• Title/Summary/Keyword: ITO (Indium Tin Oxide)

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MPP (modulated pulse plasma) 스퍼터링 방법으로 증착한 100 nm 이하에서의 Indium-Tin-Oxide (ITO)박막 특성

  • Yu, Yeong-Gun;Jeong, Jin-Yong;Ju, Jeong-Hun
    • Proceedings of the Korean Vacuum Society Conference
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    • 2014.02a
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    • pp.256.2-256.2
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    • 2014
  • 최근 고출력 펄스 스퍼터링, HPPMS (high power pulsed magnetron sputtering)을 개선한 기술이 개발되고 있다. High power impulse magnetron sputtering (HIPIMS)이라고도 불려지는 이 기술은 Kouznetsov1) 에 의해 개발되었으며, 짧은 주기 동안 높은 peak power 밀도를 얻을 수 있기 때문에, 스퍼터링시 높은 이온화율을 만들 수 있다. 스퍼터 된 종들의 높은 이온화는 다양한 분야에서 기존 코팅 물질의 특성 개선 및 self-assisted 이온 증착 공정을 통해 우수한 박막을 제조하는데 기여되고 있다. 그러나 HIPIMS는 순간 전력 밀도가 MW수준으로 높아서 고융점, 고열전도도의 물질에만 적용할 수 있다는 단점을 가지고 있다). 최근에 HIPIMS를 대체하기 위해 modulated pulse POWER (MPP)가 개발되었다. 이것은 스퍼터 된 종들의 이온화율을 높일 수 있음과 동시에 여러 가지 물질에 적용할 수 있다고 보고하고 있다. MPP와 HIPIMS와의 차이점은 HIPIMS는 간단한 하나의 초고출력 펄스를 이용하는 반면에, MPP는 펄스 길이 3 ms 안에서 다양하게 조절이 가능하며, 한 전체 펄스 주기 안에서 다중 세트 펄스와 micro 펄스를 자유롭게 조합하여 인가할 수 있다는 장점이 있다. 본 실험에서는 In2O3 : SnO2의 조성비 10:1 wt% target을 사용하였으며, Ar:O2의 유량비는 10:1의 비율로, 기판의 온도를 올려 주지 않는 상태에서 실험을 하였다. Ar 유량을 40 sccm으로 고정시킨 후 O2의 유량을 2~6 sccm에 대하여 비교를 하였다. 박막의 두께를 100 nm로 이하로 하였을 때 비저항은 $7.6{\times}10-4{\Omega}cm$의 값을, 80% 이상의 투과도와 10 cm2/Vs 이상의 mobility를 얻을 수 있었다. 또한 박막 두께 150 nm로 고정, substrate moving에 따른 ITO 박막의 차이를 알아보았다. 비저항의 값은 $5.6{\times}10-4{\Omega}cm$의 값을, 80% 이상의 투과도와 15 cm2/Vs의 값을 얻었다.

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Effect of H2 Addition on the Properties of Transparent Conducting Oxide Films Deposited by Co-sputtering of ITO and AZO (동시 스퍼터링으로 제조한 AZO-ITO 혼합박막의 증착 중 수소 혼입 영향 분석)

  • Kim, Hye-Ri;Kim, Dong-Ho;Lee, Sung-Hun;Lee, Gun-Hwan
    • Journal of the Korean institute of surface engineering
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    • v.42 no.6
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    • pp.267-271
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    • 2009
  • Multicomponent transparent conducting oxide films were deposited on glass substrates at 150 by dual magnetron sputtering of AZO and ITO targets. In the case of mixing a limited amount of ITO (10W), resistivity of TCO films was significantly increased compared to the AZO film; from $3.5{\times}10^{-3}$ to $9.7{\times}10^{-3}{\Omega}{\cdot}cm$. Deterioration of the electrical conductivity is attributed to the decreases in carrier concentration and Hall mobility. Improvement of the conductivity could be obtained for the films prepared with ITO powers larger than 40 W. The lowest resistivity ($\rho$) of $7.3{\times}10^{-4}{\Omega}{\cdot}cm$ was achieved when ITO power was 100 W. Effects of $H_2$ incorporation on the electrical and optical properties of AZO-ITO films were investigated in this work. Addition of small amount of hydrogen resulted in the increase of carrier concentration and the improvement of electrical conductivity. It is apparent that the roughness of AZO-ITO films decreases dramatically after the transition of microstructure from polycrystalline to amorphous phase, which gives practical advantages such as an excellent uniformity of surface and a high etching rate. AZO-ITO films grown at sputtering ambient with hydrogen gas are expected to be applicable to optoelectronic devices such as organic light emitting diodes and flexible displays due to their sufficient electrical and structural properties.

