Nondestructive measurement of surface resistance of indium tin oxide(ITO) films by using a near-field scanning microwave microscope (근접장 마이크로파 현미경을 이용한 ITO 박막의 표면저항의 비파괴 관측 특성 연구)
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- Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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- 2004.05a
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- pp.137-141
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- 2004