• Electrical & Electronic Materials
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• v.12 no.12
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• pp.1-9
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• 1999

• Journal of the Korean Institute of Telematics and Electronics A
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• v.31A no.10
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• pp.87-93
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• 1994

Ohmic contacts between Au and p-HgHg_{0.7}Cd_{0.3}Te$ with low specific contact resistance have been obtained. The contact region of the wafer is first pre-heated for 5 seconds in a rapid thermal processing equipment. The temperature reaches a maximum value of about 200$^{\circ}C$ at the end of the 5 seconds. Next, a thin Au film is formed on the contact region by immersing the sample in AuCl$_{3}$ solution. the sample is then post-annealed in the same condition as the pre-heating after Pb/In pad metals are deposited on the electroless Au contacts. The specific contact resistance measured by transmission line model is 5${\times}10^{-3}{\Omega}cm^{2}$ at 80K. RBS and differential Hall measurement data suggest that the above low resistance ohmic contact is ascribed to surface traps and increased gold diffusion rate.

• Proceedings of the Korean Vacuum Society Conference
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• 2001.07a
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• pp.63-63
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• 2001

• Korean Journal of Optics and Photonics
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• v.5 no.2
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• pp.212-216
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• 1994

We have designed and constructed a scanner optics for thermal imaging system operating in 8 - 12 /lfll band. The scanner consists of rotating polygon and oscillating mirror for serial-parallel scan using 5 elements SPRITE HgCdTe. A spherical mirror is used for scan relay mirror to minimize size of the scan mirrors and pupil aberration. The scanner has $40^{\circ}\times26.67^{\circ}$ wide scan field of view and the calculated diffraction MTF shows diffraction limited performance. As a result we have obtained high resolution thermal image. image.

• Proceedings of the Korean Magnestics Society Conference
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• 2004.12a
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• pp.148-149
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• 2004

• Proceedings of the Korean Magnestics Society Conference
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• 2004.12a
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• pp.38-39
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• 2004

• Proceedings of the Korean Vacuum Society Conference
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• 1997.07a
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• pp.47-47
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• 1997

• 한국전자현미경학회:학술대회논문집
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• 1995.06a
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• pp.42-43
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• 1995

• Proceedings of the Korean Vacuum Society Conference
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• 1999.02a
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• pp.77-77
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• 1999

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.11a
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• pp.392-395
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• 2003

For the purpose of digital x-ray imaging, many materials such as $PbI_2$, $HgI_2$, TlBr, CdTe and CdZnTe have been under development for servaral years as direct converter layer. $Hgl_2$ film detector have recently been shown as one of the most promising semiconductor materials to be used as direct converters in x-ray digital radiography. This paper, the $HgI_2$ films are deposited on conductive-coated glass by screen printing, in which $HgI_2$ powder is embedded in a binder and solvent, and the slurry is used to coat the conductive-coated glass. We investigated electrical characteristic of the fabricated $HgI_2$ films. The x-ray response to radiological x-ray generator of 70Kvp using the current integration mode will be reported for screen printing films. These results indicate that $HgI_2$ detectors have high potential as new digital x-ray imaging devices for radiography.