measurment of the charge exchange parameters while simul taneous determining the relative concentrations of Ni and Zr and the complementary information obtained will be described. The composition of the clean annealed surface, measured with AES only, will be contrasted wi th the surface concentration of the preferentially sputtered surface. The experimental results has been clearly demonstrated that when the NiZr ruld CuZr alloys are exposed to continuous Ar+ ion bombardment the outermost atomic layer is Zr rich due to preferential sputtering of Ni atoms. where Ni is preferentially sputtered, but the difference in sputtering yields is not sufficient to explain the observed composition. Therefore, it is necessary to consider other processes such as Radiation Induced Segregation(RIS). The surface composition of the heated sample surface predicts that Zr should surface segregate which futher supports the view that part of the Zr enrichment is due to RIS.to RIS.

• Proceedings of the Korean Vacuum Society Conference
• /
• 1998.02a
• /
• pp.20-20
• /
• 1998

I Ion beam technology has recently attracted much interest because it has exciting t technological p아:ential for surface analysis, ion beam mixing, surface cleaning and etching i in thin film growth and semiconductor fabrication processes, etc. Es야~cially, ion beam s sputtering has been widely used for sputter depth profiling with x-photoelectron S spectroscopy (XPS) , Auger electron s$\pi$~troscopy(AES), and secondary-ion mass S야i따oscopy(SIMS). However, The problem of surface compositional ch없1ge due to ion b bombardment remains to be understo여 없ld solved. So far sputtering processes have been s studied by s따face an외ysis tools such as XPS, AES, and SIMS which use the sputtering p process again. It would be improbable to measure the modified surface composition profiles a accurately due to ion beam bombardment with surface analysis techniques based on sputter d depth profiling. However, recently Medium energy ion scattering spectroscopy(MEIS) has b been applied to study the sputtering of solid surface at ion bombardment and has been p proved that it has been extremely valuable in probing the surface composition 뻐d s structure nondestructively and quantita디vely with less than 1.0 nm depth resolution. To u understand the sputtering processes of solid surface at ion bombardment, The Molecular D Dynamics(MD) and Monte Carlo(MC) simulation has been used and give an intimate i insight into the sputtering processes of solid surfaces. In this presentation, the sputtering processes of alloys and compound samples at ion b bombardment will be reviewed and the MEIS results for the Ar+ sputter induced altered l layer of the TazOs thin film 뻐dd없nage profiling of Ar+ ion sputt얹"ed Si(100) surface will b be discussed with the results of MD and MC simulation.tion.

• Journal of the Korean institute of surface engineering
• /
• v.28 no.5
• /
• pp.259-266
• /
• 1995

In order to manufacture an attractive waste glass for the permanent and secure disposal of high-level radioactive waste, the complex composition of the simulated nuclear waste glass PNL-7668 was simplified to a composition of sodium borosilicate glass. The substitutions of $Fe_2O_3$ and $Al_2O_3$ were added to examine on the leaching characteristics of simulated nuclear waste glass with variable composition. The leach tests for these glasses were performed according to 'MCC-1, Static Leach Test Procedure' in acid and basic solution. In this study, for the $Al_2O_3$-containing glasses, Na ion release from these glasses was higher in acid solution than in basic solution. As the content of $Fe_2O_3$ was increased in glasses, Na ion release was increased in acid solution, in spite of decrease of amount of total mass diminution.

• Proceedings of the Korean Vacuum Society Conference
• /
• 2015.08a
• /
• pp.119-119
• /
• 2015

Ion beam sputtering has been widely used in Secondary Ion Mass Spectrometry (SIMS), X-ray Photoelectron Spectroscopy (XPS), and Auger Electron Spectroscopy (AES) for depth profile or surface cleaning. However, mainly due to severe matrix effects such as surface composition change from its original composition and damage of the surface generated by ion beam bombardment, conventional sputtering skills using mono-atomic primary ions with energy ranging from a few hundred to a thousand volts are not sufficient for the practical surface analysis of next-generation organic/inorganic device materials characterization. Therefore, minimization of the surface matrix effects caused by the ion beam sputtering is one of the key factors in surface analysis. In this work, the electronic structure of a $Ta_2O_5$ thin film on $SiO_2/Si$ (100) after Ar Gas Cluster Ion Beam (GCIB) sputtering was investigated using X-ray photoemission spectroscopy and compared with those obtained via mono-atomic Ar ion beam sputtering. The Ar ion sputtering had a great deal of influence on the electronic structure of the oxide thin film. Ar GCIB sputtering without sample rotation also affected the electronic structure of the oxide thin film. However, Ar GCIB sputtering during sample rotation did not exhibit any significant transition of the electronic structure of the $Ta_2O_5$ thin films. Our results showed that Ar GCIB can be useful for potential applications of oxide materials with sample rotation.