Comparison of electrical and optical properties between ITO and ZnO:Al films used as transparent conducting films for PDP (PDP용 투명전도막으로 사용되는 ITO 와 ZnO:Al 의 전기적.광학적 특성 비교)

  • Kim, Byung-Sub;Park, Kang-Il;Lim, Dong-Gun;Park, Gi-Yub;Kwak, Dong-Joo
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.07b
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    • pp.857-860
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    • 2003
  • Tin doped indium oxide(ITO) and Al doped zinc oxide(ZnO:Al) films, which are widely used as a transparent conductor in optoelectronic devices such as solar cell, liquid crystal display, plasma display panel, thermal heater, and other sensors, were prepared by using the capacitively coupled DC magnetron sputtering method. The electrical and optical properties of both the ITO and ZnO:Al thin films were investigated as functions of substrate temperature, working gas pressure and deposition time. ITO and ZnO:Al films with the the present experimental conditions of temperature and pressure showed resistivity of $2.36{\times}10^{-4}{\Omega}-cm,\;9.42{\times}10^{-4}{\Omega}-cm$ and transmittance of 86.28%, 90.88% in the wavelength range of the visible spectrum, respectively.

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Characteristic Changes of ITO/PET Thin Films with Ratio of Oxygen Partial Pressure (산소분압비에 따른 ITO/PET박막의 특성변화)

  • Kim, Hyun-Hoo;Lee, Moo-Young;Kim, Kwang-Tae;Yoon, Shang-Hyun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.05b
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    • pp.58-61
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    • 2003
  • ITO (indium tin oxide) thin films on PET (polyethylene terephthalate) substrate have been deposited by a dc reactive magnetron sputtering without heat treatments such as substrate heater and post heat treatment. Each sputtering parameter during the sputtering deposition is an important factor for the high quality of ITO thin films deposited on polymeric substrate. Particularly, the material, electrical and optical properties of as-deposited ITO oxide films are dominated by the ratio of oxygen partial pressure. As the experimental results, the excellent ITO films are prepared on PET substrate at the operating conditions as follows: operating pressure of 5 mTorr,target-substrate distance of 45 mm, dc power of 20-30 W, and oxygen gas ratio of 10 %. The optical transmittance is above 80 % at 550 nm, and the sheet resistance and resistivity of films are $24\;{\Omega}$/square and $1.5{\times}10^{-3}\;cm$, respectively.

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Effect of Oxygen Pressure on the properties of Ga-doped ZnO Thin Films Prepared by Pulsed Laser Deposition at Low Temperature (PLD로 저온 증착한 Ga-doped ZnO 박막의 산소 분압에 따른 영향)

  • Moon, Sung-Joon;Kim, Ji-Hong;Roh, Ji-Hyung;Kim, Jae-Won;Do, Kang-Min;Moon, Byung-Moo;Koo, Sang-Mo
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2010.06a
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    • pp.297-297
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    • 2010
  • Transparent conductive Oxide (TCO) is an essential material in the various optoelectronic applications as a transparent electrode, such as solar cells, flat panel displays and organic light emitting diodes. Currently, Indium tin oxide (ITO) is commonly used in industry due to its low electrical resistivity, high transmittance and high adhesion to substrate. However, ITO is expensive and should be prepared at high temperature, which makes it hard to use ITO in flexible devices. In this regard, Ga-doped ZnO is expected as an ideal candidate for replacing ITO.

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Transparent Conducting Multilayer Electrode (GTO/Ag/GTO) Prepared by Radio-Frequency Sputtering for Organic Photovoltaic's Cells

  • Pandey, Rina;Kim, Jung Hyuk;Hwang, Do Kyung;Choi, Won Kook
    • Journal of Sensor Science and Technology
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    • v.24 no.4
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    • pp.219-223
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    • 2015
  • Indium free consisting of three alternating layers GTO/Ag/GTO has been fabricated by radio-frequency (RF) sputtering for the applications as transparent conducting electrodes and the structural, electrical and optical properties of the gallium tin oxide (GTO) films were carefully studied. The gallium tin oxide thin films deposited at room temperature are found to have an amorphous structure. Hall Effect measurements show a strong influence on the conductivity type where it changed from n-type to p-type at $700^{\circ}C$. GTO/Ag/GTO multilayer structured electrode with a few nm of Ag layer embedded is fabricated and show the optical transmittance of 86.48% in the visible range (${\lambda}$ = 380~770 nm) and quite low electrical resistivity of ${\sim}10^{-5}{\Omega}cm$. The resultant power conversion efficiency of 2.60% of the multilayer based OPV (GAG) is lower than that of the reference commercial ITO. GTO/Ag/GTO multilayer is a promising transparent conducting electrode material due to its low resistivity, high transmittance, low temperature deposition and low cost components.

