• Title/Summary/Keyword: InP/InGaAs HBT

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Design of high speed InAlGaAs/InGaAs HBT structure by Hybrid Monte Carlo Simulation (Hybrid Monte Carlo 시뮬레이션에 의한 고속 InAlGaAs/InGaAs HBT의 구조 설계)

  • 황성범;김용규;송정근;홍창희
    • Journal of the Korean Institute of Telematics and Electronics D
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    • v.36D no.3
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    • pp.66-74
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    • 1999
  • InAlGaAs/InGaAs HBTs with the various emitter junction gradings(xf=0.0-1.0) and the modified collector structures (collector- I;n-p-n, collector-II;i-p-n) are simulated and analyzed by HMC (Hybrid Monte Carlo) method in order to find an optimum structure for the shortest transit time. A minimum base transit time($ au$b) of 0.21ps was obtainsed for HBT with the grading layer, which is parabolically graded from $x_f$=1.0 and xf=0.5 at the emitter-base interface. The minimum collector transit time($\tau$c) of 0.31ps was found when the collector was modified by inserting p-p-n layers, because p layer makes it possible to relax the electric field in the i-type collector layer, confining the electrons in the $\Gamma$-valley during transporting across the collector. Thus InAlGaAs/InGaAs HBT in combination with the emitter grading($x_f$=0.5) and the modified collector-III showed the transit times of 0.87 psec and the cut-off frequency (f$\tau$) of 183 GHz.

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Analysis of Properties and Fabrication of $1000{\AA}$ silicon nitride MIM capacitor with High Breakdown Electric Field for InGaP/GaAs HBT Application (InGaP/GaAs HBT 적용을 위한 높은 절연강토의$1000{\AA}$ 실리콘 질화막 MIM capacitor제작과 특성 분석)

  • So, Soon-Jin;Oh, Doo-Suk;Sung, Ho-Kun;Song, Min-Jong;Park, Choon-Bae
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2004.07b
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    • pp.693-696
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    • 2004
  • For InGaP/GaAs HBT applications, we have developed characterized MIM capacitors with thin $1000{\AA}$ PECVD silicon nitride which were deposited with $SiH_4/NH_3$ gas mixing rate, working pressure, and RF power of PECVD at $300^{\circ}C$ and had the capacitance density of 600 pF/$mm^2$ with the breakdown electric fields of 3073 MV/cm. Three PECVD process parameters were designed to lower the refractive index and then lower the deposition rate of silicon nitride films for the high breakdown electric field. At the PECVD process condition of gas mixing rate (0.92), working pressure (1.3 Torr), RF power (53 W), the AFM Rms value of about $1000{\AA}$ silicon nitride on the bottom metal was the lowest of 0.662 nmand breakdown electric fields were the highest of about 73 MV/cm.

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A New Extraction Method of GaAs/InGaP HBT Small-signal Equivalent Circuit Model Parameters (GaAs/InGaP HBT 소신호 등가회로 모델 파라미터의 새로운 추출방법)

  • 이명규;윤경식
    • Proceedings of the IEEK Conference
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    • 2000.11a
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    • pp.357-360
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    • 2000
  • This paper describes a parameter extraction method for HBT(Heterojunction Bipolar Transistor) equivalent circuit model without measurements of special test structures or numerical optimizations. Instead, all equivalent circuit parameters are calculated analytically from small-signal S-parameters measured under different bias conditions. These values being extracted from the cutoff mode can be used to extract intrinsic parameters at the active mode. This method yields a deviation of about 1.3 % between the measured and modeled S-parameters.

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Parameter Extraction of InGaP/GaAs HBT Small-Signal Equivalent Circuit Using a Genetic Algorithm (유전자 알고리즘을 이용한 InGaP/GaAs HBT 소신호 등가회로 파라미터 추출)

  • 장덕성;문종섭;박철순;윤경식
    • Journal of the Korean Institute of Intelligent Systems
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    • v.11 no.6
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    • pp.500-504
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    • 2001
  • The present approach based on the genetic algorithm with improved selections of bonds was adopted to extract a bridged T equivalent circuit elements of $\times10\mu m^2$InGaP/GaAs HBT. the small-signal model parameters were extracted using the genetic algorithm from S-parameters measured at different frequencies under multiple forward-active biases, which demonstrate physically meaningful values and consistency. The agreement between the measured and modeled S-parameters is excellent over the frequency range of 2 to 26.5GHz.

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Miniaturized LNB Downconverter MMIC for Ku-band Satellite Communication System using InGaP/GaAs HBT Process

  • Lee, Jei-Young;Lee, Sang-Hun;Lee, Jong-Chul;Kim, Jong-Heon;Lee, Byunje;Park, Chan-Hyeong;Kim, Nam-Young
    • Journal of electromagnetic engineering and science
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    • v.4 no.1
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    • pp.37-42
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    • 2004
  • In this paper, LNB(low noise block) downconverter MMIC is designed for Ku-band satellite communication system using InGaP/GaAs HBT high linear process. Designed MMIC consists of low noise amplifier, double balanced mixer, and IF amplifier with a total chip area of 2.6${\times}$1.1 $\textrm{mm}^2$. Designed MMIC has the characteristics of over 37.5 ㏈ conversion gain, 14 ㏈ noise figure, ripple of 3 ㏈, and output-referred $P_{1dB}$TEX>(1 ㏈ compression power) of 2.5 ㏈m with total power dissipation of 3 V, 50 mA.