• Proceedings of the Korean Vacuum Society Conference
• /
• 1998.02a
• /
• pp.129-129
• /
• 1998

Most of the surface/interface analysis tools have limited depth profiling c capability in terms of the profiling range and the depth resolution. However, M MEIS can profile the surface and subsurface composition and structure q quantitatively and non-destructively with atomic layer depth resolution. I In this presentation, the MEIS system developed at KRISS will be briefly d described with an introduction on the principle of MEIS. Recent MEIS r results on the surface and interface composition and structural change due to i ion bombardment will be presented for preferential sputtering of T:없Os and d damage depth profiles of SHooD, Pt(l11), and Cu(l1D due to Ar+ ion b bombardment. Direct observation of strained Si lattices and its distribution i in the SHool)-SiCh interface and the initial stage of Co growth on Pt(l11) w will be reported. H surfactant effects on epitaxial growth of Ge on Si(ooD w will be discussed with STM results from SND.

• Journal of the Korean institute of surface engineering
• /
• v.33 no.5
• /
• pp.339-348
• /
• 2000

The study was conducted on the effect of bath composition on the surface appearance, the hardness and the crystal orientation of zinc electrodeposits from the chloride bath. (1) The hardness of the zinc electrodeposits from the chloride bath was increased by suppressing mass transfer of zinc through adding the organic additives and the chlorine ion in the electrolyte. (2) The surface whiteness of zinc deposits was decreased due to the change of the preferred orientation from (002) , (103) to (101) , (100) through increasing the organic additives and chlorine ion in the electrolyte. (3) The addition of Cu, Sn, Ni or Co in the chloride bath elevated the hardness of the zinc deposits but darkened the surface whiteness. (4) The optimum condition of the organic additives and the chlorine ion for increasing the hardness of zinc deposits and preventing dark surface ranges 0.3 m1/1 to 0.4 m1/1 and 6.5 mol/1 to 6.8mol/l respectively.

• Polymer(Korea)
• /
• v.24 no.6
• /
• pp.802-809
• /
• 2000

Counterion-specific helix formation and ion-selective transport of alkali metal chlorides (LiCl, NaCl, KCl, CsCl) were investigated for a poly(L-glutamic acid)(PLGA)/poly (vinyl alcohol)(PVA) blend membrane immersed in aqueous ethanol. The counterion specificity for helix formation of PLG alkali metal salts in the membrane was Li>Na>K>Cs. This specificity is ascribed to a contact ion-pair formation between the PLG carboxyl anion and the bound counterion, which depends on the energy balance between the electrostatic interaction and the desolvation. In aqueous ethanol, an appreciable ion-selectivity was observed for the permeability coefficient, i.e. Li$^{+}{\cdot}$Cl$^{-}$) formation between counterion and coion, and the latter to a specific interaction of diffusing counterions with polymer charges.

• Transactions of the Korean Society of Machine Tool Engineers
• /
• v.15 no.1
• /
• pp.133-137
• /
• 2006

Ion permeability characteristics in nano-polymer membrane structures are performed to investigate the chemical composition and characteristics of MEA(Membrane Electrolyte Assembly) which is one of the most important parts to decide the performance in PEMFC(Polymer Electrolyte Membrane Fuel Cell) system. Subsequently, the MEA manufacturing process is presented for the uniformed MEA product. In the meantime, the analysis of SEM(Scanning Electron Microscope) is carried out in order to investigate the joint aspect and chemical composition of MEA. As a result of SEM analysis, it is found that the bonded catalyst and carbon composition contain the reasonable amount to get unit cell output. It is also found that the humidification gives the better performance result slightly.