Ar/$O_3$ PLASMA TREATMENT OF ITO SUBSTRATES FOR IMPROVEMENT OF OLED DEVICE PERFORMANCE (OLED 소자로의 응용을 위한 ITO 전극의 Ar/$O_3$ 플라즈마 표면개질)

  • Lem, J.S.;Kim, H.G.;Kim, Y.W.;Kang, D.H.;Jung, M.Y.;Kim, B.S.;Shin, P.K.;Lee, D.C
    • Proceedings of the KIEE Conference
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    • 2004.07c
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    • pp.1570-1572
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    • 2004
  • OLED(organic light-emitting diode)소자에 사용되는 ITO(Indium-tin oxide)전극에 Ar/$O_3$ 플라즈마 표면처리 함으로써 ITO전극에 표면상태의 개선에 좋은 영향을 미치는 것으로 나타났다. 13.56MHZ RF 플라즈마 장치를 이용하여 Ar/$O_3$ 플라즈마 처리한 후 AFM(atomic force microscopy)측정을 통해 표면 morphologyjroughless를 분석하고, XPS(X-Ray Photoelectron Spectroscopy)분석을 통해 표면의 화학적 조성비 분석을 수행 하였다.

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Characterization of Organic Electroluminescent Devices Deposited on ITO/Glass substrate (ITO/Glass 기판위에 증착된 유기 전계발광소자의 특성 평가)

  • 노준서;조중연;장호정
    • Proceedings of the KAIS Fall Conference
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    • 2002.11a
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    • pp.181-184
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    • 2002
  • 본 연구에서는 ITO (indium tin oxide) /glass 투명기판 위에 다층구조의 OELD 소자를 진공 열증착법으로 제작하였다. 상부 전극과 하부 전극의 종류에 따른 전류밀도-전압 특성을 측정하였으며, 열적 안정성이 다른 정공 수송충을 사용하여 소자를 제작하고 전기ㆍ광학적 특성을 측정하였다. 사용된 저분자 유기화합물은 발광층으로 녹색의 발광을 가지는 Alq₃(tris-(8-hydroxyquinoline)aluminum)를 사용하였고 정공수송 및 주입층으로는 TPD(triphenyl diamine), α-NPD 그리고 CuPc (Copper phthalocyanine)를 각각 증착하였다. 하부 전극으로 사용된 ITO 투명전극은 면저항이 적을수록 전류밀도가 증가하는 것을 볼 수 있고, 상부 전극의 종류에 따른 전류밀도-전압 특성을 분석한 결과 일함수가 낮은 전극일수륵 전류밀도가 높아지는 것으로 나타났다. 유리전이온도(Tg)가 상대적으로 높은 재료인 α-NPD를 정공수송충으로 사용한 경우 더 양호한 특성을 나타내었다.

Fabrication of low resistance pixel electrode employing AZO for OLED (AZO를 이용한 OLED용 저저항 픽셀전극의 제작)

  • Kim, Jong-Yeon;Han, Jin-Woo;Kim, Jong-Hwan;Kang, Hee-Jin;Han, Jung-Min;Kang, Dong-Hun;Oh, Yong-Cheul;Seo, Dae-Shik
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.11a
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    • pp.318-319
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    • 2006
  • 기존에 사용되고 있는 ITO(Indium-Tin-Oxide)의 저항보다 낮은 저항을 가지는 AZO(ZnO-Ag-ZnO) 전극을 Top emission 방식의 OLED(organic light emitting diode)에 적용하여 발광 소자를 제작하였다. AZO박막은 기존의 ITO박막이 수십 ${\Omega}$을 나타내던 것과 비교하여 $8{\Omega}$으로 매우 낮은 저항을 나타내었다. 투과율은 84%로 기존의 ITO박막과 유사한 성능을 나타내었다.

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Effects of thickness on the properties of ITO films deposited by a low-frequency magnetron sputtering

  • Lee, Sung-Ho;Jung, Sang-Kooun;Hur, Young-June;Lee, Do-Kyung;Park, Duck-Kyu;Park, Lee-Soon;Sohn, Sang-Ho
    • 한국정보디스플레이학회:학술대회논문집
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    • 2005.07b
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    • pp.1556-1559
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    • 2005
  • Indium-tin oxide (ITO) films were deposited by a low-frequency (LF, 100 Hz) magnetron sputtering on glass substrates at the room temperature. The effects of the film thickness on the structural, electrical and optical properties of ITO films were investigated. With the film thickness the films reveal better crystallinity, showing both (222) and (400) pla nes in the XRD pattern. The optical transmittance and the sheet resistance of the films decreased with the increasing thickness. In addition, the electrical properties of ITO films were improved after annealing in a vacuum.

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