An InGaP/GaAs HBT Based Differential Colpitts VCO with Low Phase Noise

  • Shrestha, Bhanu;Kim, Nam-Young
    • Journal of electromagnetic engineering and science
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    • v.7 no.2
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    • pp.64-68
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    • 2007
  • An InGaP/GaAs HBT based differential Colpitts voltage control oscillator(VCO) is presented in this paper. In the VCO core, two switching transistors are introduced to steer the core bias current to save power. An LC tank with an inductor quality factor(Q) of 11.4 is used to generate oscillation frequency. It has a superior phase noise characteristics of -130.12 dBc/Hz and -105.3 at 1 MHz and 100 kHz frequency offsets respectively from the carrier frequency(1.566 GHz) when supplied with a control voltage of 0 volt. It dissipates output power of -5.3 dBm. Two pairs of on-chip base collector (BC) diodes are used in the tank circuit to increase the VCO tuning range(168 MHz). This VCO occupies the area of $1.070{\times}0.90mm^2$ including buffer and pads.

Degradation analysis of AlGaAs/GaAs HBTs and improvement of reliability by using InGaP ledge emitter (AlGaAs/GaAs HBT의 열화분석과 InGaP ledge 에미터에 의한 신뢰도 개선)

  • 최번재;김득영;송정근
    • Journal of the Korean Institute of Telematics and Electronics D
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    • v.35D no.7
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    • pp.88-93
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    • 1998
  • For the self-aligned AlGaAs/GaAs HBTs, the surface states at the interface between the extrinsic base surface and the passivation nitride is a major cause of degradation of dc characteristics. In this paper the degradation mechanisms of self-aligned AlGaAs/GaAs HBT were analyzed, and GaAs HBTs, which employed an InGaP ledge emitter structure formed by the nonself-aligned process to cover the surface of the extrinsic base and reduce the surface states, produced high reliability. Accoridng to the acceleration lifetime test, the nonself-aligned InGaP/GaAs HBTs produced very reliable dc characteristics comparing with the self-aligned AlGaAs/GaAs HBTs. The activation energy was 1.97eV and MTTF $4.8{\times}10^{8}$ hrs at $140^{\circ}C$ which satisfied the MIL standard.

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An InGaP/GaAs HBT Monolithic VCDRO with Wide Tuning Range and Low Phase Noise

  • Lee Jae-Young;Shrestha Bhanu;Lee Jeiyoung;Kennedy Gary P.;Kim Nam-Young
    • Journal of electromagnetic engineering and science
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    • v.5 no.1
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    • pp.8-13
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    • 2005
  • The InGaP/GaAs hetero-junction bipolar transistor(HBT) monolithic voltage-controlled dielectric resonator oscillator(VCDRO) is first demonstrated for a Ku-band low noise block down-converter(LNB) system. The on-chip voltage control oscillator core employing base-collector(B-C) junction diodes is proposed for simpler frequency tuning and easy fabrication instead of the general off-chip varactor diodes. The fabricated VCDRO achieves a high output power of 6.45 to 5.31 dBm and a wide frequency tuning range of ]65 MHz( 1.53 $\%$) with a low phase noise of below -95dBc/Hz at 100 kHz offset and -115 dBc/Hz at ] MHz offset. A]so, the InGaP/GaAs HBT monolithic DRO with the same topology as the proposed VCDRO is fabricated to verify that the intrinsic low l/f noise of the HBT and the high Q of the DR contribute to the low phase noise performance. The fabricated DRO exhibits an output power of 1.33 dBm, and an extremely low phase noise of -109 dBc/Hz at 100 kHz and -131 dBc/Hz at ] MHz offset from the 10.75 GHz oscillation frequency.

Fabrication and Characterization of AlGaAs/GaAs HBT (AlGaAs/GaAs HBT의 제작과 특성연구)

  • 박성호;최인훈;오응기;최성우;박문평;윤형섭;이해권;박철순;박형무
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.31A no.9
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    • pp.104-113
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    • 1994
  • We have fabricated n-p-n HBTs using 3-inchAlgaAs/GaAs hetero structure epi-wafers grown by MBE. DC and AC characteristics of HBT devices were measured and analyzed. For HBT epi-structure, Al composition of emitter was graded in the region between emitter cap and emitter. And base layer was designed with concentration of 1${\times}10^{19}/cm^{3}$ and thickness of 50nm, and Be was used as the p-type dopant. Principal processes for device fabrication consist of photolithography using i-line stepper, wet mesa etching, and lift-off of each ohmic metal. The PECVD SiN film was used as the inslator for the metal interconnection. HBT device with emitter size of 3${\times}10{\mu}m^{2}$ resulted in cut-off frequency of 35GHz, maximum oscillation frequency of 21GHz, and current gain of 60. The distribution of the ideality factor of collector and base current was very uniform, and the average values of off-set voltage and current was very uniform, and the average values of off-set voltage and current gain were 0.32V and 32 within a 3-inch wafer.

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Differential LC VCO with Enhanced Tank Structure and LC Filtering Techniques in InGaP/GaAs HBT Technology (InGaP/GaAs HBT 공정을 이용하여 향상된 탱크 구조와 LC 필터링 기술을 적용한 차동 LC 전압 제어 발진기 설계)

  • Lee, Sang-Yeol;Kim, Nam-Young
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.18 no.2 s.117
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    • pp.177-182
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    • 2007
  • This paper presents the InGaP/GaAs HBT differential LC VCO with low phase noise performance for adaptive feedback interference cancellation system(AF-lCS). The VCO is verified with enhanced tank structure including filtering technique. The output tuning range for proposed VCO using asymmetric inductor and symmetric capacitors withlow pass filtering technique is 207 MHz. The output powers are -6.68 including balun and cable loss. The phase noise of this VCO at 10 kHz, 100 kHz and 1 MHz are -102.02 dBc/Hz, -112.04 dBc/Hz and -130.40 dBc/Hz. The VCO is designed within total size of $0.9{\times}0.9mm^2$.